Evaluation of wafer warpage using a non-contact three-dimensional measurement device.
Non-contact three-dimensional measurement device
Non-contact three-dimensional measurement device
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This is an analysis that can be used for power devices, optical devices, and LSI/memory-related applications.
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!