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probe Product List and Ranking from 155 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 12, 2025～Dec 09, 2025
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 12, 2025～Dec 09, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 精研 本社 Tokyo//Electronic Components and Semiconductors
  3. ヴァイサラ Tokyo//Testing, Analysis and Measurement
  4. 4 null/null
  5. 5 テクノプローブ Chiba//Testing, Analysis and Measurement
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probe Product ranking

Last Updated： Aggregation Period:Nov 12, 2025～Dec 09, 2025
This ranking is based on the number of page views on our site.

  1. Connection terminal TA series サンケイエンジニアリング 本社
  2. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  5. 5 Examples of probes for electromagnetic and eddy current thickness gauges.

probe Product List

646～659 item / All 659 items

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Heat-resistant contact probe (suitable for use in constant temperature baths)

Heat-resistant contact probe (suitable for use in constant temperature baths)

Achieve stable measurements even in a constant temperature bath! Please request from the selection of probes.

Founded 40 years ago, we have been manufacturing contact probes used for various measurements. Our standard CPU series (maximum heat resistance temperature of 300°C) achieves stable electrical resistance measurements even within constant temperature baths. After understanding the material, shape, surface treatment of the workpiece, and measurement conditions (current value, energization cycle, ambient temperature, measurement speed), we will propose products suitable for your usage conditions. Please contact us through our website first. ★http://www.sankei-engineering.com/★

  • Terminal Blocks
  • Other electronic parts
  • probe

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Contracted measurement service: Reproducing the environment where defects occur.

Contracted measurement service: Reproducing the environment where defects occur.

Reproducing the same conditions. You can check what is happening.

With 40 years of experience, we have been manufacturing contact probes that can achieve the desired measurements by measuring various measurement conditions and the electrical contact resistance of workpieces. We replicate conditions equivalent to those in which defects occur and convert the situation into data. Based on this data, we also propose solutions. Please utilize this for identifying causes and developing new products. Please contact us through our website first. ★http://www.sankei-engineering.com/★

  • Contract measurement

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Wavecontrol Magnetic Field Probe WPH1000

Wavecontrol Magnetic Field Probe WPH1000

The new WPF1000 magnetic field probe features a high sensitivity of 0.018 A/m, isotropic RMS measurement, and complies with international standards.

New H-field broadband probe WPH1000 from Wavecontrol! High sensitivity of 0.018 A/m, isotropic RMS measurement, and compliant with international standards for magnetic field probe WPF1000. 【Main Features】 - High sensitivity - Isotropic & RMS measurement - Excellent attenuation - Compliant with international standards

  • EMC Testing
  • Strength Testing Equipment
  • Other electronic measuring instruments

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RF MEMS Probe "TP67-Vertical Series"

RF MEMS Probe "TP67-Vertical Series"

Probe repair and tip chip replacement available! Reflection loss (GSG-150um pitch typ.) is -18.0dB.

We would like to introduce our RF_MEMS probe, the 'TP67-Vertical Series'. The frequency range is DC to 67GHz, with a characteristic impedance of 50 ohms. The connector is 1.85mm/F (V/F), and the probe mark size (width) is less than 30um. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe mark ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TPD50-Angle Series"

RF MEMS Probe "TPD50-Angle Series"

The compatible pitch is 50 to 1000 micrometers! It is a low loss, low reflection air coplanar probe design.

We would like to introduce our RF_MEMS probe, the 'TPD50-Angle Series'. The characteristic impedance is 50 ohms, and the frequency range is DC to 50 GHz, with crosstalk (GSGSG-150um pitch typ.) at -35.0 dB. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TPD67-Vertical Series"

RF MEMS Probe "TPD67-Vertical Series"

The dielectric strength is 100V, and the crosstalk (GSGSG-150um pitch typ.) is -35.0dB!

