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probe Product List and Ranking from 153 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. Sankotsusho Tokyo//Industrial Electrical Equipment
  3. テクノプローブ Chiba//Testing, Analysis and Measurement
  4. 4 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
  5. 5 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社 Tokyo//Testing, Analysis and Measurement
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probe Product ranking

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  4. 4 Capacitive Moisture Meter Probe M Series 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社
  5. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

probe Product List

541～570 item / All 719 items

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Techno Electronics Co., Ltd. Business Introduction

Techno Electronics Co., Ltd. Business Introduction

Building advanced systems for eddy current testing and ultrasonic testing with robust foundational technologies and networks!

Techno Denshi Co., Ltd. is an advanced non-destructive testing system supplier that primarily focuses on the development and manufacturing of eddy current testing (ECT) and ultrasonic testing (UT) probes, addressing various needs related to non-destructive testing. Additionally, to ensure that user companies can effectively utilize the technologies and systems developed by incorporating advanced technologies from around the world, we also provide technical advice, demonstrations, training, and analytical evaluations. 【Business Activities】 ■ Manufacturing and sales of eddy current and ultrasonic testing probes, as well as various testing system equipment ■ Maintenance services related to testing equipment and non-destructive testing devices ■ Manufacturing, sales, and maintenance services related to electronic control equipment ■ Import and sales of testing equipment and non-destructive testing devices, as well as domestic agency operations ■ On-site non-destructive testing support services, etc. *For more details, please download the PDF or feel free to contact us.

  • Defect Inspection Equipment
  • probe

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Wireless wind speed and temperature probe with built-in L-shaped flexible extension rod.

Wireless wind speed and temperature probe with built-in L-shaped flexible extension rod.

Easily measure wind speed, wind volume, and temperature wirelessly. It connects via Bluetooth and is compatible with various apps.

This product is a wireless wind speed and temperature probe that incorporates a telescopic extension rod that bends into an L shape, allowing for measurements up to a ceiling height of 2700mm on its own. The φ9mm probe with scale markings is suitable for confirming insertion depth during duct measurements. Additionally, a dedicated app, which can be downloaded for free, is required for measurements. 【Features】 ■ Measurement range: Wind speed 0–30m/s, Temperature -20–70℃ (Measurement principle: thermal) ■ The dedicated app allows for airflow calculations and continuous data storage ■ Incorporates a telescopic extension rod that bends into an L shape, enabling easy measurements up to a ceiling height of 2700mm with just the probe ■ The φ9mm probe with scale markings is suitable for confirming insertion depth during duct measurements *For more details, please refer to the related links or feel free to contact us.

  • Wind Speed/Volume Meter
  • probe

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Test socket "W-CSP"

Test socket "W-CSP"

This is a test socket using a coaxial type four-terminal contact probe!

The "W-CSP" is a testing socket that allows for manual measurements using a coaxial four-terminal contact probe (PATENT) after dicing chips from a wafer. It can be used for chip development, sampling inspections, and failure analysis. The socket cover is detachable and can also be used for automatic machine (handler-type) testing. 【Features】 ■ Capable of functional verification testing for BGA, LGA, and bare chips ■ Capable of measuring the on-resistance of MOS-FETs ■ Capable of measuring voltage between terminals *For more details, please download the PDF or feel free to contact us.

  • socket
  • probe

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Eddyfi Technologies Phased Array Probe

Eddyfi Technologies Phased Array Probe

Eddyfi manufactured probes support all ultrasonic inspections.

Eddyfi Technologies is committed to revolutionizing non-destructive testing (NDT) across various industries, including aerospace, oil and gas, mining, and power generation. We provide comprehensive phased array ultrasonic testing (PAUT) solutions tailored to the precise needs of applications, with a focus on ensuring the safety of critical equipment. Our cutting-edge equipment, software, scanners, crawlers, and advanced probes deliver dynamic inspection solutions. Our phased array ultrasonic transducers are designed with detailed probe design parameters in mind, aiming to further enhance non-destructive testing methods and address individual inspection requirements in various product inspections and equipment maintenance.

  • Other measurement, recording and measuring instruments
  • probe

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Eddyfi Technologies ECT Probe for Small Tube Inspection

Eddyfi Technologies ECT Probe for Small Tube Inspection

Global leader in eddy current testing, ECT probe for tube inspection by Eddyfi Technologies.

Non-destructive testing (NDT) of critical components is an essential technology for health and safety management in industries such as power generation, including nuclear, oil and gas, and aerospace. With world-class engineering, rapid production capabilities, and advanced inspection technology as our background, we provide our customers with advanced electromagnetic application inspection hardware and software that offer the highest performance and reliability, which are indispensable to their businesses.

