Ultra-high-speed spectral measurement device Spectrometer DTSP-150
Compact with low noise! Back-illuminated Peltier cooling FFT-CCD used.
A spectrometer is a device that separates light into a spectrum (light by wavelength) and measures the intensity of light at each wavelength. By shining light on thin films and spectrally analyzing the reflected light, the components of the thin films can be measured. Applications include thickness management of films on various discs, measurement of resist films and SiO on semiconductor wafers, management of coating thickness on optical lenses, thickness measurement of various films, inline measurement of alignment films and ITO films on glass substrates, and color measurement of LEDs. There are also established achievements in constructing multi-channel systems for inline use. For more details, please contact us.
- Company：ディスク・テック 本社
- Price：Other
