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Probe×インクス - List of Manufacturers, Suppliers, Companies and Products

Probe Product List

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"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

From narrow pitch measurements of 0.05 mm to high current power semiconductors.

The stacked probe, being a single part, has no structural conductive loss, allowing for direct measurement of current values and achieving stable contact resistance values. Additionally, it can accommodate a minimum pitch of 0.05 mm, enabling Kelvin measurements using narrow pitches and ensuring stable measurements. The excellent characteristics of the stacked probe not only allow for the arrangement of probes in narrow pitches but also demonstrate performance as a probe for power semiconductors that apply large currents. 【Features】 ■ Stable contact resistance values provide powerful precision measurements. ■ Capable of handling large currents and high voltages, contributing to application and measurement for power semiconductors. ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch). ■ Adjustable contact load. 【Examples】 ◎ Contacting in narrow pitches and multiple points. ◎ Ensures reliable contact with BGA for stable Kelvin measurements. ◎ Provides stable contact with lead frames of solder plating. ◎ Suitable for narrow spaces (for LED inspection equipment). *You can view examples from the PDF. Please feel free to contact us for more details.

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Special Probe "Sure Turn Probe"

Special Probe "Sure Turn Probe"

Solve issues such as variations in resistance values!

This is an original probe that utilizes innovative technology. Conventional general straight probes have a simple internal structure, which often leads to significant variations in resistance values during circuit measurements on printed circuit boards, and sometimes even causes momentary disconnections. It is said to be one of the causes of frequent troubles during tens of thousands or hundreds of thousands of tests. The SureTurn probe is a product developed to address this issue. *For more details, please download the PDF or contact us.

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Special Probe "Zebra Type Probe"

Special Probe "Zebra Type Probe"

Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!

This is an original probe that utilizes innovative technology. With the increase in signal capacity of electronic devices, it has become difficult to measure using conventional methods. By challenging this limitation and conducting extensive research, we have succeeded in bringing this product to market. Previously, when inspection jigs deteriorated or broke, they had to be disassembled and repaired. However, the zebra-type probe allows for easy extraction and replacement of the probe without disassembling fixtures, and it is a groundbreaking simple probe that enables 20GHz measurements for high-capacity signal devices. *For more details, please download the PDF or contact us.*

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Layered probe "High current, multi-point layered probe (patented technology)"

Layered probe "High current, multi-point layered probe (patented technology)"

As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.

This is a probe developed with innovative technology, featuring excellent characteristics. We have developed a multi-point laminated probe specifically for power semiconductors, applying the characteristics of a laminated structure consisting of metal plates (probes) and insulators. 【Features】 - The probe tip is shaped like a wave, allowing contact with the semiconductor at multiple points. This disperses the amount of current and voltage applied, reducing the burden on the semiconductor. - It can move vertically by about 1 millimeter, minimizing contact marks. - Its compact design makes it easy to secure installation space. *For more details, please download the PDF or contact us.

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High-frequency (millimeter wave) probe "coaxial shield probe"

High-frequency (millimeter wave) probe "coaxial shield probe"

For partial electrode support such as probe cards!

We offer probes designed with consideration for the conditions of high-frequency measurements, enabling highly accurate measurements. With the increasing circuit density of semiconductor devices, there is particularly growing demand for high-frequency measurements in the MHz range. They are said to be suitable for partial electrode applications such as probe cards and are widely used, with orders now being placed in various fields, including medical applications. *For more details, please download the PDF or contact us.*

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High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

It is possible to reduce high-frequency loss and direct current resistance values!

We provide a probe designed with considerations for high-frequency measurement conditions, allowing for high-precision measurements. This probe is a developed product that facilitates inspection with unprecedented small pitch intervals for high-frequency measurements. It can reduce high-frequency loss and DC resistance values, and the impedance can also be set as needed. *For more details, please download the PDF or contact us.*

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Sensitive Probe (Series 16-300) *CAD data available

Sensitive Probe (Series 16-300) *CAD data available

A unique structure of a sensitive probe that supports high-precision measurement!

High-precision measurement compatible! A rich lineup of sensitive probes! This catalog features the unique structure of the "Sensitive Probe Series" designed for high-precision measurements. The coil spring is made of piano wire with gold plating, providing stable load and excellent durability, and is designed to apply moderate force to the tip of the plunger, ensuring the necessary contact force between the barrel inner wall and the plunger. Additionally, the resistance stabilizer (metal ball) is made of steel with gold plating, which, when pressure is applied to the plunger, adheres to the barrel inner wall, allowing current to flow through the barrel instead of the coil spring, resulting in stable contact resistance. [Contents] ■ Series 16 ■ Series 20 ■ Series 30 ■ Series 48 ■ Series 48A, etc. *For more details, please download the PDF or feel free to contact us.

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Unique structure of a sensitive probe compatible with high-precision measurement.

Unique structure of a sensitive probe compatible with high-precision measurement.

With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!

Introducing the unique structure of a sensitive probe that supports high-precision measurements of inks. At Inks, we have developed a proprietary internal structure that employs a resistance stabilizer (metal pole) to achieve low and stable resistance values. Furthermore, by applying gold plating with excellent conductivity to the plunger, we can achieve an even lower and more stable resistance value, reaching an ideal state. 【Features】 ■ Coil Spring - Stable load and excellent durability - Designed to provide the necessary contact force between the barrel inner wall and the plunger - Excellent heat resistance, maintaining stable spring pressure even at high temperatures ■ Resistance Stabilizer - Achieves stable contact resistance - Minimizes the influence of inductance from the coil spring ■ Plunger - Designed to stabilize internal contact resistance - Various tip shapes are available ■ Barrel - Made from materials with excellent conductivity - Prevents material changes due to corrosion and other factors *For more details, please refer to the external link page or feel free to contact us.

