We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for AFM.
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AFM Product List and Ranking from 5 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Sep 17, 2025~Oct 14, 2025
This ranking is based on the number of page views on our site.

AFM Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Sep 17, 2025~Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. 日本レーザー Tokyo//Electronic Components and Semiconductors
  2. ブルーオーシャンテクノロジー Tokyo//Industrial Machinery
  3. オックスフォード・インストゥルメンツ Tokyo//Testing, Analysis and Measurement
  4. シロ産業 Osaka//Industrial Electrical Equipment
  5. 5 アイテス Shiga//Electronic Components and Semiconductors

AFM Product ranking

Last Updated: Aggregation Period:Sep 17, 2025~Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Compact and small atomic force microscope AFM CrabiAFM 日本レーザー
  2. Tabletop AFM ブルーオーシャンテクノロジー
  3. Ultra-high resolution, high-speed scanning AFM/SPM Cypher S オックスフォード・インストゥルメンツ
  4. 4 Low-cost high-performance research AFM/SPM MFP-3D Origin オックスフォード・インストゥルメンツ
  5. 4 Air-driven cooling fine mist spray unit M58AFM-100AMA シロ産業

AFM Product List

1~12 item / All 12 items

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Ultra-high resolution, high-speed scanning AFM/SPM Cypher S

High precision, yet operation is surprisingly easy! The ideal AFM/SPM for measurements in both gas and liquid phases in the fields of materials science and life sciences.

Cypher S AFM/SPM (Atomic Force Microscope) demonstrates ultra-high resolution and high-speed performance! It achieves true atomic resolution in AC mode, which is also a testament to the ability to perform measurements with extremely low noise. There is no need to choose between the accuracy of closed-loop atomic resolution imaging and the low noise characteristics of open-loop; you can have both. The automatic laser alignment feature, SpotOn, is very user-friendly, eliminating the need for traditional manual operation. With a laser spot size of 3 μm, it enables high-speed AC imaging and low noise measurements using micro levers. The interchangeable modular design expands the options for applications and scanning modes. The built-in enclosure of the Cypher allows for thermal control and acoustic insulation, optimizing the stability of imaging and measurements, significantly improving thermal drift compared to conventional AFM/SPM. For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Microscope

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High-performance research AFM/SPM MFP-3D Origin+

Achieve accurate imaging, precision, and reproducibility! We offer high-performance research-grade AFM/SPM at an affordable price. All types of optional accessories are available.

The MFP-3D Origin+ offers high performance and a wide range of features at a competitive price compared to existing low-cost AFM/SPM systems. It is an extremely versatile research-grade high-performance AFM/SPM that can cater to various research fields. While it has the same core performance as the MFP-3D Origin, a significant feature is its support for all innovative accessories for the MFP-3D, making it a highly cost-effective model.

  • Microscope

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Low-cost high-performance research AFM/SPM MFP-3D Origin

Achieve high performance and high quality at low cost! The most affordable atomic force microscope with Asylum quality in the low price range. It offers high performance and a wide range of features.

The MFP-3D Origin is a model that features high performance and quality unique to Asylum Research, while being competitively priced against existing low-cost AFM/SPM options. This model offers a balance of performance and price, providing "high-resolution imaging," "large sample handling," "various imaging modes," and "diverse accessories." It is the best entry-level model for starting to use AFM/SPM!

  • Microscope

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Ultra-fast! Highly versatile and expandable AFM/SPM Cypher VRS

"Not just high speed!" A high-speed AFM/SPM (Atomic Force Microscope) with excellent versatility and expandability.

The Cypher VRS atomic force microscope is the industry's first "AFM/SPM that combines ultra-fast imaging with a variety of property analysis and environmental control functions." While incorporating the high resolution, versatility, and ease of use that characterize Asylum Research's Cypher AFM/SPM, it can measure dynamic processes at the nanoscale at ultra-fast speeds.

  • Microscope

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Ultra-high performance multifunctional AFM/SPM MFP-3D Infinity

The flagship model of the MFP-3D AFM/SPM family, compatible with the most diverse imaging modes and accessories.

The MFP-3D Infinity from Asylum Research is the top model in the MFP-3D family of AFM/SPM. It offers an advanced system configuration designed with high performance, a wide range of features, and future expandability in mind. The MFP-3D Infinity not only handles everyday imaging easily and quickly but also possesses the power and flexibility to support cutting-edge research projects as an atomic force microscope system.

  • Microscope

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Compact and small atomic force microscope AFM CrabiAFM

It is a compact and cost-effective simple atomic force microscope (AFM). It is ideal for research and educational purposes, as well as for use as a secondary instrument.

