[Scheduled for release in September 2024] The processor unit is built into the sensor, allowing measurement to start with just this one device.
Background of Development Is it possible to create a measuring device that can measure wide-angle inclinations greatly exceeding a measurement range of ±1 degree? This ultra-wide-angle tilt sensor was developed in response to such customer requests. This product integrates the sensor head and processor unit, making it easy to embed in devices and resulting in a user-friendly product. Features - Integrated sensor and processor - Inclination measurement range of ±5 degrees, high-speed measurement (1.6K data/s) - Can be embedded in devices and fixtures
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basic information
- Sensor and processor, integrated - Inclination measurement range ±5 degrees, high-speed measurement (1.6K data/s) - Can be embedded in devices and fixtures
Price range
P5
Delivery Time
Applications/Examples of results
- Measurement of gimbal tilt for drone cameras - Measurement and evaluation of tilt in smartphone camera module OIS - Measurement and evaluation of tilt in MEMS mirrors
Line up（1）
| Model number | overview |
|---|---|
| ST-3200 | Measurement range ±5 degrees |
catalog（2）
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Company information
Partner in Optical Non-Contact Measurement Welcome to Katsura Opto Systems Katsura Opto Systems is a global R&D company with expertise and staff in optics. Non-contact measurement everywhere Precision values that are essential for measurement are required from measuring instruments, as they ultimately relate to the quality of the final product, which is what Katsura Opto Systems believes. The best and highest quality products As a manufacturer ourselves, we continuously incorporate the latest technology into product development while striving for optimal productivity, accuracy, and technological advancement. Variability in measurements due to human factors can affect the final product, potentially leading to lost contracts and market share. Katsura Opto Systems' non-contact measurement products assist in achieving stable measurements anytime and anywhere.