probe Product List and Ranking from 152 Manufacturers, Suppliers and Companies

Hot-wire anemometer smart probe 'testo405i' [Rental]

A wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication.

The testo 405i is a thermal wire anemometer smart probe that can measure wind speed, wind temperature, and air volume. It is compact and highly portable, and the measurements can be checked on a smartphone or tablet via Bluetooth communication. Additionally, specialized analysis results can be easily obtained through calculation and display functions provided by a dedicated app. 【Features】 ■ Displays measurement values on Android/iOS devices (smartphones and tablets) ■ Connects up to 6 probes to a single device for simultaneous measurements ■ Capable of graphing, saving (Android only), and emailing measurement data ■ Duct information can be set in air volume calculation mode ■ The dedicated app can be downloaded from Google Play and the App Store (free) ■ Wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication ■ The rod with a scale indicating insertion length is up to 400mm long, can be bent 180°, and allows measurements at any angle.

Company：ソーキ
Price：Other

Wind Speed/Volume Meter
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Probe 'Fe-0.6Pen' for film thickness gauge SWT [Rental]

This is an electromagnetic probe for SWT-8000-2, 9000, and 8200-2. It is used for measuring paint thickness in narrow areas and small parts.

■Measurement range: 0 to 600μm

Company：ソーキ
Price：Other

Coating thickness gauge
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Thickness gauge SWT with eddy current probe for thick materials 'NFe-8' [Rental]

This is an eddy current probe for SWT-8000-2, 9000, and 8200-2.

Measurement range: 0 to 8mm

Company：ソーキ
Price：Other

Coating thickness gauge
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High-frequency (millimeter wave) probe "Precision ultra-short probe"

Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!

We provide probes designed with consideration for the conditions of high-frequency measurement, allowing for highly accurate measurements. The measurable frequency range is 7GHz, suitable for 50Ω lines on high-frequency substrates. *For more details, please download the PDF or contact us.*

Company：インクス
Price：Other

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Inks Co., Ltd. Business Introduction

Providing precision probes, precision parts, and precision models (such as desktopZERO).

Inks Corporation provides precision probes, precision parts, and precision models (such as desktopZERO). In the probe business, we achieve high performance through innovative technology with spring probes, high-frequency probes, and stacked probes. To pursue high performance, we do not use automated machines and manufacture by hand. In our product business, we incorporate the foundational press technology with the experience, knowledge, and know-how cultivated in the consumer business to solve our customers' problems. 【Business Overview】 ■ Probe Business: Design, prototyping, mass production, and sales of precision probes ■ Product Business: Design, prototyping, mass production, and sales of precision parts ■ Consumer Business: Planning, design, production, and sales of consumer products *For more details, please refer to the PDF materials or feel free to contact us.

Company：インクス
Price：Other

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Features of layered probes

Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.

We would like to introduce the features of the Inks' layered probe. The semi-layered probe contacts with a single metal plate, allowing for measurements with structurally stable contact resistance. Additionally, it is resistant to degradation of spring properties due to heat, making it suitable for measuring power semiconductors that apply high current and high voltage. It can make contact with points arranged in narrow pitches, such as semiconductor lead parts and connector contacts, up to a maximum pitch of 0.05. Furthermore, by varying the shape of the probe body and the thickness of the auxiliary V-shaped leaf spring, it is possible to adjust the load from high to low continuously. 【Features】 ■ Stable contact resistance value (demonstrates power in precise measurements) ■ Supports high current and high voltage (contributes to application and measurement of power semiconductors) ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch) ■ Adjustable contact load (contact tailored to the characteristics of the measured object) *For more details, please refer to the external link page or feel free to contact us.

Company：インクス
Price：Other

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Explained in a video! The mechanism of layered probes [Free case study provided]

A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!

In today's world of miniaturization, are you facing difficulties with measurements using conventional probes? With Inks' "Stacked Probes," we can make contact with a single metal plate, allowing us to accommodate a minimum pitch of 0.05 mm. On this page, we present a video showcasing our "Stacked Probes" in action. Please take a look. 【Features】 ■ Stable contact resistance values ■ Supports high current and high voltage ■ Compatible with narrow pitches ■ Adjustable contact load, etc. *For more details, please download the PDF or contact us.

Company：インクス
Price：Other

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Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

【Layered Probe Brochure Giveaway】Compatible with high current and high temperature. Achieving stable contact resistance values!