  • Flaw detection testing
  • probe

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Contact Probe Comprehensive Catalog

Contact Probe Comprehensive Catalog

A wide variety of highly rated contact probes from around the world! Over 3,000 types available!

This catalog is the product catalog of Nippon Denshin Co., Ltd., which has contributed to the development of the electronics industry, including contact probes, through years of experience, achievements, and a wealth of accumulated technology. We offer over 3,000 original types in various stock, so please choose products that meet your needs from our wide variety. 【Contents】 ■ND100 ■ND075 ■ND050 ■Wire Probes ■C-0.26, etc. *For details, please request materials or view the PDF data available for download.

  • Processing Jig
  • probe
  • probe

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In-Circuit Tester Probe "ND100 Series"

In-Circuit Tester Probe "ND100 Series"

Introducing contact probes compatible with a 2.54mm pitch, highly regarded worldwide!

At Nippon Denshin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" provide highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The "ND100 series" is a probe for in-circuit testers compatible with a 2.54mm pitch. 【Features】 ■ Compatible with 2.54mm pitch ■ 21 types of tip shapes ■ Thorough quality control ■ Achieves stable high quality, low prices, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • Processing Jig
  • probe
  • probe

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In-circuit tester probe "ND075 Series"

In-circuit tester probe "ND075 Series"

Introducing contact probes compatible with a 1.91mm pitch, highly rated worldwide!

At Nippon Denshin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by many years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'ND075 series' is a probe for in-circuit testers compatible with a 1.91mm pitch. 【Features】 ■ Compatible with 1.91mm pitch ■ 20 types of tip shapes ■ Thorough quality control ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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In-circuit tester probe "ND050 Series"

In-circuit tester probe "ND050 Series"

Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!

At Nippon Denshin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The "ND050 series" is a probe for in-circuit testers compatible with a 1.27mm pitch. 【Features】 ■ Compatible with 1.27mm pitch ■ 6 types of tip shapes ■ Thorough quality control ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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Wire Probe for Bear Board Tester

Wire Probe for Bear Board Tester

Probes for bare board testers that can accommodate fine pitches! Achieves excellent durability due to its simple mechanism!

At Nippon Denpin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. The "Wire Probe" is a probe for bare board testers that strokes through bending. Due to its lack of complex mechanisms, it can accommodate fine pitches and has excellent durability. It is available both as a standalone wire probe and as a complete set with fixtures. 【Features】 ■ Strokes through bending ■ Can accommodate fine pitches due to the lack of complex mechanisms ■ Excellent durability ■ Available as a standalone wire probe or as a complete set with fixtures ■ Tip shapes: standard type and two optional types *For more details, please request materials or view the PDF data from the download section.

  • Processing Jig
  • probe
  • probe

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Probe for Bear Board Tester "C-0.26 Series"

Probe for Bear Board Tester "C-0.26 Series"

Introducing contact probes compatible with a 0.5mm pitch, highly regarded worldwide!

At Nippon Denshin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN's contact probes" supply highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-0.26 series' is a probe for bare board testers compatible with a 0.5mm pitch. [Features] - Compatible with 0.5mm pitch - Three types of tip shapes - Lead wire processing for sockets is also possible - Achieves stable high quality, low price, and short delivery times - Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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Probe for Bear Board Tester "C-0.31 Series"

Probe for Bear Board Tester "C-0.31 Series"

Introducing contact probes compatible with a 0.6mm pitch, highly regarded worldwide!

At Nippon Denshin, we primarily manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-0.31 series' is a probe for bare board testers compatible with a 0.6mm pitch. 【Features】 ■ Compatible with 0.6mm pitch ■ Five types of tip shapes ■ Lead wire processing for sockets is also possible ■ Achieves stable high quality, low price, and short delivery times ■ Accommodates various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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Probe for Bear Board Tester "C-04 Series"

Probe for Bear Board Tester "C-04 Series"

Introducing contact probes compatible with a 1mm pitch! Highly rated worldwide.

At Nippon Denshin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-04 series' is a probe for bare board testers compatible with a 1mm pitch. 【Features】 ■ Compatible with 1mm pitch ■ 8 types of tip shapes ■ Lead wire processing for sockets is also possible ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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Probe for Bear Board Tester "C-05 Series"

Probe for Bear Board Tester "C-05 Series"

Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!

At Nippon Denshin, we primarily manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by many years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-05 series' is a probe for bare board testers compatible with a 1.27mm pitch. 【Features】 ■ Compatible with 1.27mm pitch ■ Five types of tip shapes ■ Thorough quality control ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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Inspection fixtures made by probe manufacturers

Inspection fixtures made by probe manufacturers

A wide variety of probes in stock! Leave the selection of probes to us!

