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Probe×理化電子 - List of Manufacturers, Suppliers, Companies and Products

Probe Product List

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Short probe

Consolidating decades of technology developed with contact probes for semiconductor testing!

Consolidating decades of technology developed with contact probes for semiconductor testing! Short Probes 【Features】 ○ Quickly responds to fine pitch and high-speed testing environments ○ High-performance short probes highly rated by users worldwide ○ Easy customization ○ Main types ・Short probes for 1.0mm pitch ・Short probes for 0.8mm pitch ・Short probes for 0.65mm pitch ・Short probes for 0.5mm pitch ・Short probes for 0.4mm pitch ・Ultra-short short probes *Other types are also available. Please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

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Kelvin Probe "RI-020ZC-01"

The horseshoe-shaped tip design ensures more reliable contact! Contact probe for Kelvin measurements.

The "RI-020ZC-01" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. It is suitable for measuring BGA packages with a 0.4mm pitch matrix and QFP packages with a 0.3mm pitch. Additionally, we also offer the 4-point type "RI-020ZC-02." 【Materials】 ■A Plunger: SK / Au-Plated ■Barrel: PB / Au Lined ■Spring: SWP / Au-Plated ■B Plunger: SK / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

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Dragon Probe 'RI-030II-28-WKG'

Introducing the Dragon Probe series, capable of withstanding high-temperature environments up to 200℃!

The "RI-030II-28-WKG" is a probe with excellent high-temperature characteristics. It is suitable for high-temperature environments up to 200°C. In addition, to meet the high heat resistance temperature requirements of probes in reliability testing, we currently offer the HOTPIN that supports up to 175°C. 【Material】 ■A Plunger: BeCu / K3-Gold ■Barrel: Ni / Inner Au ■Spring: SUS / Au-Plated ■B Plunger: BeCu / K3-Gold *For more details, please refer to the PDF document or feel free to contact us.

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Probe "RI-030LI-33-A2"

Compatible with various types of sockets! A probe that allows you to choose the tip shape according to your application.

The "RI-030LI-33-A2" is a standard design probe suitable for 0.4mm and 0.5mm pitch. It is versatile and can be used with various types of sockets. Additionally, you can choose from three different tip shapes according to your application. 【Material】 ■A Plunger: BeCu / Au-Plated ■Barrel: PB / Au-Plated ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

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Kelvin Probe "RI-035ZI-01-WKG"

Introducing a probe for Kelvin measurement that can withstand high-temperature environments up to 170℃!

The "RI-035ZI-01-WKG" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. Additionally, this product is suitable for high-temperature environments up to 170°C and has a 2A CCC characteristic. We also offer a 4-point type, the "RI-035ZI-02-WKG." 【Materials】 ■A Plunger: SK / K3 Gold ■Barrel: NS / Au-Plated ■Spring: SUS / Au-Plated ■B Plunger: SK / K3 Gold *For more details, please refer to the PDF document or feel free to contact us.

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[For those in the semiconductor and electronic equipment industry] Product catalog for short probes and other items.

We will introduce product information by genre for various precision tools and fixtures used in semiconductor manufacturing, as well as individual product specifications.

This catalog features probes and other products handled by Rika Electronics. It includes a lineup of products designed primarily for inspecting semiconductor packages, such as the "short probe," as well as "IC sockets" that achieve a short conduction length with low-resistance contacts. You can choose according to your application. [Featured Products] ■ Short Probes ■ IC Sockets ■ Probe Guards for WLCSP ■ Test Fixtures ■ RDK Bonding Tools *For more details, please refer to the PDF document or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

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Fine Pitch Probe "RI-010HA-05-PDH"

Introducing fine pitch probes for wafer inspection compatible with a 0.15mm pitch!

The "RI-010HA-05-PDH" is a fine pitch probe for wafer inspection. It is compatible with a 0.15mm pitch and is suitable for vertical inspection. Multiple options are available for the plunger material as well. In addition, we offer a wide range of special probes for high-frequency applications, high-temperature applications, and Kelvin applications. 【Materials】 ■A Plunger: Pd Alloy ■Barrel: Ni / Inner Au ■Spring: SWP / Au-Plated ■B Plunger: SK / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

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Probe "RI-028LA-03-A2"

We also have a round conical type available! A probe with a frequency characteristic of 41.5GHz.

The "RI-028LA-03-A2" is a probe with excellent high-frequency characteristics. It has a frequency characteristic of 41.5GHz. Additionally, it can accommodate multiple materials for the plunger. We also offer the round conical type "RI-028IA-01-A2." 【Materials】 ■A Plunger: BeCu / Au-Plated ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

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Fine Pitch Probe 'RI-A90HA-01-PDH'

Introducing fine pitch probes for wafer inspection compatible with a 0.13mm pitch!

The "RI-A90HA-01-PDH" is a fine-pitch probe for wafer inspection. It is compatible with a pitch of 0.13mm and is suitable for vertical inspection. In addition, we offer a variety of special probes for high-frequency applications, high-temperature applications, and Kelvin applications. 【Materials】 ■A Plunger: Pd Alloy ■Barrel: Ni / Inner Au ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

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