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  6. Compact Type Atomic Force Microscope NaioAFM

Compact Type Atomic Force Microscope NaioAFM

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last updated:May 01, 2023

日本カンタム・デザイン
日本カンタム・デザイン
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Introducing a low-cost "All-in-one" AFM device that is compact, durable, and easy to operate!

"NaioAFM" is a compact atomic force microscope suitable for users who want to measure surface shapes concisely and quickly in the fields of nanotechnology education at universities and vocational schools, as well as in research and development or quality control. With the product's unique "Flip-over" scan head and dedicated exchange tools, it allows for quick and simple cantilever replacement. Balancing functionality and operability, it is an "All-in-one" AFM device that can be used by anyone, anywhere, and is widely utilized around the world. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera for positioning and side-view observation ■ Additional measurement modes can be added according to needs ■ Simple cantilever replacement: no need to adjust the laser or detector ■ Ready for measurement immediately after installation: just connect the USB cable and launch the software *For more details, please refer to the PDF document or feel free to contact us.

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Compact Type Atomic Force Microscope NaioAFM

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  • Related Link - https://www.qd-japan.com/products/naioafm/
  • Special site - Product/service details - https://pr.mono.ipros.com/qd-japan/product/

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【Specifications (Excerpt)】 ■ Usable sample size: within 12mm square / up to 3.5mm in height ■ Sample stage movement range: 12mm in the plane ■ Approach: 4mm linear motor, continuous or step-type approach ■ Imaging modes: Static Force, Dynamic Force, Phase Contrast, MFM, EFM Supports various other measurement modes ■ Power consumption: 100-240VAC, 50/60Hz, 50W * For more details, please refer to the PDF document or feel free to contact us.

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【Purpose】 ■ Education in nanotechnology at universities and vocational schools, as well as in research and development or quality control settings. *For more details, please refer to the PDF document or feel free to contact us.

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Nanosurf Compact Type Atomic Force Microscope NaioAFM

Nanosurf Compact Type Atomic Force Microscope NaioAFM

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日本カンタム・デザイン

日本カンタム・デザイン

Testing, Analysis and Measurement

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Our company was established as the Japanese subsidiary of a foreign-affiliated manufacturer with a global network spanning over 40 countries. We are steadily expanding our business primarily through the sale of SQUID magnetic property measurement devices and physical property measurement devices, which boast a world-class share in the field of new material research and development. Additionally, we also operate as a trading company for high-tech scientific instruments, importing and selling cutting-edge research equipment from around the world in various fields such as material science, biotechnology, and nanotechnology. The wave of technological innovation is significantly transforming not only industrial sectors but also our daily lives. Among these, the fields of material science, biotechnology, and nanotechnology, which are the pillars of our business, can be described as "core technologies" that provide humanity with infinite possibilities for the future as they lead the way in cutting-edge technology (high-tech). The discovery of high-temperature superconducting materials, applications of laser microfabrication and optical communication, and surface analysis at the nanoscale are already playing important roles in various fields such as new materials, semiconductors, information and communication, medical care, clinical diagnostics, and drug discovery, while also enabling further advancements in technology.

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