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AFM(スキャナ) - List of Manufacturers, Suppliers, Companies and Products

AFM Product List

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200mm Large Sample Compatible AFM/SPM Jupiter XR

200mm Large Sample Compatible AFM/SPM Jupiter XR

A large sample-compatible stage-type AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent resolution, speed, operability, and flexibility.

The Jupiter XR atomic force microscope is the industry's first large sample-compatible AFM/SPM that supports "ultra-high resolution," "high-speed imaging," and "wide-area scanning" with a single scanner without the need to change scanners. The sample stage allows access to the entire 200 mm sample area and inherits the excellent fundamental design and operability developed in the Cypher AFM (released in 2007), as well as the photothermal excitation 'blueDrive.' With its high level of balance, the Jupiter XR is the best choice for applications that require a variety of samples and applications in fields such as analytical science, industrial R&D, and academic research.

  • Microscope

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Low-cost high-performance research AFM/SPM MFP-3D Origin

Low-cost high-performance research AFM/SPM MFP-3D Origin

Achieve high performance and high quality at low cost! The most affordable atomic force microscope with Asylum quality in the low price range. It offers high performance and a wide range of features.

The MFP-3D Origin is a model that features high performance and quality unique to Asylum Research, while being competitively priced against existing low-cost AFM/SPM options. This model offers a balance of performance and price, providing "high-resolution imaging," "large sample handling," "various imaging modes," and "diverse accessories." It is the best entry-level model for starting to use AFM/SPM!

  • Microscope

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Tabletop AFM

Tabletop AFM

Electromagnetic scanner type (patented) allows for damage-free and non-destructive measurements at a low cost. It has functions equivalent to expensive AFM.

Even beginners can achieve accurate measurements! You can measure non-destructively just by setting the sample! There is a lineup ranging from handheld types to fully automatic measurements with cassettes. 【Product Features】 - Ultra-compact with a depth and width of 15cm, easy to carry anywhere - Evaluation and demo units available for loan. Rich measurement inspection track record - Achieves low cost while having functions comparable to expensive AFMs - By using an electromagnetic scanner (patented) for scanning, there is no need to move the substrate - Does not use piezo elements commonly used in AFMs, so there is no nonlinear creep or aging changes - Can measure without damage and non-destructively - AFM carbon nano-probes (high resolution, long lifespan) 【Software Applications】 - Fine line width measurement - Surface shape measurement of silicon and compound wafers - Surface inspection of quartz glass - Mask pattern measurement - Surface inspection and evaluation after polishing and CMP - Thin film step measurement, continuous and discontinuous measurement during film formation - Observation of magnetic fields in hard disks - Film surface inspection - High-precision surface analysis of metal molds - Evaluation of optical components and precision parts

  • Semiconductor inspection/test equipment

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Ultra-fast! Highly versatile and expandable AFM/SPM Cypher VRS

Ultra-fast! Highly versatile and expandable AFM/SPM Cypher VRS

"Not just high speed!" A high-speed AFM/SPM (Atomic Force Microscope) with excellent versatility and expandability.

The Cypher VRS atomic force microscope is the industry's first "AFM/SPM that combines ultra-fast imaging with a variety of property analysis and environmental control functions." While incorporating the high resolution, versatility, and ease of use that characterize Asylum Research's Cypher AFM/SPM, it can measure dynamic processes at the nanoscale at ultra-fast speeds.

  • Microscope

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