Measurement and Analysisの製品一覧

Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

• air conditioning

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

• Contract Analysis

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

• Contract Analysis

Estimation of film thickness using the average free path of photoelectrons.

• Contract Analysis

Measurements will be taken under analysis conditions suited to the purpose.

• Contract Analysis

Evaluation of localized elements is possible with imaging SIMS.

• Contract Analysis

Evaluation of activation rate is possible through composite analysis.

• Contract Analysis

The coordinate linkage function with the foreign object inspection device allows for the evaluation of specific foreign objects.

• Contract Analysis

Evaluate film thickness, density, and bonding state.

• Contract Analysis

Capable of evaluating the composition of the main elemental components of GaN-based LEDs in the depth direction.

• Contract Analysis

It is possible to obtain the impurity profile in the GaN-based LED structure from the backside.

• Contract Analysis

Capable of highly sensitive evaluation of the distribution of additives at the ppm level.

• Contract Analysis

Capable of evaluating the composition of the main elemental components of compound semiconductors in the depth direction.

• Contract Analysis

Evaluation of melamine concentration in infant formula milk powder

• Contract Analysis

Measurements will be taken according to the analysis conditions suited to the purpose.

• Contract Analysis

Capable of structural analysis at the nanoscale and evaluation of nanoparticle size.

• Contract Analysis

It is possible to evaluate the film thickness of the degraded layer using the GCIB (Ar cluster).

• Contract Analysis

ICP-MS: Inductively Coupled Plasma Mass Spectrometry

• Contract Analysis

Quantitative analysis of glucosylceramides in crops and processed products is possible.

• Contract Analysis

Quantitative analysis of c-Si and a-Si by state is possible using high-resolution measurement and waveform analysis.

• Contract Analysis

We evaluate abnormalities inside the device non-destructively.

• Contract Analysis
• Other electronic parts
• Transistor

Composite approach to the cross-sectional structure and surface shape of the negative electrode, as well as elemental mapping images of the active material cross-section!

• Secondary Cells/Batteries
• Contract measurement

Weight analysis

• Contract measurement
• wood

It is possible to evaluate the luminescent properties and degradation analysis of perovskite solar cells non-destructively.

• Contract measurement

Evaluation and analysis of porous structures is possible using X-ray CT.

• Ceramics
• Contract Analysis
• X-ray inspection equipment

Completely custom-made! We extract valuable information tailored to your needs from the important data you have collected.

• Contract measurement
• Contract Analysis
• Image Processing Software

Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.

• Wafer
• Contract measurement
• Other semiconductors

Capable of evaluating three-dimensional structural changes according to tensile stress.

• Contract measurement
• Contract Inspection

Shape observation and simple quantitative analysis using SEM-EDX.

• Contract Inspection
• Wafer
• Other semiconductor manufacturing equipment

SIMS analysis allows for the evaluation of elements such as H, C, N, O, and F down to levels below 1 ppm.

• Contract Analysis

Composite analysis using TG-DTA and GC/MS.

• Contract Analysis

Analysis is possible even for special shapes through innovative fixing methods.

• Contract Analysis

Measurement avoiding the influence of high concentration layers using SSDP-SIMS.

• Contract Analysis

It is possible to evaluate the depth distribution of H in the IGZO film with high sensitivity.

• Contract Analysis
• Contract Inspection

Evaluation of bonding state and electronic state using XPS and UPS.

• Contract Analysis
• Contract Inspection

Evaluation of catalyst particles using STEM-EDX.

• Contract Analysis

By using a combination of processing, elemental analysis of the interface is possible.

• Contract Analysis

Qualitative analysis by simultaneous measurement of fluorescence and mass.

• Contract Analysis

It is possible to evaluate the distribution of the crystalline state of carbon within the sample surface.

• Contract Analysis

Evaluation of gas release components from organic films and temperature dependence assessment are possible with TDS.

• Contract Analysis

Evaluation of the composition and bonding state of the outermost surface is possible.

• Contract Analysis

You can evaluate the p/n polarity and carrier concentration distribution of the diffusion layer in SiC devices.

• Contract Analysis
• Other electronic parts

It is effective to differentiate between the two methods depending on the surface structure of interest.

• Contract Analysis
• Memory

It is possible to visualize molecular information of organic and inorganic substances.

• Contract measurement

It is possible to obtain a large amount of metal element information at once through qualitative and semi-quantitative analysis!

• Contract Analysis

You can analyze the structure of mixed samples using NMR without performing isolation and purification!

• Contract Analysis