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Comparison of contact resistance values of sensitive probes with other companies.

Comparison of contact resistance values of sensitive probes with other companies.

We are introducing a comparison of contact resistance values between our products and overseas products from other companies.

Introduction to the comparison test of contact resistance values between Inks' IP130B-2C probe and probes from other manufacturers. The test conditions used the JCM GP035-50R contact resistance measurement device for both the IP probe and the other (overseas) probes, with an applied current of 5A and an application time of 0.1 seconds. The insertion depth was 5.2mm for the IP probe and 4.3mm for the other (overseas) probes. As a result, the IP probe exhibited a more stable contact resistance value within a narrower range. The average value was also lower, indicating very good performance. [Test Results (Partial)] ■ Contact Resistance Values (mΩ) *Measured 3000 times 　・IP Probe (Sample 1) 　　　Max: 11.6 　　　Min: 8.6 　　　Ave: 9.4 　・Other Manufacturer's Probe (Sample 1) 　　　Max: 200.4 　　　Min: 15.7 　　　Ave: 92.7 *For more details, please refer to the external link page or feel free to contact us.

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Layered probe with stable contact resistance value.

Layered probe with stable contact resistance value.

A probe capable of achieving a stable contact resistance value according to the shape of the target object.

The "laminated probe" has been developed with innovative technology and possesses excellent features. Unlike conventional spring probes, which consist of multiple parts, it achieves a structurally stable contact resistance value through contact with a single metal plate. Even when the inspected object is not smooth, the spring properties of each probe allow it to conform to the shape of the object, enabling a stable contact resistance value. 【Features】 ■ Wiping action occurs due to the structure ■ Contact position is displaced ■ Contact can be made while removing oxide films and foreign substances from the object ■ Stable contact can be achieved *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Support for narrow pitch in stacked probes

Support for narrow pitch in stacked probes

It is possible to accommodate Kelvin measurements in a narrow range by utilizing a narrow pitch!

We would like to introduce our company's "stacked probes" and their compatibility with narrow pitch applications. The "stacked probes" can handle stable resistance values, high voltage, and current. Furthermore, they can make contacts at a minimum pitch of 0.05mm with closely arranged contacts, semiconductor lead parts, and connector contacts, enabling narrow pitch compatibility that was not achievable with conventional spring probes. 【Features】 ■ Stable resistance values, high voltage, and current compatibility ■ Contact possible at a minimum pitch of 0.05mm ■ Compatible with Kelvin measurements ■ Two-terminal measurements for each measurement point *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Stable contact with BGA.

Stable contact with BGA.

Introducing examples of layered probes. Coating applied to the probe tip achieves extended lifespan.

We would like to introduce stable contact for BGA "laminated probes" handled by our company. For spherical BGA (solder), contact using needle-type probes, including spring probes, has resulted in slippage, making stable contact difficult. By using laminated probes for Kelvin contact, we achieve stable contact. Additionally, since BGA primarily consists of tin, applying a coating to the probe tip that suppresses tin transfer can also extend its lifespan. 【Features of Laminated Probes】 ■ Stable contact resistance values ■ Effective for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

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Q&A on Layered Probes

Q&A on Layered Probes

We will answer five representative questions about layered probes.

In this document, we will introduce questions regarding the "stacked probe" of the probe business handled by Inks Corporation. Q: Is non-magnetic compatibility possible? A: Yes, it is possible. The probe is made of non-magnetic beryllium copper, and the holder that holds the probe can also be made of non-magnetic materials such as aluminum or resin. Additionally, we have experience with contacts to magnetic sensor packages. We have answered five questions, including the following: - Is non-magnetic compatibility possible? - Can it be used in the previous process (wafer inspection)? - I would like to install it on the machine I am currently using; is that possible? - How should maintenance be performed? - What would the estimated schedule be until delivery? *For more details, please refer to the PDF document or feel free to contact us.

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Layered Probe: Response to High Current and High Temperature

Layered Probe: Response to High Current and High Temperature

We have a track record of producing laminated probes compatible with 2000A! Introducing our solutions for handling high current and high temperatures.

The "laminated probe" does not use coil springs and instead utilizes the characteristics of leaf springs for contact, making it resistant to degradation of spring properties due to heat. The insulating film (polyimide) also has a heat resistance rating of 300°C for regular use and long-term heat resistance. It can accommodate measurement environments at high temperatures, allowing contact with power semiconductors including SiC. 【Features】 ■ Utilizes the characteristics of leaf springs ■ Resistant to degradation of spring properties due to heat ■ Can accommodate measurement environments at high temperatures ■ Allows contact with power semiconductors including SiC *For more details, please refer to the PDF document or feel free to contact us.

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High-frequency (millimeter wave) probe "Precision ultra-short probe"

High-frequency (millimeter wave) probe "Precision ultra-short probe"

Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!

We provide probes designed with consideration for the conditions of high-frequency measurement, allowing for highly accurate measurements. The measurable frequency range is 7GHz, suitable for 50Ω lines on high-frequency substrates. *For more details, please download the PDF or contact us.*

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