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probe Product List and Ranking from 153 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. Sankotsusho Tokyo//Industrial Electrical Equipment
  3. テクノプローブ Chiba//Testing, Analysis and Measurement
  4. 4 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
  5. 5 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社 Tokyo//Testing, Analysis and Measurement
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probe Product ranking

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  4. 4 Capacitive Moisture Meter Probe M Series 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社
  5. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

probe Product List

571～600 item / All 719 items

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ATR fiber probe

ATR fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The FlexiSpec series is the latest generation of products for total reflection measurement methods. This near-infrared and mid-infrared fiber ATR probe can be used with all types of FTNIR, FTIR, and other infrared spectrometers, spectrophotometers, as well as sensors for infrared LEDs or quantum cascade lasers. The patent-pending ATR immersion optical fiber probe is ideal for reaction monitoring in laboratories, pilot plants, and fully automated process control.

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Wavelength 1.1-17μm - Harsh environment compatible ATR optical fiber probe

Wavelength 1.1-17μm - Harsh environment compatible ATR optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The ATR fiber optic probe for harsh environments can be used in process spectroscopy to monitor inline reactions over a wide temperature range from -100°C to +250°C, as well as in the near-infrared and mid-infrared ranges. It can also withstand pressures of up to 200 Bar and is suitable for use with FTIR or other infrared spectrometers and automatic process control spectral sensors.

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Wavelength 1.1-17μm, low-cost, lab-use ATR fiber optic probe

Wavelength 1.1-17μm, low-cost, lab-use ATR fiber optic probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The new design of the PEEK shaft infrared fiber ATR probe is a cost-effective perfect solution for applications in small reactors in the lab. All FlexiSpec ATR probes are compatible with any type of FTIR, other infrared spectrometers, spectrophotometers, and sensors.

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Wavelength 405-1064nm; Raman fiber optic probe

Wavelength 405-1064nm; Raman fiber optic probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) FlexiSpec is a high-sensitivity Raman fiber probe that can be used in combination with any Raman spectrometer. There are two options regarding wavelength: one is for multi-wavelength excitation in the range of 630–785 nm, and the other is for single-wavelength excitation at 532/785 nm. These probes have a design with branched fibers, connecting one to the laser and the other to the spectrometer. They enable the analysis of fingerprint region spectra (FP, 800-1800 cm-1) and high-wavenumber spectra (HWVN, 2800-3800 cm-1). The FlexiSpec Raman fiber probe is compatible with interfaces for reaction monitoring in laboratories and pilot plants, as well as for implementing automated process control.

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Wavelength 0.2-2.2μm · TransFlex optical fiber probe

Wavelength 0.2-2.2μm · TransFlex optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) FlexiSpec is the latest generation of transmission fiber TransFlexion (dual pass) probes that can be used with any spectrometer or photometer. The TransFlexion Dual Pass fiber probe is compatible with interfaces for reaction monitoring and automated process control in laboratories and pilot plants, allowing for seamless use.

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Mid-infrared + visible light simultaneous measurement - custom ATR fiber probe

Mid-infrared + visible light simultaneous measurement - custom ATR fiber probe

It is a probe that can simultaneously measure two wavelength ranges.

Manufacturer: art photonics (Germany) art photonics has developed a multi-spectral optical fiber probe that enables simultaneous analysis of multiple liquid and solid samples using ATR (Attenuated Total Reflectance) mid-infrared spectroscopy and fluorescence methods. The design of this probe has been optimized for light propagation using ray tracing technology. It has been confirmed to match the performance of both visible and mid-infrared light probes. The ability to convey complementary chemical information from the measurement point has been tested with biological tissue samples. Quantitative analysis of biological tissues is one of the most important applications of this multi-spectral probe.

