There are various types of mass spectrometers, such as magnetic field type, quadrupole type, and time-of-flight type, which are used according to the purpose of the analysis!
Secondary Ion Mass Spectrometry (SIMS) is a highly sensitive analytical technique capable of identifying and quantifying trace impurity elements at the ppb level. Since measurements are conducted while sputtering, it is possible to obtain the depth distribution of impurities within the film. Please feel free to contact us when you need assistance. 【Features】 ■ Magnetic Field SIMS: Used for evaluating impurities that require high sensitivity. ■ Quadrupole SIMS: Used for evaluations that require depth resolution and for assessing multilayer films that include insulating films. ■ Time-of-Flight SIMS: Used for evaluating the molecular structure level of trace substances on the surface, as well as for assessing the contamination state of organic materials and minute foreign substances on the surface. *For more details, please download the PDF or feel free to contact us.
Inquire About This Product
basic information
For more details, please download the PDF or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Examples】 ■Depth profile analysis of F in insulating materials ■Depth profile analysis of Si isotope superlattices ■Depth profile analysis of B doped on the surface ■Depth profile analysis of 31P in Si with high mass resolution ■Evaluation of light elements in power MOS substrates *For more details, please download the PDF or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and measurement technologies along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, liquid crystals, metals, and new materials. Please feel free to contact us if you have any requests.
![[Analysis Case] Analysis of the HTM Layer in Perovskite Solar Cells](https://image.mono.ipros.com/public/product/image/8b6/2001510346/IPROS17391914276253465326.jpg?w=280&h=280)
![[Analysis Case] Diamond Evaluation Case Using SIMS](https://image.mono.ipros.com/public/product/image/387108/IPROS5432764855619488207.jpg?w=280&h=280)
![[Analysis Case] Ultra-high Sensitivity Measurement of Impurities in Silicon Using SIMS](https://image.mono.ipros.com/public/product/image/80b/2000246618/IPROS323837100342633944.jpg?w=280&h=280)
