Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.
151～180 item / All 757 items
Optimal for "cutting and marking" under a microscope.
■ This is a carbide probe that is ideal for cutting and marking small objects. ■ Various sizes and shapes can be selected according to the material and condition of the sample. ■ It is suitable for removing foreign substances that may cause bending in tungsten probes. *For more details, please contact us via the link below.*
Optimal for the removal and collection of foreign substances from small nozzle holes.
■This is an ultra-fine probe made of resin. ■It is capable of removing and collecting foreign objects from tiny holes and slits. *For more details, please contact us via the link below.
Consolidating decades of technology developed with contact probes for semiconductor testing!
Consolidating decades of technology developed with contact probes for semiconductor testing! Short Probes 【Features】 ○ Quickly responds to fine pitch and high-speed testing environments ○ High-performance short probes highly rated by users worldwide ○ Easy customization ○ Main types ・Short probes for 1.0mm pitch ・Short probes for 0.8mm pitch ・Short probes for 0.65mm pitch ・Short probes for 0.5mm pitch ・Short probes for 0.4mm pitch ・Ultra-short short probes *Other types are also available. Please contact us for more details.
The horseshoe-shaped tip design ensures more reliable contact! Contact probe for Kelvin measurements.
The "RI-020ZC-01" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. It is suitable for measuring BGA packages with a 0.4mm pitch matrix and QFP packages with a 0.3mm pitch. Additionally, we also offer the 4-point type "RI-020ZC-02." 【Materials】 ■A Plunger: SK / Au-Plated ■Barrel: PB / Au Lined ■Spring: SWP / Au-Plated ■B Plunger: SK / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.
Introducing the Dragon Probe series, capable of withstanding high-temperature environments up to 200℃!
The "RI-030II-28-WKG" is a probe with excellent high-temperature characteristics. It is suitable for high-temperature environments up to 200°C. In addition, to meet the high heat resistance temperature requirements of probes in reliability testing, we currently offer the HOTPIN that supports up to 175°C. 【Material】 ■A Plunger: BeCu / K3-Gold ■Barrel: Ni / Inner Au ■Spring: SUS / Au-Plated ■B Plunger: BeCu / K3-Gold *For more details, please refer to the PDF document or feel free to contact us.
Compatible with various types of sockets! A probe that allows you to choose the tip shape according to your application.
The "RI-030LI-33-A2" is a standard design probe suitable for 0.4mm and 0.5mm pitch. It is versatile and can be used with various types of sockets. Additionally, you can choose from three different tip shapes according to your application. 【Material】 ■A Plunger: BeCu / Au-Plated ■Barrel: PB / Au-Plated ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.
Introducing a probe for Kelvin measurement that can withstand high-temperature environments up to 170℃!
The "RI-035ZI-01-WKG" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. Additionally, this product is suitable for high-temperature environments up to 170°C and has a 2A CCC characteristic. We also offer a 4-point type, the "RI-035ZI-02-WKG." 【Materials】 ■A Plunger: SK / K3 Gold ■Barrel: NS / Au-Plated ■Spring: SUS / Au-Plated ■B Plunger: SK / K3 Gold *For more details, please refer to the PDF document or feel free to contact us.
DDR3 1867 DIMM Analysis Probe
DDR3 Analysis Probe for Logic Analyzers ■ Capable of measuring up to the fastest DDR3 1867 DIMM modules!! ■ Compatible with all 240-pin DDR3 SDRAM DIMMs ■ No slot required for analysis due to the interposer ■ Capable of measuring all signals ■ Comes with dedicated software for logic analyzers - Timing measurement - Protocol measurement - Compliance measurement
Air Probe
This is a type that uses air pressure (6 bar) instead of a spring.
We are currently offering a free comprehensive catalog of wire harnesses and connector probes!
Free distribution of the comprehensive catalog for wire harness and connector probes (English version) is available now!! ★If you are interested, please contact us★ 【Overview】 We are the exclusive distributor in Japan for FEINMETALL, the world's largest manufacturer of probes for wire harness testing (Germany). We provide a one-stop solution with a wide range of product lineup. Custom specifications are also accepted. Whether it's high current, high frequency, rotation, switches, non-magnetic, heat-resistant... feel free to consult us about any probes. 【Product Examples】 ◆ Switch probe with an outer diameter of 1.0mm ◆ High current probe supporting up to 600A ◆ High frequency probe supporting up to 20GHz ◆ Semiconductor probe with a diameter of 0.20mm, total length of 3.3mm, spring pressure of 60g, and a lifespan of over 1 million cycles ★If you would like the comprehensive catalog (English version), please contact us★
If it's about contact probes. A wide range of product lineup. Custom manufacturing is also available.
