This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the very surface.
This is a method for structural analysis of sample surfaces. It is suitable for identifying organic contamination on the very surface due to its sensitivity compared to other analytical devices. Using a sputter ion source, it is possible to analyze the distribution of inorganic and organic materials in the depth direction. - Structural analysis and identification of organic and inorganic compounds are possible. - Coordination data from foreign substance inspection devices can be linked. - Qualitative analysis is possible from micron-order microforeign substances to several centimeters. - It is possible to analyze the very surface with high sensitivity. - Image analysis is possible. - Qualitative analysis of depth direction analysis is possible.
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basic information
By reducing the amount of ion irradiation at one time, it becomes possible to maintain the molecular state of the surface and generate secondary ions. The obtained secondary ions are analyzed using a Time-of-Flight mass spectrometer.
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Applications/Examples of results
- Evaluation of components and cause investigation of discoloration areas (cloudiness, stains, etc.) and peeling areas - Qualitative analysis of residues, contaminants, and foreign substances (over several micrometers) for organic and inorganic materials - Evaluation of the outermost surface before and after treatment - Distribution evaluation of materials and additives in organic EL, organic solar cells, and polymer films - Evaluation of layer structure of metal thin films and qualitative assessment of impurities - Qualitative assessment of binders in secondary batteries, state of lithium, and degradation evaluation - Distribution evaluation of impurities and coating agents from powder surfaces - Evaluation of the penetration of chemicals into skin and hair - Evaluation of component distribution in films
Detailed information
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Please consult with us first. ★ We will start by proposing an analysis plan ★ We can, of course, meet with you at your company. We will carefully explain the analysis results and leave no questions unanswered. Please contact us at 03-3749-2525 or info@mst.or.jp!
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We will hold a visiting seminar. ★ We offer free seminars with engineers visiting to meet customer needs ★ We will introduce analytical techniques and explain analytical data according to your requests. ◆ Example seminar content - Broad explanation of MST analytical methods - Detailed explanation of specific analytical methods from the principles - Explanation of the analytical data requested by the customer Please contact us at 03-3749-2525 or info@mst.or.jp!
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Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!