[Custom Product (Concept Model)] Simultaneous tilt measurement at three locations, parallel installation possible.
Background of Development Is it possible to create a measuring device that can measure objects arranged in narrow intervals all at once? This was the request from our customers that led to our development. There is a method that involves branching a single light source to measure multiple locations using one receiving unit. However, our company has developed a product equipped with three light sources and three receiving units. This allows us to create a product that does not experience the phenomenon of overlapping spots at the receiving unit, which can cause measurement errors. Features - Simultaneous measurement at three locations - Three sensors operate independently, eliminating measurement errors and detection errors - Integrated sensor and processor
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【Specifications】 Working distance: 50mm Number of measurement points: 1 to 3 points Measurement range: ±90 arcmin (circular range)
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Applications/Examples of results
Measurement of semiconductor wafer warpage, confirmation of tilt during autofocus of smartphone camera modules.
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Partner in Optical Non-Contact Measurement Welcome to Katsura Opto Systems Katsura Opto Systems is a global R&D company with expertise and staff in optics. Non-contact measurement everywhere Precision values that are essential for measurement are required from measuring instruments, as they ultimately relate to the quality of the final product, which is what Katsura Opto Systems believes. The best and highest quality products As a manufacturer ourselves, we continuously incorporate the latest technology into product development while striving for optimal productivity, accuracy, and technological advancement. Variability in measurements due to human factors can affect the final product, potentially leading to lost contracts and market share. Katsura Opto Systems' non-contact measurement products assist in achieving stable measurements anytime and anywhere.