Non-contact wafer sorting system using belt conveyance!
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
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Non-contact Wafer Sorting System using Belt Conveyance ◆ All measurements for resistance, thickness, and PN determination are non-contact ◆ Standard cassette count: Loader cassette x 4, Unloader cassette x 6 (Cassette count can be adjusted) ◆ Glass map (search) function ◆ CIM communication, 2-D/3-D mapping software ● Target wafer sizes: 3 inches to 8 inches (up to 3 sizes), or 8 inches, 12 inches (*) For more details, please contact us.
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Silicon wafer
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We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.