You can easily select a probe that suits your purpose from a rich variety of options (sizes, chip shapes). Our wide product lineup provides a one-stop solution. Custom specifications are also available. ~ Industry-leading performance and quality ~ 【Product Examples】 ◆ Switch probe with an outer diameter of 1.0mm ◆ High current probe supporting up to 600A ◆ High-frequency probe supporting up to 20GHz ◆ Semiconductor probe with a diameter of 0.20mm, total length of 3.3mm, spring pressure of 60g, and a lifespan of over 1 million cycles ~ Cost reduction and improved cost performance ~ ◆ We support our customers in reducing costs and improving cost performance by proposing compatible in-house products. Free shipping. ■ High current, high frequency, rotary, switch, non-magnetic, heat-resistant, etc... Various options are available according to your needs. Please feel free to consult us about probes. * A simple document (in English) can be downloaded from this screen.
Turn Probes
This probe can reliably make contact with pads of lead-free solder that have a lot of flux and oxide film by rotating the probe tip between 40° and 70°.
Wire probe
It is a probe that utilizes the flexibility of tungsten wire, characterized by high pin pressure, stable contact resistance, and long lifespan.
Four-terminal probe (Kelvin Probes)
This is a contact probe that combines two terminals for measuring current and voltage into one in order to accurately measure small resistance values.
Push Back Probes
This is a probe that can determine good or bad quality by retracting the tip of the contact pin (plunger) based on the shape of the measurement target.
Rotation prevention probe
This is a probe equipped with a rotation prevention mechanism, necessary for using chips with an asymmetric tip shape.
Step Probes for Position Testing
This is a probe that comes in various tip shapes and sizes, and can also be used to determine the quality of pin insertion for wire harnesses and connectors.
Semiconductor probe
This is a probe used for IC socket contacts. In addition to movable types at both ends and one end, we also offer a long-lasting super pin series.
Contact probe for e-mobility
Supports standard pin diameters for E-mobility charging plugs (φ4mm/6mm/8mm/10mm).
Universal infrared touch probe with multi-directional measurement mechanism characteristics.
Universal Infrared Touch Probe with Multi-Directional Measurement Mechanism 【Features】 ○ Omnidirectional Probe: φ63 mm ○ Maximum Measurement Speed: 3m/min ○ Repeatability: 1μm 2σ ○ High Acceleration and High Measurement Speed ○ Reliable Infrared Data Communication ○ Proven Touch Characteristics even in Large Amounts of Coolant and Harsh Environments ○ Low Power Consumption ○ Wear-Free Measurement Mechanism Maintaining Long-Term Stability ○ Robust Design ○ Infrared Receiver Compatible with Other Bloom Measurement Equipment ○ Automatic Centering Stylus Eliminates Need for Re-Centering After Replacement ○ Dust and Water Resistant IP68 ● For more details, please download the catalog or contact us.
A probe that performs all types of tool length measurement quickly, accurately, and automatically.
A probe that automatically performs high-speed, high-precision measurement of all types of tool lengths. 【Features】 ○ Tool length measurement, tool breakage detection ○ Machine thermal displacement compensation (1 axis) ○ Minimum diameter of measuring tool: 0.5mm/HP 0.1mm ○ Repeatability: 0.5μm 2σ/HP 0.1μm 2σ ○ Long lifespan due to wear-free optical signal generation method ○ Compact and robust design ○ Capable of measuring brittle and small-diameter tools ○ Signal detection confirmation with the LED on the main unit ○ Easy operation ● For more details, please download the catalog or contact us.
It enables high speed and high precision in all directional orientations.
By using the all-direction touch probes TC50 and TC60, workpiece positioning and dimensional measurement within the machining center can be performed quickly and accurately. Unlike conventional probes, these do not use a three-point contact mechanism or switches sensitive to specific directions, allowing for high-speed and high-precision measurements in all directions. The TC52 and TC62, which enable high-precision measurements in all circumferential directions, are compact versions of the TC50 and TC60. 【Features】 ○ Reduced setup time ○ Realization of automation ○ Decreased scrap rate ○ Increased productivity ○ Enhanced product quality For more details, please contact us or download the catalog.
Enables high-speed, high-precision automatic tool setting and breakage detection within composite processing machines.
The touch probes TC53 and TC63 enable high-speed, high-precision automatic tool setting and breakage detection within composite machining machines. With a modular design and a variety of options and accessories, they can meet special customer requirements and accommodate a wide range of applications. These probes incorporate the newly announced patented technology, Shark 360 technology (a new type of face gear within the probe). The measurement mechanism of Shark 360 provides a new benchmark for accuracy and reliability in measurement technology within machine tools. 【Features】 ○ Innovative mechanism → Mechanism utilizing face gears → High precision even at speeds that apply moment to the stylus ○ Optical signal generation method → Wear-free signal generation method through light shielding by a small internal optical sensor → Output display via LED ○ Latest data communication technology → Reliable data communication using the latest infrared method or BRC radio wave technology → Multiple measuring devices can be switched using a single receiver (up to 2 devices for infrared, up to 6 devices for radio waves) For more details, please contact us or download the catalog.
It is a probe that integrates all the advantages of the Shark 360 measurement mechanism.
