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probe Product List and Ranking from 155 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 01, 2025～Oct 28, 2025
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 01, 2025～Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
  3. TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
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probe Product ranking

Last Updated： Aggregation Period:Oct 01, 2025～Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. AC Current Probe "CWT Mini50HF" 日本オートマティック・コントロール 電子システム部
  3. Connection terminal TA series サンケイエンジニアリング 本社
  4. 4 Flexible wire サンケイエンジニアリング 本社
  5. 5 Examples of probes for electromagnetic and eddy current thickness gauges.

probe Product List

586～600 item / All 665 items

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High-speed AFM: AFM/SPM probes and cantilevers

High-speed AFM: AFM/SPM probes and cantilevers

USC series with a maximum resonance frequency of 5 MHz for high-speed AFM measurements in air and liquid.

The "USC Cantilever" is a probe with a high resonance frequency that enables unprecedented high-speed response in both air and liquid environments. This product, which balances a high resonance frequency with a low spring constant, is widely used in high-speed AFM measurements that allow for dynamic observation of bio-samples and real-time observation of material surfaces. 【Features】 ■ Designed for high-speed scanning ■ The cantilever and probe are fixed to a single crystal silicon support chip ■ Straight cantilever with no inherent stress ■ Ribbon-shaped cantilever with rounded corners at the free end ■ Cantilever made of quartz-like material *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • 3D measuring device
  • Other physicochemical equipment

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Probe for Scanning Probe Microscopy (SPM)

Probe for Scanning Probe Microscopy (SPM)

A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

  • probe
  • Other microscopes

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Field Emission Auger Microprobe

Field Emission Auger Microprobe

High-spec OJE electronic spectrometer

Japan Electronics Corporation JAMP-9510F Field Emission Auger Microprobe is a high-spec Auger electron spectroscopy device equipped with a stable high-current field emission electron gun, which is also used in EPMA, and enables high-throughput analysis of chemical bonding states in the nano to micro range. It achieves versatility that does not depend on the sample, providing compositional information from metallic samples to insulating samples, as well as chemical information. 〇 Features - High sensitivity and high resolution analyzer - Schottky field emission electron gun - User-centric sample stage - High durability - Waveform separation software *For more details, please download the PDF or feel free to contact us.

  • Other electronic measuring instruments

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Ultra-small fiber probe for OCT

Ultra-small fiber probe for OCT

Wavelengths range from 600 to 1800 nm! Based on beam shaping technology, high-quality lenses are directly shaped on the fiber end face.

This product is a fiber probe suitable for compact optical imaging systems that require high resolution and sensitivity. Based on Agiltron's beam shaping technology, high-quality lenses are directly shaped on the fiber end face, achieving a small beam spot. Please feel free to contact us when you need assistance. 【Features】 ■ High optical efficiency ■ Low internal reflection rate ■ Low distortion ■ Low cost ■ Low loss *For more details, please download the PDF (English version) or feel free to contact us.

  • probe

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High voltage (10kV) compatible coaxial probe holder

High voltage (10kV) compatible coaxial probe holder

High voltage measurement, 10kV compatible, coaxial probe holder.

The HVP-CX-10 comes with a 10kV UHV connector and coaxial cable, allowing for measurements of up to 10kV. The needle vice at the tip of the holder securely holds the needle with simple operation. The SP100 positioner with a T-type arm is ideal for the HVP series probe holders. Additionally, micro positioners with a T-type arm, such as "SP-150" and "S-926," can also be used.

  • probe

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PROXIMAL BALLPROBE Non-contact Wide Area Probe

PROXIMAL BALLPROBE Non-contact Wide Area Probe

Non-contact Raman probe that enables measurement of Raman spectra over a wide range.

The wide-area probe has an effective aperture diameter of 8mm, which is wider than that of a standard probe, allowing for the broad collection of Raman scattered light from samples. Additionally, the working distance (focal length) is 3cm, enabling non-contact measurements in the biopharmaceutical, pharmaceutical, and food sectors, thereby reducing the risk of cross-contamination and foreign matter intrusion during measurement.

  • Raman Spectrophotometer
  • Other photoanalytical instruments

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TH-Raman Probe for low wavenumber region measurement

TH-Raman Probe for low wavenumber region measurement

The Raman spectrum in the low-frequency region can be measured non-contactly and non-destructively.

The TH-RamanProbe system consists of a control unit made up of a laser light source and power supply, and a probe that irradiates the sample with laser light and receives Raman scattered light from the sample. A special notch filter that cuts the excitation laser is built into the probe section. The probe, equipped with a sapphire lens that has high throughput, is available in two types: short focus and long focus, depending on the measurement purpose.

  • Analytical Equipment and Devices

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Single-use Raman probe

Single-use Raman probe

Biopharmaceuticals, pharmaceuticals, cell culture, Raman probes for fermentation measurement.