The "Layered Probe Brochure" introduces the excellent features of layered probes in comparison to conventional spring probes. Are you facing issues such as "unstable contact resistance," "looking for probes that can handle narrow pitches," "wanting to measure under high current and high temperature," or "seeking probes with superior durability"? With Inks' "Layered Probes," these problems can be resolved! 【Contents】 ■ Structure of Layered Probes ■ Features of Layered Probes ■ Layered Probes Q&A, etc. *For more details, please download the PDF or contact us.

Company：インクス
Price：Other

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[Example] Stable contact of the stacked probe

Introduction to stable contact with the package lead.

The wiping effect of the "stacked probe" removes the oxide film while making contact, achieving stable contact. Additionally, a coating that suppresses tin transfer has been applied to the probe tip, resulting in increased longevity. For magnetic sensor packages, it is also possible to construct the probe unit using only non-magnetic materials. In this case, stable contact was achieved with 2 million cycles of no maintenance. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

Company：インクス
Price：Other

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[Example] Contact at narrow pitch and multiple points with a stacked probe.

Contributing to reduced inspection time and improved production through simultaneous multi-point contact.

We would like to introduce the narrow pitch and multi-point contact of the "stacked probe" that we handle. By stacking 50 probes with a thickness of 0.1mm in a fan shape at a 0.2mm pitch, we have achieved simultaneous contact at 50 points. This has led to a reduction in inspection time and contributed to increased productivity. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

Company：インクス
Price：Other

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[Example] Probe design tailored to existing equipment (narrow space)

Designed probes to fit within limited space, contributing to cost reduction.

We would like to introduce the probe design (for narrow spaces) tailored to the existing equipment for our "stacked probes." In this case, we used a probe for LED inspection. Since we can design the probe to fit into the limited space of existing equipment, there is no need to purchase new equipment, contributing to cost reduction. 【Features of Stacked Probes】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

Company：インクス
Price：Other

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Durability of layered probes

Contributed to improved productivity and cost reduction with 1 million to 10 million contact achievements.

The "laminated probe" is made of a single-piece leaf spring structure, which eliminates issues such as component interference from multiple parts, resulting in exceptional durability. When the contact target is tin (Sn), applying a conductive coating to the tip of the probe suppresses tin transfer, enabling stable inspection. Additionally, due to its high sliding properties and very hard membrane, it excels in wear resistance and durability. As a result, the probe is expected to have a longer lifespan. 【Expected Effects】 ■ Prolonged lifespan of the probe ■ Improved test yield ■ Reduced re-inspection ■ Decreased cleaning and maintenance tasks ■ Increased operational rate of evaluation equipment *For more details, please refer to the PDF document or feel free to contact us.

Company：インクス
Price：Other

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ATR fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The FlexiSpec series is the latest generation of products for total reflection measurement methods. This near-infrared and mid-infrared fiber ATR probe can be used with all types of FTNIR, FTIR, and other infrared spectrometers, spectrophotometers, as well as sensors for infrared LEDs or quantum cascade lasers. The patent-pending ATR immersion optical fiber probe is ideal for reaction monitoring in laboratories, pilot plants, and fully automated process control.

Company：サンインスツルメント本社
Price：Other

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Wavelength 1.1-17μm - Harsh environment compatible ATR optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The ATR fiber optic probe for harsh environments can be used in process spectroscopy to monitor inline reactions over a wide temperature range from -100°C to +250°C, as well as in the near-infrared and mid-infrared ranges. It can also withstand pressures of up to 200 Bar and is suitable for use with FTIR or other infrared spectrometers and automatic process control spectral sensors.

Company：サンインスツルメント本社
Price：Other

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Wavelength 1.1-17μm, low-cost, lab-use ATR fiber optic probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The new design of the PEEK shaft infrared fiber ATR probe is a cost-effective perfect solution for applications in small reactors in the lab. All FlexiSpec ATR probes are compatible with any type of FTIR, other infrared spectrometers, spectrophotometers, and sensors.

Company：サンインスツルメント本社
Price：Other

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Wavelength 405-1064nm; Raman fiber optic probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) FlexiSpec is a high-sensitivity Raman fiber probe that can be used in combination with any Raman spectrometer. There are two options regarding wavelength: one is for multi-wavelength excitation in the range of 630–785 nm, and the other is for single-wavelength excitation at 532/785 nm. These probes have a design with branched fibers, connecting one to the laser and the other to the spectrometer. They enable the analysis of fingerprint region spectra (FP, 800-1800 cm-1) and high-wavenumber spectra (HWVN, 2800-3800 cm-1). The FlexiSpec Raman fiber probe is compatible with interfaces for reaction monitoring in laboratories and pilot plants, as well as for implementing automated process control.