We would like to introduce our RF_MEMS probe, the 'TPD67-Vertical Series'. The frequency range is DC to 67GHz, with an insertion loss (GSGSG-150um pitch typ.) of -1.2dB. Additionally, the probe can be repaired and the tip chip can be replaced. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Note: Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TPWR15"

RF MEMS Probe "TPWR15"

Probe repair and tip chip replacement available! Contact resistance (to gold pad) is 0.05 ohm.

We would like to introduce our RF_MEMS probe 'TPWR15' that we handle. The reflection loss (typ. GSG-150um pitch) is -5.0dB, the power tolerance is 5W, and the probe mark size (width) is less than 30um. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe scars ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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High-precision temperature and humidity sensor, temperature and humidity sensor probe.

High-precision temperature and humidity sensor, temperature and humidity sensor probe.

The humidity accuracy is at the highest level of ±0.4% (accuracy at 15℃ to 30℃ for HT-EIS)!

It is a high-precision temperature and humidity sensor from Novasina. The humidity accuracy is at the highest level of ±0.4% (accuracy of HT-EIS at 15°C to 30°C). It is used in combination with a dedicated transmitter.

  • Sensors

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Freely move the collected 2μm-sized foreign matter to a disk for analysis.

Freely move the collected 2μm-sized foreign matter to a disk for analysis.

Optimal for the collection of "falling and adhering foreign substances" under a microscope.

■This is a tungsten probe (needle) optimized for handling micro-sized objects. ■You can choose the size according to the condition of the sample, ensuring stable operation at all times. ■Probes with a tip diameter of less than 1μm are particularly optimized for use with micromanipulators. ■It also has flexibility, allowing the tip to be bent for use. *For bending, the use of a probe bender is recommended. *For more details, please contact us via the link below.

  • Other electronic parts

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Light Probes

Light Probes

Light Probes

This is an optical probe used for testing the lighting and blinking of LEDs, lamps, and displays, incorporated into an automatic testing machine.

  • Other optical parts
  • Sensors

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Sensitive Probe (IB/IF Series) *CAD data available

Sensitive Probe (IB/IF Series) *CAD data available

IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!

The "IB series" is an integrated contact probe that achieves low contact resistance, ranging from types below 10 mΩ to types below 50 mΩ, without the need for a socket. The "IF series" enables probing at narrow pitches. Utilizing a structure where tungsten wire moves within a flexible guide tube, the body can be spread out in a fan shape and fixed, allowing the tip to be arranged at a narrow pitch. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract manufacturing
  • probe

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【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]

In recent years, as products have become smaller, the components used have also been miniaturized year by year. However, isn't it becoming difficult to measure and analyze these miniaturized components with existing probes? The "stacked probe" can handle a minimum pitch of 0.05 mm, which conventional probes cannot accommodate, and it also performs well as a probe for power semiconductors that require high current. This means that even small semiconductors that could not be measured before can now be measured. 【Features】 - Achieves precise measurements due to stable contact resistance - Capable of handling high current and high voltage - Supports narrow pitches of up to 0.05 mm, etc. *For more details, please download the PDF or contact us.

  • probe

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AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

Suitable for high polymer materials with a slightly lower spring constant than conventional non-contact tapping mode probes.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for polymer material research and development. For tapping mode measurements of polymers with relatively soft surfaces, soft tapping probes are ideal. Additionally, we offer colloid probes suitable for localized viscoelastic measurements, friction force measurements, and modulation response measurements, which have been in high demand in recent years. 【Features】 The NanoWorld Pointprobe NCL is designed for non-contact mode and tapping mode. It combines a low spring constant, high measurement stability, excellent sensitivity, and high-speed measurement capabilities. The tip shape is a polygon close to a pyramid. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

Introducing a conductive film coat probe suitable for measuring the electrical properties of various materials.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the electrical properties of nanomaterials. For localized electrical property measurements, probes with metal film coatings are preferable. While platinum coating is the standard, you can also use platinum silicide or conductive diamond-coated types that enhance wear resistance during contact. 【Features】 ■ For measuring the electrical properties of nanomaterials ■ Probes with metal film coatings are suitable for localized electrical property measurements ■ Platinum silicide and conductive diamond-coated types are also available *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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