It is a new generation SEM that is compact and capable of unmanned operation.
The JSM-IT210 scanning electron microscope from JEOL Ltd. is the most compact scanning electron microscope among JEOL's benchtop models. The newly developed stage features all five axes driven by motors, allowing for safer and faster operation. ○ Features - "Sample Exchange Navigation" for easy observation after inserting the sample - "Zeromag" for magnifying optical images into SEM images - "Live Analysis" for continuous elemental analysis during observation - "Simple SEM" for a variety of automatic measurements - Functions that strongly support automatic measurements - Faster analysis - Standard equipped with a 60 mm² large-diameter EDS *For more details, please refer to the PDF or feel free to contact us.
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basic information
【Specifications】 Resolution High vacuum mode: 3.0nm (30kV), 15.0nm (1.0kV) Low vacuum mode: 4.0nm (30kV BED) Magnification: ×5 to ×300,000 (magnification defined for a display size of 128 × 96mm) Display magnification: ×15 to ×883,652 (using a standard monitor in full-screen display) *For more details, please refer to the PDF or feel free to contact us.
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Applications/Examples of results
【Applications】 Utilized in various fields such as nanotechnology, metals, semiconductors, ceramics, and medicine/biology.
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Company information
Since its establishment in 1974, Azusa Science Co., Ltd. has contributed to the local community as a specialized trading company with strengths in both the scientific and medical fields, supporting the advancement of life-pursuing science. We offer a wide range of products in various fields, including physical and chemical instruments, medical devices, testing equipment, analytical instruments, in vitro diagnostic reagents, pharmaceuticals, reagents, and consumables, responding to the increasingly sophisticated and diverse needs of our customers. Furthermore, we are actively advancing software development utilizing our network, working on systematization for our customers and revitalizing communication with them.
![[Analysis Case] SEM Observation of Wide-Area Cross-Section Using Xe-PFIB](https://image.mono.ipros.com/public/product/image/387108/IPROS17891796211199755303.png?w=280&h=280)
![[Analysis Case] Comparison of Secondary Electron Images of Cu Surface Using SEM and SIM](https://image.mono.ipros.com/public/product/image/b04/2000442432/IPROS8264588846146999573.jpg?w=280&h=280)
![[Example] Measurement of the thickness of chromate treatment film](https://image.mono.ipros.com/public/product/image/68d/2001127722/IPROS02235042615171119734.jpeg?w=280&h=280)