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  5. Analytical Equipment and Devices
  6. Simple LED Luminance Measurement Stage MAS-L 0702

Simple LED Luminance Measurement Stage MAS-L 0702

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MAS-L 0702

last updated:Jan 19, 2011

スペクトラ・コープ
スペクトラ・コープ
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It is possible to measure the brightness, spectrum, and colorimetry of LEDs in a short time without worrying about the position of the sample.

A simple LED luminance measurement stage that can be connected to the high-resolution multi-spectral device "Solid Lambda CCD LED monitor PLUS" for LED measurement.

    Analytical Equipment and Devices
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Simple LED Luminance Measurement Stage MAS-L 0702

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  • Related Link - http://www.spectra.co.jp/kogata.files/price.files/…

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【Features】 ■ Ideal for LED inspection sites where ease of sample placement is required, such as when you want to measure a large number of samples quickly from the development environment to the field, or when you want to easily hold and measure small SMD-type samples. ■ When connected to a spectrometer from Spectra Co., you can measure the luminous intensity, spectrum, and colorimetry of LEDs in a short time without worrying about the position of the sample. ■ The connection between the spectrometer and the luminous intensity measurement probe is coupled with a quartz bundle fiber, providing stable light from the LED to the spectrometer. ■ There is no need to worry about external light shielding during LED emission; simply cover the luminous intensity measurement probe with the sample stage. ■ A wide variety of sample holders are available to accommodate different shapes of LED samples, including bullet-type, stem-type, and small SMDs or samples mounted on circuit boards. ■ With the dedicated Z-stage for fine adjustments, you can easily accommodate changes in sample height. □ For other functions and details, please refer to the catalog.

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Simple LED Luminance Measurement Stage MAS-L 0702

Simple LED Luminance Measurement Stage MAS-L 0702

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スペクトラ・コープ

スペクトラ・コープ

Electronic Components and Semiconductors

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Mainly utilizing optical measurement, devices for various non-destructive, non-contact measurements and semiconductor manufacturing process inspections (such as film thickness measurement and plasma monitoring) are developed for both online and offline use.

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