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AFM(ノイズ) - List of Manufacturers, Suppliers, Companies and Products

AFM Product List

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Ultra-high resolution, high-speed scanning AFM/SPM Cypher S

High precision, yet operation is surprisingly easy! The ideal AFM/SPM for measurements in both gas and liquid phases in the fields of materials science and life sciences.

Cypher S AFM/SPM (Atomic Force Microscope) demonstrates ultra-high resolution and high-speed performance! It achieves true atomic resolution in AC mode, which is also a testament to the ability to perform measurements with extremely low noise. There is no need to choose between the accuracy of closed-loop atomic resolution imaging and the low noise characteristics of open-loop; you can have both. The automatic laser alignment feature, SpotOn, is very user-friendly, eliminating the need for traditional manual operation. With a laser spot size of 3 μm, it enables high-speed AC imaging and low noise measurements using micro levers. The interchangeable modular design expands the options for applications and scanning modes. The built-in enclosure of the Cypher allows for thermal control and acoustic insulation, optimizing the stability of imaging and measurements, significantly improving thermal drift compared to conventional AFM/SPM. For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Microscope

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High-performance research AFM/SPM MFP-3D Origin+

Achieve accurate imaging, precision, and reproducibility! We offer high-performance research-grade AFM/SPM at an affordable price. All types of optional accessories are available.

The MFP-3D Origin+ offers high performance and a wide range of features at a competitive price compared to existing low-cost AFM/SPM systems. It is an extremely versatile research-grade high-performance AFM/SPM that can cater to various research fields. While it has the same core performance as the MFP-3D Origin, a significant feature is its support for all innovative accessories for the MFP-3D, making it a highly cost-effective model.

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200mm Large Sample Compatible AFM/SPM Jupiter XR

A large sample-compatible stage-type AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent resolution, speed, operability, and flexibility.

The Jupiter XR atomic force microscope is the industry's first large sample-compatible AFM/SPM that supports "ultra-high resolution," "high-speed imaging," and "wide-area scanning" with a single scanner without the need to change scanners. The sample stage allows access to the entire 200 mm sample area and inherits the excellent fundamental design and operability developed in the Cypher AFM (released in 2007), as well as the photothermal excitation 'blueDrive.' With its high level of balance, the Jupiter XR is the best choice for applications that require a variety of samples and applications in fields such as analytical science, industrial R&D, and academic research.

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Tabletop AFM

Electromagnetic scanner type (patented) allows for damage-free and non-destructive measurements at a low cost. It has functions equivalent to expensive AFM.

Even beginners can achieve accurate measurements! You can measure non-destructively just by setting the sample! There is a lineup ranging from handheld types to fully automatic measurements with cassettes. 【Product Features】 - Ultra-compact with a depth and width of 15cm, easy to carry anywhere - Evaluation and demo units available for loan. Rich measurement inspection track record - Achieves low cost while having functions comparable to expensive AFMs - By using an electromagnetic scanner (patented) for scanning, there is no need to move the substrate - Does not use piezo elements commonly used in AFMs, so there is no nonlinear creep or aging changes - Can measure without damage and non-destructively - AFM carbon nano-probes (high resolution, long lifespan) 【Software Applications】 - Fine line width measurement - Surface shape measurement of silicon and compound wafers - Surface inspection of quartz glass - Mask pattern measurement - Surface inspection and evaluation after polishing and CMP - Thin film step measurement, continuous and discontinuous measurement during film formation - Observation of magnetic fields in hard disks - Film surface inspection - High-precision surface analysis of metal molds - Evaluation of optical components and precision parts

  • Semiconductor inspection/test equipment

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MFP-3D-BIO: Optical Microscopy Integrated AFM/SPM for Biosciences

MFP-3D-BIO AFM: The only bio AFM/SPM seamlessly integrated with all optical technologies.

Perfect for bioscience research! With ultra-low noise characteristics and unprecedented precision, the level of AFM/SPM equipment for bioscience research has significantly improved!

  • Other microscopes

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