Company：サンインスツルメント本社
Price：Other

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Wavelength 0.2-2.2μm · TransFlex optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) FlexiSpec is the latest generation of transmission fiber TransFlexion (dual pass) probes that can be used with any spectrometer or photometer. The TransFlexion Dual Pass fiber probe is compatible with interfaces for reaction monitoring and automated process control in laboratories and pilot plants, allowing for seamless use.

Company：サンインスツルメント本社
Price：Other

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Mid-infrared + visible light simultaneous measurement - custom ATR fiber probe

It is a probe that can simultaneously measure two wavelength ranges.

Manufacturer: art photonics (Germany) art photonics has developed a multi-spectral optical fiber probe that enables simultaneous analysis of multiple liquid and solid samples using ATR (Attenuated Total Reflectance) mid-infrared spectroscopy and fluorescence methods. The design of this probe has been optimized for light propagation using ray tracing technology. It has been confirmed to match the performance of both visible and mid-infrared light probes. The ability to convey complementary chemical information from the measurement point has been tested with biological tissue samples. Quantitative analysis of biological tissues is one of the most important applications of this multi-spectral probe.

Company：サンインスツルメント本社
Price：Other

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ATR loop fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The ATR loop infrared PIR fiber probe was the first product in the FlexiSpec series designed for FTIR and other mid-infrared spectroscopy. The ATR loop probe is the optimal product for remote analysis of the composition of liquids, powders, and soft samples without the need for preparation. The loop fiber probe is the simplest probe in the FlexiSpec series, enabling ATR spectroscopy at a low cost.

Company：サンインスツルメント本社
Price：Other

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Diffuse Reflection Probe "A-DRP1"

Using optical fiber for interconnection! Diffuse reflection probe with lamp, lens, and SMA905 connector.

The "A-DRP1" is a diffuse reflection probe specifically designed for the innoSpectra near-infrared spectrometer. It comes with a lamp, lens, and SMA905 connector, allowing it to be combined with M-F1 and M-F11 to measure diffuse reflected light non-contactly. When interconnecting the "A-DRP" with "M-F11," slide the spacer and tighten it using an M3 set screw with a 1.5mm wrench. 【Features】 ■ Specifically designed for the innoSpectra near-infrared spectrometer ■ Can be combined with M-F1 and M-F11 to measure diffuse reflected light non-contactly ■ Uses optical fiber for interconnection *For more details, please refer to the PDF document or feel free to contact us.

Company：ナノシード本社
Price：Other

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TITAN T26D Dual-Type Probe Head (~26GHz)

Affordable differential measurements from DC to 26GHz!

The probe chip, thanks to MPI's unique MEMS technology, has very high visibility, making probing easy for anyone. The high-precision and robust chips, which are on par with competitors, offer a long lifespan and affordable pricing, resulting in a high cost-performance ratio. Agent in Japan: Vector Semicon Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

Company：MPI Corporation
Price：Other

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[Standard Type] AFM/SPM Probe

High cost-performance AFM/SPM probes

This is a probe for atomic force microscopy and scanning probe microscopy. It can be used for a wide range of applications. With a reflective coating (Au, Al), it enables high-sensitivity measurements, and you can choose from many models with different cantilever shapes, resonance frequencies, and force constants that are suitable for your samples. Conductive coatings (Au, Pt, TiN, W2C), magnetic coatings, and bare probes without back coatings are also available. - Golden Probe: An excellent probe with an Au reflective coating and a curvature radius of 6 nm (typical). - ETALON Probe: An inexpensive probe with controlled tolerances for resonance frequency and force constant. It has different types of cantilevers at both ends of the chip. - TOP VISUAL Probe: A protruding probe that allows observation of the tip position from directly above, enabling precise positioning on the sample surface.

Company：MSHシステムズ
Price：Other

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High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

This is a probe with a long extra tip at the tip end. It is effective for measuring samples with deep grooves and vertical sidewalls.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a long extra tip at the tip's end. It is effective for measuring samples with deep grooves that a standard tip cannot reach, as well as vertical sidewalls that are difficult to measure. - Whisker Probe: A probe with an extra tip that extends at an angle of 10° or 20° at the tip's end. The angle can be selected to be perpendicular to the sample. - PHA Probe: A probe with an elongated extra tip shaped like a drill.

Company：MSHシステムズ
Price：Other

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[Information] About the microdialysis probe for experimental physicochemical instruments.