■Cost Performance The lowest priced atomic force microscope (AFM) in the industry. ■High Reliability Achieves superior imaging with patented core technology. ■Compact The AFM measurement head is very compact, with a size of 110mm square. ◆Complete with Software! *You can download the comprehensive PDF catalog. For more details, please contact us.

  • Other microscopes

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Air-driven cooling fine mist spray unit M58AFM-100AMA

Air-driven cooling fine mist spraying unit (for air-type factory fan) Model No. M58AFM-100AMA

Easily attachable with one touch The nozzle has a neodymium magnet, allowing for one-touch attachment to the fan guard of factory fans. Non-sticky! Refreshing, dry mist Ideal for heatstroke and static electricity measures in fire hazard areas.

  • Cooling system

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Tabletop AFM

Electromagnetic scanner type (patented) allows for damage-free and non-destructive measurements at a low cost. It has functions equivalent to expensive AFM.

Even beginners can achieve accurate measurements! You can measure non-destructively just by setting the sample! There is a lineup ranging from handheld types to fully automatic measurements with cassettes. 【Product Features】 - Ultra-compact with a depth and width of 15cm, easy to carry anywhere - Evaluation and demo units available for loan. Rich measurement inspection track record - Achieves low cost while having functions comparable to expensive AFMs - By using an electromagnetic scanner (patented) for scanning, there is no need to move the substrate - Does not use piezo elements commonly used in AFMs, so there is no nonlinear creep or aging changes - Can measure without damage and non-destructively - AFM carbon nano-probes (high resolution, long lifespan) 【Software Applications】 - Fine line width measurement - Surface shape measurement of silicon and compound wafers - Surface inspection of quartz glass - Mask pattern measurement - Surface inspection and evaluation after polishing and CMP - Thin film step measurement, continuous and discontinuous measurement during film formation - Observation of magnetic fields in hard disks - Film surface inspection - High-precision surface analysis of metal molds - Evaluation of optical components and precision parts

  • Semiconductor inspection/test equipment

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MFP-3D-BIO: Optical Microscopy Integrated AFM/SPM for Biosciences

MFP-3D-BIO AFM: The only bio AFM/SPM seamlessly integrated with all optical technologies.

Perfect for bioscience research! With ultra-low noise characteristics and unprecedented precision, the level of AFM/SPM equipment for bioscience research has significantly improved!

  • Other microscopes

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200mm Large Sample Compatible AFM/SPM Jupiter XR

A large sample-compatible stage-type AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent resolution, speed, operability, and flexibility.

The Jupiter XR atomic force microscope is the industry's first large sample-compatible AFM/SPM that supports "ultra-high resolution," "high-speed imaging," and "wide-area scanning" with a single scanner without the need to change scanners. The sample stage allows access to the entire 200 mm sample area and inherits the excellent fundamental design and operability developed in the Cypher AFM (released in 2007), as well as the photothermal excitation 'blueDrive.' With its high level of balance, the Jupiter XR is the best choice for applications that require a variety of samples and applications in fields such as analytical science, industrial R&D, and academic research.

  • Microscope

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Ultra-high speed and ultra-high resolution AFM/SPM Cypher VRS1250

Achieving ultra-high speed, ultra-high resolution, and ultra-stability!! Moreover, a video-rate AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent versatility and expandability.

The Cypher VRS1250 achieves double the speed of the original Cypher VRS, with a maximum scan rate of 1250 lines per second. It offers improved temporal resolution with a frame rate of up to 45 frames per second (fps). Additionally, at lower frame rates, it can collect a large number of image pixels, enhancing spatial resolution. With ultra-stable imaging, an easy-to-use fully sealed sample cell with flow capabilities, and a variety of measurement modes and accessories, the Cypher VRS1250 supports cutting-edge ambitious research!

  • Microscope

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AFM (Atomic Force Microscope)

High-resolution imaging with a micro probe! Achieving nano-level structural analysis.

Our company scans the sample surface with a micro probe to achieve nano-level structural analysis. In "shape measurement (tapping mode)," the probe, which is periodically vibrated, lightly taps the sample surface to measure its shape. Additionally, "phase imaging" maps the phase delay between the periodic signal that moves the cantilever and the cantilever's vibration, visualizing differences in physical properties that do not appear in the shape. 【Features】 ■ High-resolution imaging with a micro probe ■ Measurement possible for conductors, semiconductors, and insulators ■ Measurement can be conducted almost non-destructively with minimal contact pressure *For more details, please refer to the PDF document or feel free to contact us.

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  • Contract Analysis
  • Contract measurement
  • Other microscopes

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