Resistance rate / Sheet resistance measuring instrument [CRESBOX]
Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
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basic information
Cost-effective multi-point measurement 4-probe resistance meter ● Equipped with an interlock manual stage shutter that is less affected by external environmental factors during measurement (optional: auto stage shutter) ● User-friendly operation system using a computer + dedicated software ● Programmable measurement patterns allow for circular and rectangular measurements ● Self-test function, thickness, peripheral position, and temperature correction functions for silicon wafer measurements ● Capable of displaying sheet resistance and metal film thickness ● Circular: up to 1,225 points, rectangular: up to 1,000 points 2-D/3-D mapping software (optional) ● Applicable wafer sizes: 2 inches to 8 inches, up to 156mm square (*) For further details, please contact us.
Price information
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Price range
P5
Delivery Time
Applications/Examples of results
Silicon wafers, semiconductor process films (epitaxy, ion implantation, diffusion, etc.), metal films, ITO films, conductive ceramics, etc.
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Company information
We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.