Image analysis solution
Leave all matters related to various programs using image analysis to us!
Our company develops programs for detecting fine circuit defects through image analysis, inspecting the appearance of mobile phones, measuring lengths, positioning, particle analysis, and more. We solve problems in a wide range of fields using various non-contact measurements, inspections, and analyses with image data, providing image analysis solutions that meet our customers' needs. [Development Examples] - Fine circuit defect detection - Mobile phone appearance inspection - Wear inspection of cutting edges - Measurement of tile position, warping, and length using three-dimensional images - Automatic inspection of surface scratches *For more details, please download the PDF or feel free to contact us.
- Company:カンダシステム
- Price:Other