For inspecting front and back scratches on lenses and connectors! Illuminated dual-sided microscope system.

Achieving high-efficiency inspection through simultaneous observation of both sides. A microscope system that reliably captures scratches and misalignments on fine components such as lenses, LED chips, and communication parts!

The "TOMOS-50R1" is a dual-sided microscope system equipped with wide-field ring lighting, capable of capturing images with a 1x field of view. It allows for the imaging of entire electronic components such as condensers, resistors, resin parts for communication devices, and lenses, enabling inspection of both sides for defects. 【Features】 ■ High-precision image processing correction for optical axis misalignment of the microscope, lens magnification errors, and camera θ misalignment. ■ Dimension measurement is possible without the hassle of flipping the sample over. ■ Simultaneous imaging of both sides of quartz oscillators, MEMS, holes in printed circuit boards, and electronic components. ■ Measurement of misalignment in patterns and alignment marks on both sides with a repeatability accuracy of ±0.010mm (※). ※ Measurement accuracy may vary depending on subject conditions, measurement conditions, objective lens magnification, measurement environment, etc. Please confirm with sample tests. ＼ For more details, please check "Download Catalog" ／

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