• Accurate and reproducible measurements are possible • Disposable probes for batch use in case of high costs • Can be sterilized by autoclave, SIP, EtO, or gamma radiation • Compatible with standard Pg13.5 ports • Specifications such as probe length can be customized

  • Raman Spectrophotometer

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High Impedance Probe 'TNW-411・412'

High Impedance Probe 'TNW-411・412'

The input resistance of the probe is 1.5kΩ, and the stray capacitance is less than 10pF! Complies with CISPR and Electrical Appliance and Material Safety Law regulations.

The "TNW-411/412" is a high-impedance probe used to measure the interference voltage leaking onto external connection wires from interference sources in the frequency range of 9 kHz to 30 MHz. By registering the correction factor of this device in our interference wave intensity meters (TNM-2401 and TNM-2402), automatic addition can be performed with key operations. The input resistance of the probe is 1.5 kΩ, and the stray capacitance (Cp) is less than 10 pF. 【Features】 ■ CISPR compliant ■ By registering the correction factor of this device in our interference wave intensity meters (TNM-2401 and TNM-2402), automatic addition can be performed with key operations ■ Direct reading measurement of interference voltage is possible *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Other electronic parts
  • probe

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List of Contact Probes by Application

List of Contact Probes by Application

As a custom manufacturing company, we develop and produce various contact probes. We will provide optimal proposals based on our accumulated know-how.

Contact Probe Usage List - Z Pin-RF Test Custom Probe Pin - Kelvin Connection Test Probe Pin Pitch ≥ 0.35mm - High Current Test Probe Pin - 30A - H Pin - High Power RF Test Probe Pin - Pogo Tower Probe - Probe for Burn-In Testing - Module Test Power Probe Pin - Module Test Probe Pin and many others *For more details, please feel free to contact us or download the PDF materials.

  • probe

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Contact probe [tip shape suitable for application] 0.40mm (recommended)

Contact probe [tip shape suitable for application] 0.40mm (recommended)

Advanced design achieves excellent contact stability and long lifespan, accommodating up to 300,000 cycles.

The UIGREEN contact probe features high precision contact and excellent durability. Thanks to its unique design, it achieves outstanding contact stability and long lifespan, capable of withstanding 300,000 cycles. The materials that can be handled include Pd Alloy (palladium alloy), Be-Cu (beryllium copper), Au Alloy (gold alloy), and SK (steel). It is designed to prevent pin jamming and sticking, providing a reliable connection. 【Features】 ■ Capable of handling everything from design to assembly in a consistent system ■ Achieves precision processing for extremely small areas through a unique manufacturing method ■ Realizes low internal resistance through proprietary in-house design technology *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Contact probe [tip shape suitable for application] 0.50mm (recommended)

Contact probe [tip shape suitable for application] 0.50mm (recommended)

High precision contact and excellent durability! The design prevents pin jamming and sticking.

We would like to introduce the contact probes we handle. Thanks to our unique design, we achieve excellent contact stability and long lifespan, accommodating up to 300,000 cycles. Our proprietary manufacturing process allows for precision tip processing for extremely small areas. We provide consistent manufacturing from design to assembly. Please feel free to contact us. 【Available Materials】 ■Pd Alloy (Palladium Alloy) ■Be-Cu (Beryllium Copper) ■Au Alloy (Gold Alloy) ■SK (Steel) *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Contact probe [tip shape suitable for application] 0.65mm (recommended)

Contact probe [tip shape suitable for application] 0.65mm (recommended)

Achieving low internal resistance through our unique in-house design technology! We handle everything from design to assembly with integrated manufacturing.

The UIGREEN contact probe features high precision contact and excellent durability. Thanks to its unique design, it achieves outstanding contact stability and long lifespan, capable of withstanding 300,000 cycles. Additionally, it is designed to prevent pin jamming and sticking, providing a reliable connection. Available materials include: Pd Alloy (palladium alloy), Be-Cu (beryllium copper), Au Alloy (gold alloy), SK (steel). 【Features】 ■ Consistent manufacturing from design to assembly ■ Unique manufacturing method enables precision processing for extremely small areas ■ Proprietary in-house design technology achieves low internal resistance *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Contact probe [tip shape suitable for application] 1.27mm (recommended)

Contact probe [tip shape suitable for application] 1.27mm (recommended)

Contact probe: Achieves excellent contact stability and long lifespan! Supports up to 300,000 cycles.

UIGREEN's contact probes feature high precision contact and excellent durability. They are designed to prevent pin jamming and sticking, providing a reliable connection. Thanks to our unique manufacturing process, we achieve precision tip processing for extremely small areas and low internal resistance through our proprietary design technology. Additionally, we offer a consistent system from design to assembly. Please feel free to contact us when needed. 【Available Materials】 ■Pd Alloy (Palladium Alloy) ■Be-Cu (Beryllium Copper) ■Au Alloy (Gold Alloy) ■SK (Steel) *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Millimeter wave antenna probe compatible with 43.5GHz

Millimeter wave antenna probe compatible with 43.5GHz

43.5GHz compatible wideband antenna probe

Realization of chamberless measurement Support for comprehensive testing in the near field of millimeter-wave 5G wireless devices, etc. Achieving flatness performance comparable to coaxial cables in antenna measurements.

  • antenna

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