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ATR loop fiber probe

ATR loop fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The ATR loop infrared PIR fiber probe was the first product in the FlexiSpec series designed for FTIR and other mid-infrared spectroscopy. The ATR loop probe is the optimal product for remote analysis of the composition of liquids, powders, and soft samples without the need for preparation. The loop fiber probe is the simplest probe in the FlexiSpec series, enabling ATR spectroscopy at a low cost.

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Diffuse Reflection Probe "A-DRP1"

Diffuse Reflection Probe "A-DRP1"

Using optical fiber for interconnection! Diffuse reflection probe with lamp, lens, and SMA905 connector.

The "A-DRP1" is a diffuse reflection probe specifically designed for the innoSpectra near-infrared spectrometer. It comes with a lamp, lens, and SMA905 connector, allowing it to be combined with M-F1 and M-F11 to measure diffuse reflected light non-contactly. When interconnecting the "A-DRP" with "M-F11," slide the spacer and tighten it using an M3 set screw with a 1.5mm wrench. 【Features】 ■ Specifically designed for the innoSpectra near-infrared spectrometer ■ Can be combined with M-F1 and M-F11 to measure diffuse reflected light non-contactly ■ Uses optical fiber for interconnection *For more details, please refer to the PDF document or feel free to contact us.

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TITAN T26D Dual-Type Probe Head (~26GHz)

TITAN T26D Dual-Type Probe Head (~26GHz)

Affordable differential measurements from DC to 26GHz!

The probe chip, thanks to MPI's unique MEMS technology, has very high visibility, making probing easy for anyone. The high-precision and robust chips, which are on par with competitors, offer a long lifespan and affordable pricing, resulting in a high cost-performance ratio. Agent in Japan: Vector Semicon Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

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[Standard Type] AFM/SPM Probe

[Standard Type] AFM/SPM Probe

High cost-performance AFM/SPM probes

This is a probe for atomic force microscopy and scanning probe microscopy. It can be used for a wide range of applications. With a reflective coating (Au, Al), it enables high-sensitivity measurements, and you can choose from many models with different cantilever shapes, resonance frequencies, and force constants that are suitable for your samples. Conductive coatings (Au, Pt, TiN, W2C), magnetic coatings, and bare probes without back coatings are also available. - Golden Probe: An excellent probe with an Au reflective coating and a curvature radius of 6 nm (typical). - ETALON Probe: An inexpensive probe with controlled tolerances for resonance frequency and force constant. It has different types of cantilevers at both ends of the chip. - TOP VISUAL Probe: A protruding probe that allows observation of the tip position from directly above, enabling precise positioning on the sample surface.

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High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

This is a probe with a long extra tip at the tip end. It is effective for measuring samples with deep grooves and vertical sidewalls.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a long extra tip at the tip's end. It is effective for measuring samples with deep grooves that a standard tip cannot reach, as well as vertical sidewalls that are difficult to measure. - Whisker Probe: A probe with an extra tip that extends at an angle of 10° or 20° at the tip's end. The angle can be selected to be perpendicular to the sample. - PHA Probe: A probe with an elongated extra tip shaped like a drill.

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[Information] About the microdialysis probe for experimental physicochemical instruments.

[Information] About the microdialysis probe for experimental physicochemical instruments.

It provides a detailed explanation of probe holders, treatment methods, and custom probes.

This document introduces the "Microdialysis Probe," an experimental physicochemical instrument. It includes details on the "A-I type probe system," which involves inserting the probe into animals that have undergone a pre-embedded guide cannula procedure and securing it with a screw-type cap nut, as well as the "CX-I type probe system," which is easy to insert and fix, and is compact and lightweight. It also provides detailed information about dialysis membranes and recovery rates. Please use this information for product selection and handling. [Contents (partial)] ■ Introduction ■ 1. A-I Type Probe System ■ 2. CX-I Type Probe System ■ 3. C-I (IB) Type Inert Specification Probe ■ 4. D-I Type Probe, etc. *For more details, please refer to the PDF document or feel free to contact us.

