List of CAE products
- classification:CAE
316~360 item / All 3767 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
Transitional thermal measurement possible power cycle testing, with a customized luminescence/OBIRCH analysis device, where a skilled team thoroughly evaluates and analyzes power devices!
- Analytical Equipment and Devices
- Analysis Services
Rubber heat aging test
Our company conducts "rubber thermal aging tests" that help evaluate the properties of materials in actual usage environments. Using a method compliant with JIS K6257 (Method for determining thermal aging characteristics of vulcanized rubber and thermoplastic rubber), rubber test pieces are suspended in a gear oven to create specimens with varying heat treatment times. Additionally, tensile tests are performed on heated natural rubber (NR) to investigate changes in mechanical properties, while hardness is measured simultaneously. Changes in the characteristics of the rubber are also examined, confirming that rubber elasticity is lost and the material becomes harder with heating.
I will introduce an example of analysis using EBSD where orientation was observed in the Al wiring.
- Analytical Equipment and Devices
- Analysis Services
Example of analysis of compounds at the SAC solder and Ni pad interface.
We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface of NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is a technique that analyzes based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, it may be possible to analyze using crystallographic data for Ni3Sn4 and Cu6Sn5 as substitutes.
I will introduce an example of analysis using EBSD for pipes (austenitic).
- Analytical Equipment and Devices
- Analysis Services
Example of analysis of compounds at the SAC solder and Ni pad interface.
We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface of NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is a technique that analyzes based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, it may be possible to analyze using crystallographic data for Ni3Sn4 and Cu6Sn5 as substitutes.
The EBSD method allows for the estimation of crystal size distribution and residual stress.
- Analytical Equipment and Devices
- Analysis Services
Example of analysis of compounds at the SAC solder and Ni pad interface.
We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface of NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is a technique that analyzes based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, it may be possible to analyze using crystallographic data for Ni3Sn4 and Cu6Sn5 as substitutes.
Observing crystal structures with EBSD! Data can be obtained for each metal.
- Analytical Equipment and Devices
- Analysis Services
Example of analysis of compounds at the SAC solder and Ni pad interface.
We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface of NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is a technique that analyzes based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, it may be possible to analyze using crystallographic data for Ni3Sn4 and Cu6Sn5 as substitutes.
Changes in crystal orientation and crystal grain size can be analyzed! We introduce the EBSD (Electron Backscatter Diffraction) method.
- Analytical Equipment and Devices
- Analysis Services
Example of analysis of compounds at the SAC solder and Ni pad interface.
We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface of NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is a technique that analyzes based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, it may be possible to analyze using crystallographic data for Ni3Sn4 and Cu6Sn5 as substitutes.
Since semiconductors have different physical properties, new methods are required for failure analysis!
- Analysis Services
- Contract Analysis
Announcement of the introduction of Talos F200E
Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with features such as drift-corrected frame integration (DCFI), which accumulates multiple frames while correcting for drift.
We will introduce a comparison of brightness and characteristics between good products and ESD-damaged products, along with examples of luminescence analysis using EMS microscopy!
- Analysis Services
- Contract Analysis
Shorter delivery time than his method! Both shape observation using FIB-SEM and diffusion layer observation can be performed!
- Analysis Services
- Contract Analysis
Power device failure location / Slice & View three-dimensional reconstruction
I will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are obtained, and the resulting images are corrected for positional misalignment between the SEM images and visualized in three dimensions using 3D construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area.
EELS analysis for element identification allows for the comparison of the bonding states of materials!
- Analysis Services
- Contract Analysis
"SEM images" and "absorption current images (current sensing)" etc.! It identifies open defects in wiring and areas with high resistance defects.
- Analysis Services
- Contract Analysis
The inspector observes without missing anything! Consistent whisker evaluation is possible from reliability testing to analysis.
- Analysis Services
- Contract Analysis
Appearance observation and measurement services
We would like to introduce our "Appearance Observation and Measurement Service." We are equipped with a variety of devices to meet your needs, including appearance observation before and after reliability testing, solder joint observation, as well as dimensional measurements and surface roughness measurements of various components. You can also leave the pre-observation processing to us. Our company has IPC-certified IPC specialists on staff. We provide assistance with observations, consultations, and solutions to various observation-related concerns in accordance with international standards.
