[Scheduled for release in September 2024] Built-in processor, measurement starts with just this one device.
Background of Development When using multiple measuring instruments, managing the sensor heads and processor units becomes complicated. We developed this product in response to customer requests for an integrated measuring device. Based on the frequently requested measurement range and working distance specifications, we integrated the processor and achieved high measurement speed. It has been developed in a compact size that can be embedded in devices. Features - Integrated sensor and processor - Compact, suitable for embedding in devices and fixtures - High-speed measurement (1.6K data/s)
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basic information
Measurement range is ±54 arcminutes. Data output update rate is 1,600 times per second, which is ultra-fast.
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Applications/Examples of results
Measurement of semiconductor wafer tilt and warpage. Tilt check of semiconductor chips picked up by the handler, monitoring of adhered items and posture during adhesion, etc.
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Company information
Partner in Optical Non-Contact Measurement Welcome to Katsura Opto Systems Katsura Opto Systems is a global R&D company with expertise and staff in optics. Non-contact measurement everywhere Precision values that are essential for measurement are required from measuring instruments, as they ultimately relate to the quality of the final product, which is what Katsura Opto Systems believes. The best and highest quality products As a manufacturer ourselves, we continuously incorporate the latest technology into product development while striving for optimal productivity, accuracy, and technological advancement. Variability in measurements due to human factors can affect the final product, potentially leading to lost contracts and market share. Katsura Opto Systems' non-contact measurement products assist in achieving stable measurements anytime and anywhere.