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[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.

This is a cantilever that can be used with commercially available scanning probe microscopes and atomic force microscopes. Products from "NanoWorld," the world's largest probe manufacturing group, are used for various applications such as routine measurements in manufacturing process management, solid surface observation, material analysis, research on polymer materials, and biomaterials. We supply high-quality cantilevers with sharp tips and low variability in characteristics, as well as cantilevers equipped with probes suitable for industrial applications with high durability. [Contents] - Probes for AC mode non-contact mode - Probes for contact mode force-distance measurements - Broad compatibility for various measurement modes such as electrical and magnetic measurements - Colloid probes suitable for soft measurement targets like polymers and biomaterials - Self-exciting, self-detecting type - AFM accessories such as metal disks for fixing mica and HOPG samples *For more details, please refer to the PDF document or feel free to contact us.

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Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

High aspect ratio SPM/AFM probes that can fit into narrow groove structures!

This product is suitable for quantitative measurements in the depth direction, which are difficult to measure with laser microscopes, such as line & space and trenches. Are you struggling with low surface shape reproducibility with your current probe? Cases where the groove shape is not accurately measured due to the opening angle of the probe tip can be improved by using a probe with a high tip aspect ratio. 【Features】 ■ Well-suited for quantitative measurements in the height direction, which are difficult to measure with laser microscopes ■ Improves cases where the groove shape is not accurately measured due to the opening angle of the probe tip *For more details, please refer to the related link page or feel free to contact us.

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AFM/SPM Probes and Cantilevers for Biomaterial Measurement

AFM/SPM Probes and Cantilevers for Biomaterial Measurement

A liquid probe equipped with a low spring constant cantilever suitable for measuring soft samples in liquid.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for bio-sample and biomaterial measurement. In recent years, there has been a growing demand from customers for the measurement of surface shapes and viscoelasticity of cells and biomolecules, which requires special cantilevers with extremely soft spring constants. 【Features】 ■ Versatile SPM/AFM probes suitable for a wide range of applications ■ Designed for both contact mode and dynamic mode ■ Compatible with almost all commercially available SPM/AFM systems <PNP Series> ■ Cantilevers and probes made of silicon nitride ■ Support tips made of Pyrex glass ■ Individually separated chips for easy handling <uniqprobe Series> Probes with smaller dimensional specifications and material-specific warping and bending compared to Si probes and SiN probes. *For more details, please refer to the PDF document or feel free to contact us.

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High-speed AFM: AFM/SPM probes and cantilevers

High-speed AFM: AFM/SPM probes and cantilevers

USC series with a maximum resonance frequency of 5 MHz for high-speed AFM measurements in air and liquid.

The "USC Cantilever" is a probe with a high resonance frequency that enables unprecedented high-speed response in both air and liquid environments. This product, which balances a high resonance frequency with a low spring constant, is widely used in high-speed AFM measurements that allow for dynamic observation of bio-samples and real-time observation of material surfaces. 【Features】 ■ Designed for high-speed scanning ■ The cantilever and probe are fixed to a single crystal silicon support chip ■ Straight cantilever with no inherent stress ■ Ribbon-shaped cantilever with rounded corners at the free end ■ Cantilever made of quartz-like material *For more details, please refer to the PDF document or feel free to contact us.

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Probe for Scanning Probe Microscopy (SPM)

Probe for Scanning Probe Microscopy (SPM)

A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

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Field Emission Auger Microprobe

Field Emission Auger Microprobe

High-spec OJE electronic spectrometer

Japan Electronics Corporation JAMP-9510F Field Emission Auger Microprobe is a high-spec Auger electron spectroscopy device equipped with a stable high-current field emission electron gun, which is also used in EPMA, and enables high-throughput analysis of chemical bonding states in the nano to micro range. It achieves versatility that does not depend on the sample, providing compositional information from metallic samples to insulating samples, as well as chemical information. 〇 Features - High sensitivity and high resolution analyzer - Schottky field emission electron gun - User-centric sample stage - High durability - Waveform separation software *For more details, please download the PDF or feel free to contact us.

