You can identify high resistance and open areas in the wiring from the absorption current image.
- Possible to identify high resistance abnormal areas - The current flowing through the wiring is weak (pA) - Measurement is possible even with a surface protective film present - Measurement is possible even with multilayered wiring - Measurement is possible under conditions almost identical to SEM observation
Inquire About This Product
basic information
For more details, please contact us.
Price range
Delivery Time
Applications/Examples of results
Poor wiring TEG measurement
catalog（1）
Download All Catalogs
Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
![[Analysis Case] Investigation of Voids Inside Bonded Wafers Using C-SAM](https://image.mono.ipros.com/public/product/image/690/2000464564/IPROS10710432090807869373.jpg?w=280&h=280)
![[Analysis Case] Atomic Level Structural Analysis of CIGS Thin-Film Solar Cells](https://image.mono.ipros.com/public/product/image/744/2000246139/IPROS5175582425069269758.jpg?w=280&h=280)
