Curved Surface Correspondence / Micro Defect Inspection Optical Inspection Technology OneShotBRDF
It does not miss tiny scratches and foreign objects with a depth of a few micrometers. Defect detection, which relied on visual inspection, is captured and detected in one shot using our unique scattered light detection technology!
Are there any issues with "curved and fine defect inspection" in the manufacturing site and appearance inspection process? ● Fine scratches and unevenness are not visible due to curved and 3D shapes ● Strong reflections on glossy and matte surfaces make stable inspection difficult ● Imaging from multiple directions is necessary, slowing down the inspection cycle ● The equipment configuration is complex and high-cost due to the need for curved surface compatibility ▼ Leave it to the optical inspection technology OneShotBRDF! ――― Features ―――――――――――――――――――――― ◆ Compatible with curved and 3D shapes ◆ High-speed inspection through one-shot imaging ◆ Scattered light is color-separated to visualize fine defects ――――――――――――――――――――――――――― OneShotBRDF is an optical inspection technology that utilizes Toshiba's unique scattered light analysis technology. By using a multi-wavelength coaxial aperture filter that selects the angle of light reflection, it visualizes fine scratches and unevenness in complex surface conditions such as curved, glossy, and matte surfaces in a single shot.
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The optical inspection technology OneShotBRDF detects fine scratches and foreign substances, which previously relied on visual inspection by skilled inspectors, using its unique scattered light detection technology to capture and detect in one shot. ■ Supports curved and 3D shapes It can handle gently curved surfaces and inclined surfaces that are difficult to inspect. ■ High-speed inspection through one-shot imaging Scattered light is captured in a single shot, enabling real-time inspection. ■ Color separation of scattered light to visualize fine defects Microscopic scratches and unevenness that are difficult to recognize are visualized in color. ■ Uses multi-wavelength coaxial aperture filters By imaging the slight changes in scattered light caused by scratches through a "multi-wavelength coaxial aperture filter," the recognition of fine defects can be simplified. *The lighting design applying this scattered light analysis technology received the 2019 Optical Design Excellence Award (sponsored by the Optical Society of Japan).
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■Surface Flaw Detection Scope [Toshiba Teli Corporation] The surface flaw detection scope is a product that employs "OneShotBRDF." It is a scope that detects scratches on flat surfaces in one shot. - Visualizes tiny scratches on flat surfaces that are difficult to observe - High-speed inspection through scattered light identification using multi-wavelength coaxial openings - Identifies scratches that are difficult to distinguish by image using color - Equipped with a high-resolution USB3 camera for easy PC connection
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We will provide optimal solutions that contribute to our customers' businesses through our "extensive experience and achievements accumulated over many years" and "high technical capabilities" in the fields of embedded and LSI design.