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Ultra-small fiber probe for OCT

Ultra-small fiber probe for OCT

Wavelengths range from 600 to 1800 nm! Based on beam shaping technology, high-quality lenses are directly shaped on the fiber end face.

This product is a fiber probe suitable for compact optical imaging systems that require high resolution and sensitivity. Based on Agiltron's beam shaping technology, high-quality lenses are directly shaped on the fiber end face, achieving a small beam spot. Please feel free to contact us when you need assistance. 【Features】 ■ High optical efficiency ■ Low internal reflection rate ■ Low distortion ■ Low cost ■ Low loss *For more details, please download the PDF (English version) or feel free to contact us.

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High voltage (10kV) compatible coaxial probe holder

High voltage (10kV) compatible coaxial probe holder

High voltage measurement, 10kV compatible, coaxial probe holder.

The HVP-CX-10 comes with a 10kV UHV connector and coaxial cable, allowing for measurements of up to 10kV. The needle vice at the tip of the holder securely holds the needle with simple operation. The SP100 positioner with a T-type arm is ideal for the HVP series probe holders. Additionally, micro positioners with a T-type arm, such as "SP-150" and "S-926," can also be used.

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TH-Raman Probe for low wavenumber region measurement

TH-Raman Probe for low wavenumber region measurement

The Raman spectrum in the low-frequency region can be measured non-contactly and non-destructively.

The TH-RamanProbe system consists of a control unit made up of a laser light source and power supply, and a probe that irradiates the sample with laser light and receives Raman scattered light from the sample. A special notch filter that cuts the excitation laser is built into the probe section. The probe, equipped with a sapphire lens that has high throughput, is available in two types: short focus and long focus, depending on the measurement purpose.

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High Impedance Probe 'TNW-411・412'

High Impedance Probe 'TNW-411・412'

The input resistance of the probe is 1.5kΩ, and the stray capacitance is less than 10pF! Complies with CISPR and Electrical Appliance and Material Safety Law regulations.

The "TNW-411/412" is a high-impedance probe used to measure the interference voltage leaking onto external connection wires from interference sources in the frequency range of 9 kHz to 30 MHz. By registering the correction factor of this device in our interference wave intensity meters (TNM-2401 and TNM-2402), automatic addition can be performed with key operations. The input resistance of the probe is 1.5 kΩ, and the stray capacitance (Cp) is less than 10 pF. 【Features】 ■ CISPR compliant ■ By registering the correction factor of this device in our interference wave intensity meters (TNM-2401 and TNM-2402), automatic addition can be performed with key operations ■ Direct reading measurement of interference voltage is possible *For more details, please refer to the PDF document or feel free to contact us.

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List of Contact Probes by Application

List of Contact Probes by Application

As a custom manufacturing company, we develop and produce various contact probes. We will provide optimal proposals based on our accumulated know-how.

Contact Probe Usage List - Z Pin-RF Test Custom Probe Pin - Kelvin Connection Test Probe Pin Pitch ≥ 0.35mm - High Current Test Probe Pin - 30A - H Pin - High Power RF Test Probe Pin - Pogo Tower Probe - Probe for Burn-In Testing - Module Test Power Probe Pin - Module Test Probe Pin and many others *For more details, please feel free to contact us or download the PDF materials.

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Contact probe [tip shape suitable for application] 0.40mm (recommended)

Contact probe [tip shape suitable for application] 0.40mm (recommended)

Advanced design achieves excellent contact stability and long lifespan, accommodating up to 300,000 cycles.

