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probe Product List and Ranking from 155 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 精研 本社 Tokyo//Electronic Components and Semiconductors
  3. ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
  4. 4 テクノプローブ Chiba//Testing, Analysis and Measurement
  5. 5 null/null
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probe Product ranking

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  5. 5 Probe Mounting Adapter Socket (High Pressure Type) AS-S Series サンケイエンジニアリング 本社

probe Product List

586～600 item / All 659 items

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High voltage (10kV) compatible coaxial probe holder

High voltage (10kV) compatible coaxial probe holder

High voltage measurement, 10kV compatible, coaxial probe holder.

The HVP-CX-10 comes with a 10kV UHV connector and coaxial cable, allowing for measurements of up to 10kV. The needle vice at the tip of the holder securely holds the needle with simple operation. The SP100 positioner with a T-type arm is ideal for the HVP series probe holders. Additionally, micro positioners with a T-type arm, such as "SP-150" and "S-926," can also be used.

  • probe

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TH-Raman Probe for low wavenumber region measurement

TH-Raman Probe for low wavenumber region measurement

The Raman spectrum in the low-frequency region can be measured non-contactly and non-destructively.

The TH-RamanProbe system consists of a control unit made up of a laser light source and power supply, and a probe that irradiates the sample with laser light and receives Raman scattered light from the sample. A special notch filter that cuts the excitation laser is built into the probe section. The probe, equipped with a sapphire lens that has high throughput, is available in two types: short focus and long focus, depending on the measurement purpose.

  • Analytical Equipment and Devices

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High Impedance Probe 'TNW-411・412'

High Impedance Probe 'TNW-411・412'

The input resistance of the probe is 1.5kΩ, and the stray capacitance is less than 10pF! Complies with CISPR and Electrical Appliance and Material Safety Law regulations.

The "TNW-411/412" is a high-impedance probe used to measure the interference voltage leaking onto external connection wires from interference sources in the frequency range of 9 kHz to 30 MHz. By registering the correction factor of this device in our interference wave intensity meters (TNM-2401 and TNM-2402), automatic addition can be performed with key operations. The input resistance of the probe is 1.5 kΩ, and the stray capacitance (Cp) is less than 10 pF. 【Features】 ■ CISPR compliant ■ By registering the correction factor of this device in our interference wave intensity meters (TNM-2401 and TNM-2402), automatic addition can be performed with key operations ■ Direct reading measurement of interference voltage is possible *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Other electronic parts
  • probe

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List of Contact Probes by Application

List of Contact Probes by Application

As a custom manufacturing company, we develop and produce various contact probes. We will provide optimal proposals based on our accumulated know-how.

Contact Probe Usage List - Z Pin-RF Test Custom Probe Pin - Kelvin Connection Test Probe Pin Pitch ≥ 0.35mm - High Current Test Probe Pin - 30A - H Pin - High Power RF Test Probe Pin - Pogo Tower Probe - Probe for Burn-In Testing - Module Test Power Probe Pin - Module Test Probe Pin and many others *For more details, please feel free to contact us or download the PDF materials.

  • probe

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Contact probe [tip shape suitable for application] 0.40mm (recommended)

Contact probe [tip shape suitable for application] 0.40mm (recommended)

Advanced design achieves excellent contact stability and long lifespan, accommodating up to 300,000 cycles.

The UIGREEN contact probe features high precision contact and excellent durability. Thanks to its unique design, it achieves outstanding contact stability and long lifespan, capable of withstanding 300,000 cycles. The materials that can be handled include Pd Alloy (palladium alloy), Be-Cu (beryllium copper), Au Alloy (gold alloy), and SK (steel). It is designed to prevent pin jamming and sticking, providing a reliable connection. 【Features】 ■ Capable of handling everything from design to assembly in a consistent system ■ Achieves precision processing for extremely small areas through a unique manufacturing method ■ Realizes low internal resistance through proprietary in-house design technology *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Contact probe [tip shape suitable for application] 0.50mm (recommended)

Contact probe [tip shape suitable for application] 0.50mm (recommended)

High precision contact and excellent durability! The design prevents pin jamming and sticking.

We would like to introduce the contact probes we handle. Thanks to our unique design, we achieve excellent contact stability and long lifespan, accommodating up to 300,000 cycles. Our proprietary manufacturing process allows for precision tip processing for extremely small areas. We provide consistent manufacturing from design to assembly. Please feel free to contact us. 【Available Materials】 ■Pd Alloy (Palladium Alloy) ■Be-Cu (Beryllium Copper) ■Au Alloy (Gold Alloy) ■SK (Steel) *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Contact probe [tip shape suitable for application] 0.65mm (recommended)

Contact probe [tip shape suitable for application] 0.65mm (recommended)

Achieving low internal resistance through our unique in-house design technology! We handle everything from design to assembly with integrated manufacturing.

