Optical interference film thickness measurement enables non-contact and high-speed measurement. Simultaneous measurement of two layers, either surface or intermediate layers, is possible. The software is also compatible with inline applications.
Recently, LED measurement applications have diversified in response to the expansion of their market, making it difficult for existing measurement devices to adapt to various uses. Additionally, many companies related to LEDs are hesitant to allocate significant budgets for new measurement projects due to the technical challenges involved, creating a high barrier to measuring LEDs and LED displays. In light of this situation, our company is proposing a mobile spectroscopic measurement device for LED measurement.
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basic information
The Handy Lambda LED monitor first recommends a minimum necessary configuration and has the feature of being able to upgrade when the applications increase. The hardware can be adjusted to the optical system according to the measurement samples, while the software can be modified based on the values to be measured and their volume. It is assumed that you will attach measurement probes that maintain the measurement distance according to CIE standards, sockets custom-designed for various sample shapes, and an integrating sphere essential for luminous flux measurement. The software includes functions that support measurements of brightness, luminance, luminous flux, illuminance, chromaticity, light distribution characteristics, dominant wavelength, peak wavelength, half-width, VF characteristics, and LI measurements for LEDs and LED displays. In particular, the LI measurement function using a dedicated pulse generator is an original feature not found in conventional measuring devices.
Price information
1,500,000 yen and up
Price range
P5
Delivery Time
P4
Applications/Examples of results
Target wavelength range: 310-1000nm Built-in detector: MOS linear image sensor Built-in detection element: 3.3nm (1 element) Measurement exposure time: 1.5ms-6.5s Actual measurement wavelength range: 380nm-950nm (standard) Luminous sensitivity: 1mcd-2000cd Brightness sensitivity: 20cd/m²-100000cd/m² Total luminous flux sensitivity: 20m/1m-5000/1m (6-inch sphere) Chromaticity (x,y): ±0.0002 Dominant wavelength accuracy: <±0.3nm Reproducibility accuracy: <0.2%
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Company information
Mainly utilizing optical measurement, devices for various non-destructive, non-contact measurements and semiconductor manufacturing process inspections (such as film thickness measurement and plasma monitoring) are developed for both online and offline use.