AFM (Atomic Force Microscope)

High-resolution imaging with a micro probe! Achieving nano-level structural analysis.

Our company scans the sample surface with a micro probe to achieve nano-level structural analysis. In "shape measurement (tapping mode)," the probe, which is periodically vibrated, lightly taps the sample surface to measure its shape. Additionally, "phase imaging" maps the phase delay between the periodic signal that moves the cantilever and the cantilever's vibration, visualizing differences in physical properties that do not appear in the shape. 【Features】 ■ High-resolution imaging with a micro probe ■ Measurement possible for conductors, semiconductors, and insulators ■ Measurement can be conducted almost non-destructively with minimal contact pressure *For more details, please refer to the PDF document or feel free to contact us.

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