Wafer sort probe card
Semiconductor Test Architects
SOC IC Test, LCD Driver IC Test, Memory IC Test
- Company：STAr Technologies, Inc. STAr Technologies, Inc.
- Price：Other
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Parametric probe card
Semiconductor Test Architects
Semiconductor Parametric Test, Reliability Test, Multi-Site/Die Test
- Company：STAr Technologies, Inc. STAr Technologies, Inc.
- Price：Other