It provides a detailed explanation of probe holders, treatment methods, and custom probes.

This document introduces the "Microdialysis Probe," an experimental physicochemical instrument. It includes details on the "A-I type probe system," which involves inserting the probe into animals that have undergone a pre-embedded guide cannula procedure and securing it with a screw-type cap nut, as well as the "CX-I type probe system," which is easy to insert and fix, and is compact and lightweight. It also provides detailed information about dialysis membranes and recovery rates. Please use this information for product selection and handling. [Contents (partial)] ■ Introduction ■ 1. A-I Type Probe System ■ 2. CX-I Type Probe System ■ 3. C-I (IB) Type Inert Specification Probe ■ 4. D-I Type Probe, etc. *For more details, please refer to the PDF document or feel free to contact us.

Company：エイコム
Price：Other

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[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.

This is a cantilever that can be used with commercially available scanning probe microscopes and atomic force microscopes. Products from "NanoWorld," the world's largest probe manufacturing group, are used for various applications such as routine measurements in manufacturing process management, solid surface observation, material analysis, research on polymer materials, and biomaterials. We supply high-quality cantilevers with sharp tips and low variability in characteristics, as well as cantilevers equipped with probes suitable for industrial applications with high durability. [Contents] - Probes for AC mode non-contact mode - Probes for contact mode force-distance measurements - Broad compatibility for various measurement modes such as electrical and magnetic measurements - Colloid probes suitable for soft measurement targets like polymers and biomaterials - Self-exciting, self-detecting type - AFM accessories such as metal disks for fixing mica and HOPG samples *For more details, please refer to the PDF document or feel free to contact us.

Company：NanoAndMoreジャパン本社
Price：10,000 yen-100,000 yen

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Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

High aspect ratio SPM/AFM probes that can fit into narrow groove structures!

This product is suitable for quantitative measurements in the depth direction, which are difficult to measure with laser microscopes, such as line & space and trenches. Are you struggling with low surface shape reproducibility with your current probe? Cases where the groove shape is not accurately measured due to the opening angle of the probe tip can be improved by using a probe with a high tip aspect ratio. 【Features】 ■ Well-suited for quantitative measurements in the height direction, which are difficult to measure with laser microscopes ■ Improves cases where the groove shape is not accurately measured due to the opening angle of the probe tip *For more details, please refer to the related link page or feel free to contact us.

Company：NanoAndMoreジャパン本社
Price：100,000 yen-500,000 yen

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AFM/SPM Probes and Cantilevers for Biomaterial Measurement

A liquid probe equipped with a low spring constant cantilever suitable for measuring soft samples in liquid.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for bio-sample and biomaterial measurement. In recent years, there has been a growing demand from customers for the measurement of surface shapes and viscoelasticity of cells and biomolecules, which requires special cantilevers with extremely soft spring constants. 【Features】 ■ Versatile SPM/AFM probes suitable for a wide range of applications ■ Designed for both contact mode and dynamic mode ■ Compatible with almost all commercially available SPM/AFM systems <PNP Series> ■ Cantilevers and probes made of silicon nitride ■ Support tips made of Pyrex glass ■ Individually separated chips for easy handling <uniqprobe Series> Probes with smaller dimensional specifications and material-specific warping and bending compared to Si probes and SiN probes. *For more details, please refer to the PDF document or feel free to contact us.

Company：NanoAndMoreジャパン本社
Price：10,000 yen-100,000 yen

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High-speed AFM: AFM/SPM probes and cantilevers

USC series with a maximum resonance frequency of 5 MHz for high-speed AFM measurements in air and liquid.

The "USC Cantilever" is a probe with a high resonance frequency that enables unprecedented high-speed response in both air and liquid environments. This product, which balances a high resonance frequency with a low spring constant, is widely used in high-speed AFM measurements that allow for dynamic observation of bio-samples and real-time observation of material surfaces. 【Features】 ■ Designed for high-speed scanning ■ The cantilever and probe are fixed to a single crystal silicon support chip ■ Straight cantilever with no inherent stress ■ Ribbon-shaped cantilever with rounded corners at the free end ■ Cantilever made of quartz-like material *For more details, please refer to the PDF document or feel free to contact us.

Company：NanoAndMoreジャパン本社
Price：100,000 yen-500,000 yen

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Probe for Scanning Probe Microscopy (SPM)

A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

Company：NanoAndMoreジャパン本社
Price：Other

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probe Product List and Ranking from 152 Manufacturers, Suppliers and Companies | IPROS GMS

probe Manufacturer, Suppliers and Company Rankings

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