Our company offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types. Since we design in-house, we can also manufacture components, allowing us to meet customer requests in a short delivery time. As a probe manufacturer, we have many inspection fixtures that we can create, so please feel free to consult with us. 【Features】 ■ Low price ■ Support for small quantities of probes ■ Short delivery time with in-house design ■ Components can also be manufactured in-house *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Inspection fixture
  • Processing Jig
  • probe

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In-circuit tester probe "ND050S series"

In-circuit tester probe "ND050S series"

Introducing probes suitable for connectors and interfaces with a 1.27mm pitch!

The "ND050S series" is a short and narrow pitch probe. The recommended stroke for spring pressure is 1.1mm. There are two types of tip shapes available: "E1" and "P1." Additionally, it is designed to be robust, making it suitable for connectors and interfaces. 【Features】 ■ Short length ■ Narrow pitch ■ Robustness *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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High Current Probe "HC1 Series"

High Current Probe "HC1 Series"

Easy management of hole diameter! Introducing a high-current probe with a constant phase current of 20A.

The "HC1 Series" is a high-current probe equipped with a press ring, making hole diameter management easy. It is made from beryllium copper with a specially treated low contact resistance plunger. This product is pre-assembled and can be pressed directly into the board. 【Features】 ■ Constant phase rated current 20A ■ Made from beryllium copper with a specially treated low contact resistance plunger ■ Equipped with a press ring for easy hole diameter management ■ Pre-assembled and can be pressed directly into the board *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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New Switch Pin "ND-SW Series"

New Switch Pin "ND-SW Series"

A switch pin with a single internal contact that significantly improves durability.

The "ND-SW Series" is one of our features, incorporating the know-how of integrated probes that have been used by many customers over the years, into a switch pin. We offer the "ND-SW-2.4 (φ3.0 POM)" and its corresponding socket, which allows the rear end to move when the tip strokes. Additionally, since there is only one internal contact, it excels in durability and cost performance. 【Features】 ■ Incorporates know-how of integrated probes ■ Only one internal contact ■ Excellent durability and cost performance *For more details, please refer to the PDF document or feel free to contact us.

  • switch
  • probe

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Hot-wire anemometer smart probe 'testo405i' [Rental]

Hot-wire anemometer smart probe 'testo405i' [Rental]

A wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication.

The testo 405i is a thermal wire anemometer smart probe that can measure wind speed, wind temperature, and air volume. It is compact and highly portable, and the measurements can be checked on a smartphone or tablet via Bluetooth communication. Additionally, specialized analysis results can be easily obtained through calculation and display functions provided by a dedicated app. 【Features】 ■ Displays measurement values on Android/iOS devices (smartphones and tablets) ■ Connects up to 6 probes to a single device for simultaneous measurements ■ Capable of graphing, saving (Android only), and emailing measurement data ■ Duct information can be set in air volume calculation mode ■ The dedicated app can be downloaded from Google Play and the App Store (free) ■ Wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication ■ The rod with a scale indicating insertion length is up to 400mm long, can be bent 180°, and allows measurements at any angle.

  • Wind Speed/Volume Meter
  • probe

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Probe 'Fe-0.6Pen' for film thickness gauge SWT [Rental]

Probe 'Fe-0.6Pen' for film thickness gauge SWT [Rental]

This is an electromagnetic probe for SWT-8000-2, 9000, and 8200-2. It is used for measuring paint thickness in narrow areas and small parts.

■Measurement range: 0 to 600μm

  • Coating thickness gauge
  • probe

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Thickness gauge SWT with eddy current probe for thick materials 'NFe-8' [Rental]

Thickness gauge SWT with eddy current probe for thick materials 'NFe-8' [Rental]

This is an eddy current probe for SWT-8000-2, 9000, and 8200-2.

Measurement range: 0 to 8mm

  • Coating thickness gauge
  • probe

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High-frequency (millimeter wave) probe "Precision ultra-short probe"

High-frequency (millimeter wave) probe "Precision ultra-short probe"

Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!

We provide probes designed with consideration for the conditions of high-frequency measurement, allowing for highly accurate measurements. The measurable frequency range is 7GHz, suitable for 50Ω lines on high-frequency substrates. *For more details, please download the PDF or contact us.*

  • probe
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Inks Co., Ltd. Business Introduction

Inks Co., Ltd. Business Introduction

Providing precision probes, precision parts, and precision models (such as desktopZERO).

Inks Corporation provides precision probes, precision parts, and precision models (such as desktopZERO). In the probe business, we achieve high performance through innovative technology with spring probes, high-frequency probes, and stacked probes. To pursue high performance, we do not use automated machines and manufacture by hand. In our product business, we incorporate the foundational press technology with the experience, knowledge, and know-how cultivated in the consumer business to solve our customers' problems. 【Business Overview】 ■ Probe Business: Design, prototyping, mass production, and sales of precision probes ■ Product Business: Design, prototyping, mass production, and sales of precision parts ■ Consumer Business: Planning, design, production, and sales of consumer products *For more details, please refer to the PDF materials or feel free to contact us.