The UIGREEN contact probe features high precision contact and excellent durability. Thanks to its unique design, it achieves outstanding contact stability and long lifespan, capable of withstanding 300,000 cycles. Additionally, it is designed to prevent pin jamming and sticking, providing a reliable connection. Available materials include: Pd Alloy (palladium alloy), Be-Cu (beryllium copper), Au Alloy (gold alloy), SK (steel). 【Features】 ■ Consistent manufacturing from design to assembly ■ Unique manufacturing method enables precision processing for extremely small areas ■ Proprietary in-house design technology achieves low internal resistance *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Contact probe [tip shape suitable for application] 1.27mm (recommended)

Contact probe [tip shape suitable for application] 1.27mm (recommended)

Contact probe: Achieves excellent contact stability and long lifespan! Supports up to 300,000 cycles.

UIGREEN's contact probes feature high precision contact and excellent durability. They are designed to prevent pin jamming and sticking, providing a reliable connection. Thanks to our unique manufacturing process, we achieve precision tip processing for extremely small areas and low internal resistance through our proprietary design technology. Additionally, we offer a consistent system from design to assembly. Please feel free to contact us when needed. 【Available Materials】 ■Pd Alloy (Palladium Alloy) ■Be-Cu (Beryllium Copper) ■Au Alloy (Gold Alloy) ■SK (Steel) *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Millimeter wave antenna probe compatible with 43.5GHz

Millimeter wave antenna probe compatible with 43.5GHz

43.5GHz compatible wideband antenna probe

Realization of chamberless measurement Support for comprehensive testing in the near field of millimeter-wave 5G wireless devices, etc. Achieving flatness performance comparable to coaxial cables in antenna measurements.

  • antenna

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60GHz antenna probe

60GHz antenna probe

Achieves chamberless measurement with a compact and lightweight design! It is suitable for near-field measurements.

We would like to introduce the "60GHz Antenna Probe" that we handle. It supports the 60GHz band with our unique technology. Despite being compact and lightweight, it ensures a gain of 12.0 dBi or more, making it suitable for near-field measurements. Attachment fixtures can also be manufactured as an option. Please feel free to contact us when you need assistance. 【Features】 ■ Achieves chamberless measurement with a compact and lightweight design ■ No alignment required * For more details, please download the PDF or feel free to contact us.

  • antenna
  • probe

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We will match the inspection conditions! Contact probe (custom-made)

We will match the inspection conditions! Contact probe (custom-made)

In semiconductor testing, probe cards and IC sockets are often custom-made. We solve issues that cannot be addressed with standard probe products.

We offer a one-sided movable probe as a standard probe in our catalog. However, when trying to match it to equipment used for electrical testing, it may not meet the specifications. We can suggest existing probes tailored to the products or equipment conditions you wish to test, but if there is no suitable probe available, we can manufacture a custom one. In addition to partially manufacturing new parts based on existing probes, we can also create all parts from scratch. Therefore, if you need a replacement or compatible probe due to the discontinuation of a probe manufactured by another company, we may be able to assist you. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe
  • Other electronic parts
  • Inspection fixture

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Thermometer Probe / Part Number MD34SMF-2016T

Thermometer Probe / Part Number MD34SMF-2016T

Thermometer probe (smartphone wireless connection)

Gas temperature probe for measuring ambient temperature, wind temperature, etc. It can also record on a smartphone/tablet, allowing you to track temperature trends.

  • Thermometer

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Contact Probe Short Stroke CPS Series

Contact Probe Short Stroke CPS Series

Contact probe, short stroke type *Measurement jigs can also be manufactured!

【Overview】 This is a contact probe with an external spring design, manufactured as an integrated unit. It is suitable for precision measurements due to its ability to maintain low inherent resistance. ★ For more details about the series, please contact us or download the materials to view them. ★ * We also accept requests for the production of fixtures for electrical measurements. You can request our services even without design drawings or knowledge of electrical measurements! We can handle everything from design, concept, measurement methods, processing, assembly, to wiring. 【Examples of Measurement Fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive components, etc.

  • Terminal Blocks

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Contact Probe Long Stroke NCPLP & LB Series

Contact Probe Long Stroke NCPLP & LB Series

Contact Probe Long Stroke Type

【Overview】 This is a contact probe with an external spring, manufactured as an integrated unit. Compared to the general-purpose CP series, it has a longer overall length and stroke. It is effective when there is a distance between the mounting position and the measurement object. ★For more details about the series, please contact us or download the materials to view them★

  • Terminal Blocks

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Custom order for high-temperature contact probes.

Custom order for high-temperature contact probes.

We will design probes according to the measurement temperature as a response to high temperatures. Support as a unit is also possible.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks

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