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Our company develops programs for detecting fine circuit defects through image analysis, inspecting the appearance of mobile phones, measuring lengths, positioning, particle analysis, and more. We solve problems in a wide range of fields using various non-contact measurements, inspections, and analyses with image data, providing image analysis solutions that meet our customers' needs. [Development Examples] - Fine circuit defect detection - Mobile phone appearance inspection - Wear inspection of cutting edges - Measurement of tile position, warping, and length using three-dimensional images - Automatic inspection of surface scratches *For more details, please download the PDF or feel free to contact us.
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【Other Development Examples】 ■ Measurement of rust area on metal surfaces (color identification) ■ Automatic identification of blood collection tubes ■ Image stitching (tiling) ■ Focus stacking (depth compositing) ■ Three-dimensional measurement using digital cameras, etc. *For more details, please download the PDF or feel free to contact us.
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For more details, please download the PDF or feel free to contact us.
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Our company specializes in contract software development for inspection and measurement using image analysis. We offer "custom-made, high-performance, high-quality programs" at reasonable prices, so please feel free to contact us with your requests.
![[Data Science Case] Detection of Overhead Wire Anomalies Using Deep Learning](https://image.mono.ipros.com/public/product/image/b67/2000962718/IPROS60334617240278032070.png?w=280&h=280)
