High-resolution multi-spectral device for LED measurement
Solid Lambda CCD LED monitor PLUS
High-resolution multi-spectral device for LED measurement
A new optimal device has emerged, themed around the diverse measurement items and applications important for the development of display devices centered on LED displays and LED light-emitting elements. This is our company's developed high-resolution multi-spectral device for LED measurement, the Solid Lambda CCD LED monitor PLUS.
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basic information
Determine measurement items according to the measurement theme and freely execute only the necessary measurements from a rich array of measurement capabilities. Measure various parameters such as the light distribution characteristics of LED modules, temperature control, luminous intensity, brightness, chromaticity, luminous flux, peak wavelength, dominant wavelength, full width at half maximum, VF characteristics, as well as the reflection, transmission, diffuse reflection, and diffuse transmission of the sample being measured, while changing the configuration of each device. We offer a variety of options, including probes that maintain measurement distances according to CIE standards, integrating sphere probes for luminous flux measurement, temperature controllers compatible with junction temperature measurement, dedicated rotating stages for measuring color characteristics, and brightness mapping measurement stages with CCD camera monitors for LED displays. The LI measurement function using a dedicated pulse generator achieves a duty cycle variable range of 0-100%, with a maximum current value of <350mA and a minimum pulse width of 10µs. For temperature adjustment of high-power LEDs, both electronic cooling and constant temperature bath methods are prepared. We also provide NIST-certified standard light sources, which are essential for luminous intensity and brightness measurements.
Price information
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Delivery Time
P4
Applications/Examples of results
Target wavelength range: 220-980nm Measured wavelength range: 380-950nm (standard) Main wavelength accuracy: <±0.2nm Measurement exposure time: 7ms-6.5s Luminous sensitivity: 0.05mcd-200cd Luminance sensitivity: 1cd/m²-10000cd/m² Total luminous flux sensitivity: 1mlm-500lm (6-inch sphere) Chromaticity (X,Y): ±0.0002 Reproducibility accuracy: <0.2% Pulse generator DUTY variable range: 0-100%
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Company information
Mainly utilizing optical measurement, devices for various non-destructive, non-contact measurements and semiconductor manufacturing process inspections (such as film thickness measurement and plasma monitoring) are developed for both online and offline use.
