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probe Product List and Ranking from 152 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. テクネ計測 Kanagawa//Testing, Analysis and Measurement
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 インクス Tokyo//Machine elements and parts
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probe Product ranking

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Contact Probe Long Stroke NCP Series サンケイエンジニアリング 本社
  4. Flexible wire サンケイエンジニアリング 本社
  5. 4 Capacitive Moisture Meter Probe M Series 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社

probe Product List

181～210 item / All 730 items

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Temperature and Humidity Sensor Probe "HC2A-IE Series"

Temperature and Humidity Sensor Probe "HC2A-IE Series"

For managing compressed air from compressors and high-pressure gas piping in factories! Measurement is possible under high-pressure environments.

Introducing the "HC2A-IE Series" of the HygroClip 2 Series, featuring a temperature and humidity sensor probe that achieves an accuracy of ±0.8% rh. It can be used for managing compressed air from compressors and high-pressure gas piping in factories, and thanks to its pressure-resistant structure, it allows for measurements in high-pressure environments. Please feel free to contact us if you have any inquiries. 【Features】 ■ Pressure-resistant probe ■ Sensor part has a pressure-resistant structure ■ Capable of measurements in high-pressure environments ■ Suitable for measurements under high pressure in piping, etc. *For more details, please refer to the PDF document or feel free to contact us.

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Humidity and Temperature Sensor Probe 'HC2-HP28'

Humidity and Temperature Sensor Probe 'HC2-HP28'

For warehouses and food factories! Use of penetrating shape sensors for temperature and humidity management of powders and grains!

Introducing the "HC2-HP28" from the HygroClip2 series, a temperature and humidity sensor probe that achieves an accuracy of ±0.8% RH. With a slim 10mm diameter and a penetrating sensor design, it enables temperature and humidity management for powders and grains. It is suitable for managing warehouses and food factories. Please feel free to contact us for inquiries. 【Features】 ■ Slim 10mm diameter ■ Enables temperature and humidity management for powders and grains with a penetrating sensor design ■ Suitable for managing warehouses and food factories *For more details, please refer to the PDF document or feel free to contact us.

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Laser Power Probe "Handheld Type" [Low Price, Easy Operation]

Laser Power Probe "Handheld Type" [Low Price, Easy Operation]

Macken Instruments' laser power probe is compact and highly portable, making it ideal for routine laser output checks.

Macken Instruments' laser power probe is compact and portable, allowing for quick and accurate measurement of laser output without the hassle of setup. With a robust metal construction, it has a long lifespan and is ideal for regularly checking laser output. The detector features coatings optimized for YAG lasers or CO2 lasers, and it offers a wide range of output options to accommodate measurements from 2W to 10kW. *There is also a digital probe available that can measure up to 11kW. Features of the laser power probe: - The absorber of the power probe is user-friendly in size, large enough for measurement while being compact enough to fit between optical devices without interfering with the optical system. - Measurement with the handheld meter takes about 1 minute. - The coating on the absorber is extremely durable, resistant to mechanical wear and water ingress. - It includes a zero adjustment mechanism to make the output measurement process quick and easy. - The precision and robust all-metal construction ensure a long product lifespan.

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HR-E 40-1 Set (Electric Field Probe)

HR-E 40-1 Set (Electric Field Probe)

The corresponding frequency range is up to 40GHz! It is possible to identify the location of the electric field source.

The "HR-E 40-1 Set" is a product that includes the HR-E 40-1 electric field probe, which is a PCB emission near-field probe type. This probe enables electric field measurements of up to 40GHz. The probe head of the HR-E 40-1 can measure directly on individual conductor tracks, allowing for the identification of the location of electric field sources. 【Set Contents】 ■ HR-E 40-1: E-Field Probe up to 40GHz ■ CS-ESA: Viewer ChipScan-ESA Viewer Software/USB ■ HR-E char: Individual data for HR-E 40-1 ■ User Manual ■ Case *For more details, please download the PDF (English version) or feel free to contact us.

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100 Series EMC Probe

100 Series EMC Probe

Identifying the source of noise is very important for EMC countermeasures and design!

The "100 Series EMC Probe" is a product designed to identify and solve EMC issues. Models 100A, 100B, and 100C are loop probes for magnetic fields, while model 100D is a stub-shaped probe for electric fields. The loop probes are equipped with electrostatic shielding, which isolates them from common mode signals. As a result, they achieve excellent reproducibility. 【Features】 - Multiple loop sizes that provide suitable sensitivity and spatial resolution across various frequencies - Electrostatic shielding applied to the loop probes eliminates common mode pickup - Compact probe shape allows access to tight spaces - Sensitivity calibrated up to 3GHz (usage beyond 6GHz is also possible) - Capable of radiation and field generation for electromagnetic susceptibility testing *For more details, please refer to the related links or feel free to contact us.