We will introduce EBSD analysis that reveals areas where distortion has accumulated in the wiring of the bending section!
- Analysis Services
- Contract Analysis
We will narrow down the defective areas through lighting confirmation, panel disassembly, and optical microscope observation!
- Analysis Services
- Contract Analysis
Observation of Conductive Particle Shape in COG Implementation
We will introduce the observation of the shape of conductive particles in COG implementation. ICs and liquid crystal panels are implemented using the COG method with ACF (anisotropic conductive film). A resin ball is used as the core, and a metal layer (such as nickel or gold) for conductivity is deposited on its surface. During connection, the particles deform appropriately to electrically connect the IC and the panel. To confirm the degree of particle deformation and connection status, cross-sectional observations were conducted, revealing that the particle deformation was at a "medium" level, indicating an appropriate degree of deformation. By examining the deformation of conductive particles from both the planar and cross-sectional directions, we can explore the correlation with display defects. Please feel free to contact us for any inquiries regarding panel-related defects.
Analysis of inorganic compounds such as metal oxides is also possible! We will introduce the analysis of black spots on the surface of copper-clad laminates.
- Analysis Services
- Contract Analysis
Chemical Analysis Concierge Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.
Useful for long-term quality control! Ultra-microhardness measurement of materials such as metals, polymers, and ceramics.
- Contract Analysis
- Analysis Services
Tensile test
The "tensile test" is a test that measures the load and displacement (elongation) when a material is pulled at a constant speed, in order to determine the physical and mechanical properties of the material. By pulling the test specimen in a temperature-controlled chamber, it is possible to determine and understand the temperature dependence of these properties. Our company is capable of conducting material property tests under temperature-controlled conditions. We can also propose conditions tailored to the materials and properties you wish to measure. Please feel free to consult with us.
Non-destructive X-ray observation is effective for initial inspection! We will introduce examples of defect analysis.
- Analysis Services
- Contract Analysis
Estimate bonding states by comparing with standard spectra! Introducing state analysis using EPMA.
- Analysis Services
- Contract Analysis
Detection sensitivity is excellent! It is particularly superior in quantitative analysis of trace components and map analysis.
- Analysis Services
- Contract Analysis
Supports 100×100mm size! The movable stage allows for extensive mapping.
- Analysis Services
- Contract Analysis
- Other contract services
We conducted an observation of the fracture surface of the crab claw that was damaged due to long-term use!
- Analysis Services
- Contract Analysis
Observation of the misalignment of the internal metal plate! This is a case study of a toggle switch observed using X-ray fluoroscopy and orthogonal CT observation.
- Analysis Services
- Other contract services
Analysis case of faulty switch contacts
Since a malfunction was suspected in the switch section of the appliance that would not power on, we will introduce a case study along with the work flow. First, we check for any shape changes such as swelling, cracking, or discoloration through visual observation. In the electrical check, we confirm whether the malfunction can be reproduced and whether it is an open or short circuit. An internal observation using X-rays revealed that the contact terminals inside the switch had melted, scattered, and disappeared, resulting in an open failure. Ultimately, we will submit a report that includes the consideration of the cause. We also accept inquiries for analysis consultations after non-destructive testing, so please feel free to contact us.
Support from reliability testing observations to 3D measurement! It is possible to conduct whisker evaluations while eliminating transportation risks.
- Analysis Services
- Other contract services
Evaluation of various implementation substrates
At Aites Co., Ltd., we provide a wide range of technical services for evaluation tests of printed circuit boards (mounted boards) equipped with electronic components. We conduct reliability tests, solder joint observations, whisker observations, and cross-sectional observations. We have IPC-A-610 certified IPC specialists on staff who can assist with observations in accordance with international standards, consultations, and various observation-related concerns. Additionally, we offer services such as X-ray observations, appearance inspections, and shape measurements, so please feel free to consult with us when needed.
Observation using optical microscopy and ultra-low acceleration FE-SEM! Detailed structural analysis and elemental analysis are possible.
- Analysis Services
- Other contract services
Composition analysis of LIB cathode active materials by ICP luminescence analysis.
