For inspecting the front and back position misalignment of printed circuit boards! Dual-sided microscope system with lighting.

Achieving high-efficiency inspection through simultaneous observation of both sides. A microscope system that reliably captures scratches and misalignments on fine components such as lenses, LED chips, and communication parts!

The "TOMOS-50R1" is a dual-sided microscope system equipped with wide-field ring lighting, capable of capturing images with a 1x field of view. It allows for the inspection of both sides of electronic components such as condensers and resistors, resin parts for communication devices, and entire pieces like lenses. 【Features】 ■ High-precision image processing correction for optical axis misalignment on both sides of the microscope, lens magnification errors, and camera θ misalignment. ■ Dimension measurement is possible without the hassle of flipping the sample over. ■ Simultaneous imaging of both sides of quartz oscillators, MEMS, holes in printed circuit boards, and electronic components. ■ Measurement of misalignment in patterns and alignment marks on both sides can be done with a repeatability accuracy of ±0.010mm (※). ※ Measurement accuracy may vary depending on subject conditions, measurement conditions, objective lens magnification, measurement environment, etc. Please confirm with sample tests. ＼ For more details, please check "Download Catalog" ／

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