Non-destructive line measurement of film and sheet thickness.
First of all, each device component is designed to be simple, allowing us to introduce customized packaging that meets the needs of each customer, which is also optimal for cost reduction. We have adopted a highly reliable measurement calculation method called FFT, so you can collect data with confidence.
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basic information
Using light interference, we can non-contact measure the thickness of various oxide films, silicon, photoresists, various films, oil films, coating materials, adhesives, metal oxide films, dielectric films, and more with high precision. Since we mainly use halogen light, there is no impact on the human body, and it can be used in various locations. Depending on the specifications of the actuator, it can easily accommodate different sample sizes.
Price information
6 million to 10 million yen
Price range
P6
Delivery Time
P4
Applications/Examples of results
Recent examples include many applications for accurately measuring film thickness, with numerous inquiries coming from various chemical manufacturers. It is also effective for transparent films applied to displays and disks, and has been adopted for measuring coating films on eyeglass lenses.
Company information
Mainly utilizing optical measurement, devices for various non-destructive, non-contact measurements and semiconductor manufacturing process inspections (such as film thickness measurement and plasma monitoring) are developed for both online and offline use.