  • probe
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Features of layered probes

Features of layered probes

Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.

We would like to introduce the features of the Inks' layered probe. The semi-layered probe contacts with a single metal plate, allowing for measurements with structurally stable contact resistance. Additionally, it is resistant to degradation of spring properties due to heat, making it suitable for measuring power semiconductors that apply high current and high voltage. It can make contact with points arranged in narrow pitches, such as semiconductor lead parts and connector contacts, up to a maximum pitch of 0.05. Furthermore, by varying the shape of the probe body and the thickness of the auxiliary V-shaped leaf spring, it is possible to adjust the load from high to low continuously. 【Features】 ■ Stable contact resistance value (demonstrates power in precise measurements) ■ Supports high current and high voltage (contributes to application and measurement of power semiconductors) ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch) ■ Adjustable contact load (contact tailored to the characteristics of the measured object) *For more details, please refer to the external link page or feel free to contact us.

  • probe
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Explained in a video! The mechanism of layered probes [Free case study provided]

Explained in a video! The mechanism of layered probes [Free case study provided]

A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!

In today's world of miniaturization, are you facing difficulties with measurements using conventional probes? With Inks' "Stacked Probes," we can make contact with a single metal plate, allowing us to accommodate a minimum pitch of 0.05 mm. On this page, we present a video showcasing our "Stacked Probes" in action. Please take a look. 【Features】 ■ Stable contact resistance values ■ Supports high current and high voltage ■ Compatible with narrow pitches ■ Adjustable contact load, etc. *For more details, please download the PDF or contact us.

  • probe
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Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

【Layered Probe Brochure Giveaway】Compatible with high current and high temperature. Achieving stable contact resistance values!

The "Layered Probe Brochure" introduces the excellent features of layered probes in comparison to conventional spring probes. Are you facing issues such as "unstable contact resistance," "looking for probes that can handle narrow pitches," "wanting to measure under high current and high temperature," or "seeking probes with superior durability"? With Inks' "Layered Probes," these problems can be resolved! 【Contents】 ■ Structure of Layered Probes ■ Features of Layered Probes ■ Layered Probes Q&A, etc. *For more details, please download the PDF or contact us.

  • probe
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[Example] Stable contact of the stacked probe

[Example] Stable contact of the stacked probe

Introduction to stable contact with the package lead.

The wiping effect of the "stacked probe" removes the oxide film while making contact, achieving stable contact. Additionally, a coating that suppresses tin transfer has been applied to the probe tip, resulting in increased longevity. For magnetic sensor packages, it is also possible to construct the probe unit using only non-magnetic materials. In this case, stable contact was achieved with 2 million cycles of no maintenance. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
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[Example] Contact at narrow pitch and multiple points with a stacked probe.

[Example] Contact at narrow pitch and multiple points with a stacked probe.

Contributing to reduced inspection time and improved production through simultaneous multi-point contact.

We would like to introduce the narrow pitch and multi-point contact of the "stacked probe" that we handle. By stacking 50 probes with a thickness of 0.1mm in a fan shape at a 0.2mm pitch, we have achieved simultaneous contact at 50 points. This has led to a reduction in inspection time and contributed to increased productivity. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
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[Example] Probe design tailored to existing equipment (narrow space)

[Example] Probe design tailored to existing equipment (narrow space)

Designed probes to fit within limited space, contributing to cost reduction.

We would like to introduce the probe design (for narrow spaces) tailored to the existing equipment for our "stacked probes." In this case, we used a probe for LED inspection. Since we can design the probe to fit into the limited space of existing equipment, there is no need to purchase new equipment, contributing to cost reduction. 【Features of Stacked Probes】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • probe

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Durability of layered probes

Durability of layered probes

Contributed to improved productivity and cost reduction with 1 million to 10 million contact achievements.

The "laminated probe" is made of a single-piece leaf spring structure, which eliminates issues such as component interference from multiple parts, resulting in exceptional durability. When the contact target is tin (Sn), applying a conductive coating to the tip of the probe suppresses tin transfer, enabling stable inspection. Additionally, due to its high sliding properties and very hard membrane, it excels in wear resistance and durability. As a result, the probe is expected to have a longer lifespan. 【Expected Effects】 ■ Prolonged lifespan of the probe ■ Improved test yield ■ Reduced re-inspection ■ Decreased cleaning and maintenance tasks ■ Increased operational rate of evaluation equipment *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • probe

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