The TC54-10 and TC64-10 are probes that integrate all the advantages of the Shark 360 measurement mechanism into a compact Bloom standard touch probe. They are used in specialized applications such as composite machining, lathes, or machining centers with crank-type styluses. This probe adopts the newly announced patented technology, Shark 360 technology (a new type of face gear within the probe). The measurement mechanism of the Shark 360 provides a new benchmark for accuracy and reliability in measurement technology at machining centers. 【Features】 ○ Innovative mechanism → Mechanism employing face gear → High precision even at speeds where moments are applied to the stylus ○ Optical signal generation method → Wear-free signal generation method through light shielding by a small internal optical sensor → Output display via LED ○ Latest data communication technology → Reliable data communication using the latest infrared method or BRC radio wave technology → Multiple measuring devices can be switched using a single receiver (up to 2 devices for infrared, up to 6 devices for radio waves) For more details, please contact us or download the catalog.
It is used for quick and accurate automatic tool setting and work measurement.
The new TC76 is the most compact touch probe in Blum's TC series. It is used for quick and accurate automatic tool setting and workpiece measurement on grinding machines and multitasking machines. This probe incorporates the newly announced patented technology, Shark 360 technology (a new type of face gear inside the probe). The measurement mechanism of Shark 360 provides a new standard of accuracy and reliability in measurement technology for machining centers. 【Features】 ○ Innovative mechanism → Mechanism utilizing face gear → High precision even at speeds that apply moment to the stylus ○ Optical signal generation method → Wear-free signal generation method through light shielding by a small internal optical sensor → Output display via LED For more details, please contact us or download the catalog.
Quickly and reliably detect processing defects through analog scanning of the work surface.
Digital Log Revolution - BRC Radio Communication Technology. The Wireless Touch Probe TC64-DIGILOG is truly a digital log revolution, particularly suitable for machining centers and lathes. It quickly and reliably detects machining defects through analog scanning of the work surface. BRC radio communication technology wirelessly transmits the measured status signals to an external evaluation unit. Additionally, this system can also be utilized as a modular version of TC63-DIGILOG. 【Features】 ○ Reduced setup time ○ Realization of unmanned operation ○ Decreased scrap rate ○ Increased productivity ○ Enhanced product quality For more details, please contact us or download the catalog.
![[EMC] Local Electromagnetic Wave Irradiation Probe](https://image.mono.ipros.com/public/product/image/e76/2000634812/IPROS80313134879737467278.jpeg?w=280&h=280)
If you fail the EMS immunity test, it is possible to evaluate where the electromagnetic waves have entered (you can gain hints for resolving the issue!).
MT-676 Series Local Electromagnetic Wave Irradiation Probe - Adopted by automotive electronics development companies and EMC consulting firms - Possible to obtain hints for solutions if immunity tests fail - Identification (estimation) of vulnerable components and circuits that lead to malfunctions - Using a spectrum analyzer with a tracking generator as a signal source - Capable of acquiring the frequency profile of electromagnetic wave intrusion from external sources all at once - Causes of malfunctions can be separated into electric fields/magnetic fields This product was originally developed for research purposes related to "cryptographic security side-channel attacks, fault attacks" and "anti-tamper technology against implementation attacks." It is widely adopted by universities and research institutions both domestically and internationally. (It is used to evaluate the "vulnerability" where cryptographic keys can be deciphered due to malfunctions caused by "electromagnetic wave irradiation," one type of fault attack.) ElectroMagnetic Analysis and Fault Injection (EM Injection) onto Secure Circuits
To minimize size as much as possible in order to accurately capture the noise from various high-density electronic devices!
The "MHVC010" is an ultra-compact circular near-field probe with a maximum thickness of 2.5mm, compatible with frequencies up to 3GHz. It maintains electrical characteristic compatibility with our magnetic field probes VC010 and HC010. It can be attached to the measurement location, allowing for real-time measurements while the device under test is in operation. By attaching multiple probes to the device under test and operating it, noise intensity in various operating modes can be captured in real-time along the time axis. 【Features】 ■ Supports a wide bandwidth up to 3GHz and achieves an ultra-compact size with a maximum thickness of 2.5mm ■ High-density device noise can be pinpointed with a loop diameter of Φ1mm and a resolution of 0.39mm ■ Can be attached to the measurement location for real-time measurements while the product is in operation ■ By attaching to multiple locations, noise from various operating modes can be captured along the time axis ■ Provides reliable electrical characteristic compatibility with conventional magnetic field probes "VC010" and "HC010" *For more details, please download the PDF or feel free to contact us.
For those looking for an alternative of equivalent quality to the Olympus OMCL series, which has been discontinued! This is the most versatile AFM probe/cantilever.
This product is equivalent to the OMCL-AC160TS from Olympus, which has been discontinued. Therefore, it can be used in the same way as conventional Olympus AFM probes. <Features of SPM-AC160S-AS> 1. High-resolution measurement Combines a high Q value, a resonance frequency of 300 kHz (Typ.), and a spring constant of 26 N/m (Typ.) for softness. This minimizes damage to the sample and enables high-resolution measurement of surface roughness and high-sensitivity phase measurement. 2. Stable tip structure A stable sharp probe achieved through sharpening treatment and experience in manufacturing conventional probes. The adoption of a tetrahedral shape allows for easy confirmation of the positional relationship between the sample and the probe when measuring with an SPM device combined with an optical microscope, facilitating accurate positioning adjustments.
