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IV characteristic measurement service

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last updated:Jul 29, 2023

佐用精機製作所
佐用精機製作所
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A service that can be used for various purposes in semiconductor IV characteristic measurement, ranging from simple thermal resistance evaluation to failure analysis.

We offer "IV characteristic measurement services." The IV characteristics of semiconductors are measured for various purposes as fundamental electrical measurements. They are utilized not only for regular product evaluations but also for failure analysis and simple assessments of thermal resistance. At a preliminary experimental level, relative comparisons among many samples can be made. We measure the change in VF characteristics at thermal saturation to evaluate the quality of thermal shrinkage. In addition to standalone IV measurements, simple inspections regarding the electrical-optical relationship and simple relative evaluations concerning the electrical-thermal relationship are also possible. You can consult us for various applications, including initial checks for anomaly analysis.

    Other electronic partsLED ModuleOther semiconductors
熱抵抗測定.jpg

IV characteristic measurement service

熱抵抗測定.jpg
熱抵抗測定.jpg

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basic information

- The measurement power supply will be operated by VBA to measure the specified current, voltage, and timing. - For difficult-to-probe items such as SMDs, we will design measurement fixtures. - A measurement range and evaluation suitable for the intended analysis are necessary. We will make a proposal.

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Applications/Examples of results

- As a basic analysis of defective products, hypothesizing the cause of defects from measurement results. Measuring the IV curve to confirm the cause of non-illumination. Checking for open and short circuits, and confirming the presence of abnormalities in diode characteristics. Estimating destructive factors such as heat and surges based on usage conditions. - Measuring the K-factor as basic data for temperature characteristic evaluation. - Estimating the degradation state from the relationship between current and optical output for optical output measurement. - Additionally, for examining hypotheses regarding the causes of product operation issues.

Detailed information

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    Single SMD packages can also be measured without soldering. Measurement jigs will also be produced.

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Evaluation test service (transient thermal resistance measurement)

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佐用精機製作所

佐用精機製作所

Electronic Components and Semiconductors

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We assist those involved in the research and development of semiconductor devices and related materials as their hands and feet in solving problems. (1) Problem-Solving Support Services Research and development itself is the main theme of problem-solving. We leverage our experience from over 10,000 related prototypes to conduct investigations, analyses, and propose experiments. (2) Electronic Component Processing Services Especially for sensors, there are many irregular shapes that are difficult to accommodate with dedicated equipment. In cases of small quantities, investment balance can be an issue that prevents starting. We can propose production with minimal investment based on our experience in prototype support. We also provide support for small quantities until customers establish dedicated lines. (3) Prototype-Related Tool and Equipment Development Services At the beginning of semiconductor-related material development, there is a need to create devices and tools for functional evaluation. In most cases, dedicated evaluation devices exist, but they are multifunctional and expensive. You can utilize our services when a simple device for single-function comparative evaluation is needed in the early stages of development. We have a track record for applications such as sheet-related materials, package resins, encapsulation resins, phosphors, and QDs.

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