List of Measurement and Analysis products
- classification：Measurement and Analysis
3376～3420 item / All 52910 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
![[Analysis Case] Evaluation of Parti...](https://image.mono.ipros.com/public/product/image/dc5/2000246773/IPROS5195024640877014253.jpg?w=280&h=280){kind=small}
Evaluation of catalyst particles using STEM-EDX.
- Contract Analysis
XPS: X-ray Photoelectron Spectroscopy AES: Auger Electron Spectroscopy
- Contract Analysis
![[Analysis Case] Evaluation of Compo...](https://image.mono.ipros.com/public/product/image/505/2000246667/IPROS5065016759361245848.jpg?w=280&h=280){kind=small}
Evaluation will be conducted under measurement conditions tailored to the purpose.
- Contract Analysis
![[Analysis Case] Evaluation of the s...](https://image.mono.ipros.com/public/product/image/358/2000246663/IPROS287035906989030425.jpg?w=280&h=280){kind=small}
Evaluation of the sp2/(sp2+sp3) ratio using C1s waveform analysis.
- Contract Analysis
![[Analysis Case] Foreign Substance A...](https://image.mono.ipros.com/public/product/image/d6d/2000246628/IPROS7929959701310227194.jpg?w=280&h=280){kind=small}
Identifies the components of foreign substances without the influence of the substrate or base material.
- Contract Analysis
UPS: Ultraviolet Photoelectron Spectroscopy
- Contract Analysis
Automating quality control of the chloride ion concentration in the acidic copper plating bath used for Cu deposition on semiconductor wafers using a potentiometric automatic titration system.
- Analytical Equipment and Devices
- Plating Equipment
- Wafer
![[Analysis Case] Evaluation of the C...](https://image.mono.ipros.com/public/product/image/521/2000246064/IPROS985011151973764319.jpg?w=280&h=280){kind=small}
Evaluation of bonding state and electronic state using XPS and UPS.
- Contract Analysis
- Contract Inspection
![[Analysis Case] Local Crystal Struc...](https://image.mono.ipros.com/public/product/image/2cb/2000246062/IPROS8161587569609182565.jpg?w=280&h=280){kind=small}
Continuous evaluation of crystallinity and orientation using electron diffraction.
- Contract Analysis
- Contract Inspection
![[Analysis Case] Evaluation of Ti Di...](https://image.mono.ipros.com/public/product/image/d6c/2000246060/IPROS5071580132074698422.jpg?w=280&h=280){kind=small}
Measurement avoiding the influence of high concentration layers using SSDP-SIMS.
- Contract Analysis
- Contract Inspection
![[Analysis Case] Evaluation of H Con...](https://image.mono.ipros.com/public/product/image/d52/2000246059/IPROS7663731616676873733.jpg?w=280&h=280){kind=small}
It is possible to evaluate the depth distribution of H in the IGZO film with high sensitivity.
- Contract Analysis
- Contract Inspection
![[Analysis Case] SSDP-SIMS Analysis ...](https://image.mono.ipros.com/public/product/image/09f/2000245747/IPROS9023038701453490872.jpg?w=280&h=280){kind=small}
It is possible to obtain the dopant concentration profile from the SiC substrate side.
- Contract Analysis
![[Analysis Case] Diffusion Evaluatio...](https://image.mono.ipros.com/public/product/image/066/2000245635/IPROS76086819834464693.jpg?w=280&h=280){kind=small}
Measurement avoiding the influence of high concentration layers using SSDP-SIMS.
- Contract Analysis
![[Analysis Case] SIMS Measurement of...](https://image.mono.ipros.com/public/product/image/b05/2000245630/IPROS5786148276058024004.jpg?w=280&h=280){kind=small}
Analysis is possible even for special shapes through innovative fixing methods.
- Contract Analysis
![[Analysis Case] Evaluation of Si Na...](https://image.mono.ipros.com/public/product/image/ab1/2000245625/IPROS8700815583233760014.jpg?w=280&h=280){kind=small}
Estimation of film thickness using the average free path of photoelectrons.
- Contract Analysis
Automation of measuring water hardness, metal salts in electroplating solutions, and metal concentrations in minerals using a potentiometric automatic titration device.
- Analytical Equipment and Devices
- Non-ferrous metals
- Plating Equipment
![[Analysis Case] Evaluation of Impur...](https://image.mono.ipros.com/public/product/image/5db/2000245620/IPROS3494450168506955765.jpg?w=280&h=280){kind=small}
Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.
- Contract Analysis
![[Analysis Case] Composition Analysi...](https://image.mono.ipros.com/public/product/image/062/2000244587/IPROS101305177333590566.jpg?w=280&h=280){kind=small}
Quantitative analysis of the main components of sheet-like active substances is possible.
- Contract Analysis
- Contract measurement
It is possible to evaluate the change in crystallinity while increasing the temperature.