The UIGREEN contact probe features high precision contact and excellent durability. Thanks to its unique design, it achieves outstanding contact stability and long lifespan, capable of withstanding 300,000 cycles. The materials that can be handled include Pd Alloy (palladium alloy), Be-Cu (beryllium copper), Au Alloy (gold alloy), and SK (steel). It is designed to prevent pin jamming and sticking, providing a reliable connection. 【Features】 ■ Capable of handling everything from design to assembly in a consistent system ■ Achieves precision processing for extremely small areas through a unique manufacturing method ■ Realizes low internal resistance through proprietary in-house design technology *For more details, please download the PDF or feel free to contact us.

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Contact probe [tip shape suitable for application] 0.50mm (recommended)

Contact probe [tip shape suitable for application] 0.50mm (recommended)

High precision contact and excellent durability! The design prevents pin jamming and sticking.

We would like to introduce the contact probes we handle. Thanks to our unique design, we achieve excellent contact stability and long lifespan, accommodating up to 300,000 cycles. Our proprietary manufacturing process allows for precision tip processing for extremely small areas. We provide consistent manufacturing from design to assembly. Please feel free to contact us. 【Available Materials】 ■Pd Alloy (Palladium Alloy) ■Be-Cu (Beryllium Copper) ■Au Alloy (Gold Alloy) ■SK (Steel) *For more details, please download the PDF or feel free to contact us.

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Contact probe [tip shape suitable for application] 0.65mm (recommended)

Contact probe [tip shape suitable for application] 0.65mm (recommended)

Achieving low internal resistance through our unique in-house design technology! We handle everything from design to assembly with integrated manufacturing.

The UIGREEN contact probe features high precision contact and excellent durability. Thanks to its unique design, it achieves outstanding contact stability and long lifespan, capable of withstanding 300,000 cycles. Additionally, it is designed to prevent pin jamming and sticking, providing a reliable connection. Available materials include: Pd Alloy (palladium alloy), Be-Cu (beryllium copper), Au Alloy (gold alloy), SK (steel). 【Features】 ■ Consistent manufacturing from design to assembly ■ Unique manufacturing method enables precision processing for extremely small areas ■ Proprietary in-house design technology achieves low internal resistance *For more details, please download the PDF or feel free to contact us.

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Contact probe [tip shape suitable for application] 1.27mm (recommended)

Contact probe [tip shape suitable for application] 1.27mm (recommended)

Contact probe: Achieves excellent contact stability and long lifespan! Supports up to 300,000 cycles.

UIGREEN's contact probes feature high precision contact and excellent durability. They are designed to prevent pin jamming and sticking, providing a reliable connection. Thanks to our unique manufacturing process, we achieve precision tip processing for extremely small areas and low internal resistance through our proprietary design technology. Additionally, we offer a consistent system from design to assembly. Please feel free to contact us when needed. 【Available Materials】 ■Pd Alloy (Palladium Alloy) ■Be-Cu (Beryllium Copper) ■Au Alloy (Gold Alloy) ■SK (Steel) *For more details, please download the PDF or feel free to contact us.

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Millimeter wave antenna probe compatible with 43.5GHz

Millimeter wave antenna probe compatible with 43.5GHz

43.5GHz compatible wideband antenna probe

Realization of chamberless measurement Support for comprehensive testing in the near field of millimeter-wave 5G wireless devices, etc. Achieving flatness performance comparable to coaxial cables in antenna measurements.

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60GHz antenna probe

60GHz antenna probe

Achieves chamberless measurement with a compact and lightweight design! It is suitable for near-field measurements.

We would like to introduce the "60GHz Antenna Probe" that we handle. It supports the 60GHz band with our unique technology. Despite being compact and lightweight, it ensures a gain of 12.0 dBi or more, making it suitable for near-field measurements. Attachment fixtures can also be manufactured as an option. Please feel free to contact us when you need assistance. 【Features】 ■ Achieves chamberless measurement with a compact and lightweight design ■ No alignment required * For more details, please download the PDF or feel free to contact us.

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