A wide variety of probes in stock! Leave the selection of probes to us!
Our company offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types. Since we design in-house, we can also manufacture components, allowing us to meet customer requests in a short delivery time. As a probe manufacturer, we have many inspection fixtures that we can create, so please feel free to consult with us. 【Features】 ■ Low price ■ Support for small quantities of probes ■ Short delivery time with in-house design ■ Components can also be manufactured in-house *For more details, please refer to the PDF document or feel free to contact us.
Inquire About This Product
basic information
【Case Studies】 Q: I want to make contact with many pads around the LCD panel, but the wiring is complicated. A: We directly soldered ultra-small probes to the substrate and routed the wiring on the substrate. This reduced disconnections and contributed to weight reduction. Q: I want to make contact from multiple directions, but the mechanism becomes complicated... A: It is possible to make contact from up to five directions with a single manual action. Q: I need a large number of pin blocks. A: If the quantity is large, we can make the blocks as molded products at a lower cost. Of course, we can also manufacture from just one piece. *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog（3）
Download All Catalogs
Company information
Since our establishment in 1976, we have contributed to the development of the electronic equipment industry, including contact probes, through many years of experience, achievements, and a wealth of accumulated technology. To meet the increasingly advanced and diversified inspection systems, we design and manufacture new products tailored to our customers' needs, responding quickly to all requests.
![[Free Support] Resolving Probe Contact Issues in Power Device Power-On Testing](https://image.mono.ipros.com/public/default/object/noimage_l.gif?w=280&h=280)