- Contract Analysis
![[Analysis Case] Identification of P...](https://image.mono.ipros.com/public/product/image/2b3/2000244293/IPROS797756027063150607.jpg?w=280&h=280){kind=small}
XRD measurement can be performed while increasing the temperature.
- Contract Analysis
![[Analysis Case] Depth Direction Ana...](https://image.mono.ipros.com/public/product/image/117/2000244279/IPROS6468602514540796181.jpg?w=280&h=280){kind=small}
Evaluation of the depth direction of surface modification layers of polymers, resins, and films using TOF-SIMS is possible.
- Contract Analysis
![[Analysis Case] Component Identific...](https://image.mono.ipros.com/public/product/image/7e7/2000243778/IPROS5543083971046712624.jpg?w=280&h=280){kind=small}
Proposal for the use of standard samples with aligned thermal history.
- Contract Analysis
The world's first full-scale portable pollen quality analysis device.
- Particle Counter
- Flow cytometer
- Cell Counter
Principles and Applications of Pyrolysis GC/MS
- Contract Analysis
![[Analysis Case] Composition and Thi...](https://image.mono.ipros.com/public/product/image/ec2/2000026145/IPROS4686018529280117826.jpg?w=280&h=280){kind=small}
Estimation of film thickness using the average free path of photoelectrons.
- Contract Analysis
![[Analysis Case] Evaluation of the D...](https://image.mono.ipros.com/public/product/image/a48/2000026144/IPROS4233872736396844348.jpg?w=280&h=280){kind=small}
Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.
- Contract Analysis
![[Analysis Case] Measurement of Film...](https://image.mono.ipros.com/public/product/image/571/2000026128/IPROS7813148267828045388.jpg?w=280&h=280){kind=small}
X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.
- Contract Analysis
![[Analysis Case] Evaluation of the S...](https://image.mono.ipros.com/public/product/image/5e8/2000026122/IPROS8562241420726958415.jpg?w=280&h=280){kind=small}
The process will be carried out from pretreatment to XPS measurement under an inert gas atmosphere.
- Contract Analysis
![[Analysis Case] Analysis of Catalys...](https://image.mono.ipros.com/public/product/image/66e/2000026105/IPROS487619819689772092.jpg?w=280&h=280){kind=small}
Chemical state analysis using XPS and morphological observation using TEM.
- Contract Analysis
![[Analysis Case] Observation of the ...](https://image.mono.ipros.com/public/product/image/bb5/2000026074/IPROS4649337917118554439.jpg?w=280&h=280){kind=small}
Capable of observing large-area surface shapes.
- Contract Analysis
![[Analysis Case] Analysis of Organic...](https://image.mono.ipros.com/public/product/image/e4e/2000026064/IPROS3983062967139622673.jpg?w=280&h=280){kind=small}
Reduce the impact of foreign object surrounding information with appropriate sampling.
- Contract Analysis
![[Analysis Case] Analysis of Organic...](https://image.mono.ipros.com/public/product/image/b25/2000242627/IPROS628428551888074757.jpg?w=280&h=280){kind=small}
Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.
- Contract Analysis
![[SIM] Scanning Ion Microscopy Metho...](https://image.mono.ipros.com/public/product/image/d09/387108028/IPROS2308410282720757772.jpg?w=280&h=280){kind=small}
Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).
- Contract Analysis
- Contract measurement
- Contract Inspection
【Mitarepo】Surprisingly Low Price!? I Investigated the Certification Range of Trackers! | System Create
- Scanner
- Other inspection equipment and devices
- Other analyses
I will explain the 3D scanner "Revopoint Trackit."
- Scanner
- Other inspection equipment and devices
I will explain the 3D scanner "Revopoint Trackit."
- Scanner
- Other inspection equipment and devices
![[Case Study] Introduction of precis...](https://image.mono.ipros.com/public/product/image/761/2000653516/IPROS48472255958105468970.png?w=280&h=280){kind=small}
The ability to design air conditioning when installing exhaust equipment together is a major point of our proposal!
- Other temperature and humidity measuring instruments
![[Noise Control Related Case] Introd...](https://image.mono.ipros.com/public/product/image/584/2000643637/IPROS83979653389034234799.jpeg?w=280&h=280){kind=small}
Not only measuring volume but also the direction of occurrence! We proposed a noise monitoring system manufactured by Rion.
- Noise Inspection
We also offer electric meters compatible with automatic meter reading! We will also introduce lightweight and compact multifunction recorders.
- Power meter
- Other analytical and testing equipment
Hovermap STX combines high-efficiency measurement with world-class precision SLAM and drone autonomous control that is not dependent on GPS or lighting conditions.
- Other measurement, recording and measuring instruments
The MP series, which has received great reviews, now includes a lot type: Absolute linear displacement sensor.
- Distance measuring device