This presentation introduces the composition analysis of active materials in cathode materials using ICP emission analysis. The cathode material in lithium-ion batteries (LIB) is one of the important components that influence the battery's voltage and energy density, and the composition of the cathode material significantly affects the battery's performance. ICP emission analysis allows for qualitative and quantitative analysis of approximately 70 elements, primarily metal elements. In addition to composition analysis of LIB cathode materials, it can also be applied to various analyses, including qualitative and quantitative analysis of additives and impurities contained in samples, as well as quantitative analysis of substances regulated by the RoHS directive.
ECU Calibration & DAQ Software All-in-One Platform VISION 7
- others
- Other analyses
Flexible support for various angles with an adjustable base! A lineup of small vibrators for modal analysis.
- Other analyses
- Other machine elements
New Product: Small Vibrator, Inertial Type: IS Series
The inertial type is designed to be lightweight and compact, making it possible to carry out vibration tests. Since the exciter itself vibrates, it can be directly fixed to the structure or test sample, making it very user-friendly. For more details, please download and view the catalog.
Lightweight, portable, and highly durable! Easy to handle! Some models come with a built-in amplifier and sine wave generator! A variety of lineups available!
- Vibration Testing
- Other analyses
- Other machine elements
New Product: Small Vibrator, Inertial Type: IS Series
The inertial type is designed to be lightweight and compact, making it possible to carry out vibration tests. Since the exciter itself vibrates, it can be directly fixed to the structure or test sample, making it very user-friendly. For more details, please download and view the catalog.
Reflecting more realistic tire behavior in model-based development!
- simulator
Enhance design quality and promote digital transformation. Achieve speedy pattern verification with simple parameter input.
- Analysis Services
User-friendly software for pre- and post-processing of acoustic simulations.
- Structural Analysis
- Acoustic Analysis
- Magnetic field analysis/electromagnetic wave analysis
3D Linking Software for NAZCA5 CAM Mill (Optional)
- simulator
Information on IT Introduction Subsidy 2024
*Please consult us as soon as possible* The public recruitment for the [IT Introduction Subsidy 2024] has started. The IT Introduction Subsidy is a program where the government subsidizes a portion of the expenses for introducing IT tools that meet your company's challenges and needs. Gordo will propose IT solutions tailored to your requirements! <Eligible Products> - Visualization system for factories "Nazca Neo Linka" - IT support for manufacturing sites "NAZCA5 CAD/CAM" - Data management for processing sites "NAZCA5 EDM Lite," etc. In addition to products, installation costs, software operation training fees, and maintenance costs are also eligible for subsidies. *Please note that the supplementary budget is limited and may end early.* When considering this, please consult our sales office as soon as possible (TEL: 053-465-0711).
A future where anyone can easily handle advanced technology! Providing DX, SaaS, and platform for analytical methods.
- Analysis Services
- Process Control System
- Other contract services
To those involved in device design and development! This is an analysis report on Samsung's NAND flash. It explains the important signal operations during device operation!
- Analysis Services
Detailed structural analysis report of the Intel Atom 23740 processor.
- Other analyses
Detailed structural analysis of the 20 nm HKMG Qualcomm Gobi.
- Analysis Services
Detailed structural analysis of the Gobi MDM9235 modem logic
- Analysis Services
This is a detailed structural analysis report of Intel(R) eDRAM.
- Other analyses
This is a report comparing the cell configurations of 20nm class DRAM and 0nm class 2Gb DDR3 DRAM.
- Analysis Services
This is a detailed structural analysis of the Mediatek MT6592 octa-core (8-core).
- Analysis Services
Did you know that we can also analyze systems and software?
- Analysis Services
This is a structural analysis report of Samsung 3D V-NAND.
- Analysis Services
Detailed Memory Structure Analysis Report of Flash Memory
- Other analyses
We have a track record of large-scale analysis using supercomputers such as "Fugaku"! We are also skilled in computational utilization techniques.
- Contract Analysis
- Contract Analysis
Execute within a strategic framework from the perspective of 'why we conduct analysis and evaluation'!
- Analysis Services
- Business Intelligence and Data Analysis
Understand the causes of damage and implement measures to prevent recurrence! We will investigate and analyze the factors related to damage caused by fractures or corrosion of various materials such a...
- Contract Analysis
- Other analyses
- Analysis Services