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RF1 set (magnetic field and electric field probes)

RF1 set (magnetic field and electric field probes)

It is possible to measure electric and magnetic fields from 30MHz to 3GHz on electronic assemblies during the development process!

The "RF1 Near-Field Probe Set" includes four passive magnetic field probes and one dedicated cable. The probe heads in this set allow for measurements very close to electronic assemblies. It can inspect IC pins, conductive paths, components, and connectors, and identify sources of interference. 【Set Contents】 ■RF-K 7-4: H-Field Probe 30MHz to 1GHz ■RF-U 2.5-2: H-Field Probe 30MHz to 3GHz ■RF-R 3-2: H-Field Probe 30MHz to 3GHz ■RF-E 10: E-Field Probe 30MHz to 3GHz ■SMB-BNC: 1m cable ■Case *For more details, please refer to the related links or feel free to contact us.

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RF3 Mini Set (Magnetic Field Probe)

RF3 Mini Set (Magnetic Field Probe)

The direction and distribution of the magnetic field in the electronic assembly can also be detected!

The "RF3 Mini Set" includes two passive magnetic field probes with a resolution of less than 1mm and one dedicated cable. It is capable of measuring electric and magnetic fields from 30MHz to 3GHz on electronic assemblies during the development process. It comes with a specially designed compact head that allows for detailed measurement of magnetic fields and interference currents in layout and component ranges. 【Set Contents】 ■RF-B 0.3-3: H-Field Probe mini 30MHz–3GHz ■RF-R 0.3-3: H-Field Probe mini 30MHz–3GHz ■SMB-BNC: 1m cable ■Case *For more details, please refer to the related links or feel free to contact us.

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HR-R 8-1(B field magnetic field probe)

HR-R 8-1(B field magnetic field probe)

The probe includes a current attenuator and has a built-in 50Ω impedance matching network!

The "HR-R 8-1 Magnetic Field Probe" is a passive near-field probe that covers a frequency range of up to 40GHz. The probe head is isolated from the cable shield by a special attenuation system. This product allows for direct magnetic field measurements on IC pins and conductor tracks, enabling the identification of magnetic field sources. 【Specifications】 ■ Type: Near-field Probe ■ Size: 9x9mm Probe Head ■ Supported Frequency Range: Up to 40GHz ■ Connector: 2.92mm female, Jack *For more details, please refer to the related links or feel free to contact us.

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HR-E 40-1 (E field electric field probe)

HR-E 40-1 (E field electric field probe)

The probe includes a current attenuator and has a built-in 50Ω impedance matching network!

The "HR-E 40-1 Electric Field Probe" is a passive near-field probe that covers a frequency range of up to 40GHz. The probe head is isolated from the cable shield by a special attenuation system. Additionally, the probe includes a current attenuator and has a built-in 50Ω impedance matching network. 【Specifications】 ■ Type: Near-field Probe ■ Size: Chip-type (distance to internal electrode 0.5mm) ■ Supported Frequency Range: Up to 40GHz ■ Connector: 2.92mm female, Jack ■ Resolution: 0.2mm *For more details, please refer to the related links or feel free to contact us.

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SX-B 3-1 (H field magnetic field probe)

SX-B 3-1 (H field magnetic field probe)

The current attenuation sheath provides strong electrical shielding!

We would like to introduce the "SX-B 3-1 (H field magnetic field probe)" that we handle. The internal coil is arranged perpendicular to the shaft, allowing for accurate measurements when the probe head is used vertically against the assembly or device being measured. Since the probe head is very small, it can be approached from above to access printed circuit boards and other components that are difficult to reach. It detects magnetic field lines radiating at a 90° angle from the object being measured, while it does not detect magnetic field lines entering from the side. 【Specifications】 ■ Type: Near-field probe ■ Size: Φ4mm probe head ■ Frequency range: 1GHz to 10GHz ■ Connector: SMA female, Jack ■ Resolution: 2mm *For more details, please refer to the related links or feel free to contact us.

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XF-R 100-1 (H field magnetic probe)

XF-R 100-1 (H field magnetic probe)

The XF series magnetic field probes have a built-in 50Ω termination resistor!

The "XF-R 100-1" magnetic field probe is a passive near-field probe designed to measure assemblies, devices, and cables up to 3 cm away. Its wide bandwidth and high linearity allow for the identification of large components that may cause interference. In terms of head size, sensitivity, and resolution, it offers performance that is intermediate between the "XF-R 400-1" and "XF-R 3-1" probes. 【Specifications】 ■ Type: Near-field probe ■ Size: 10x10mm probe head ■ Frequency range: 30MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: Φ10mm *For more details, please refer to the related links or feel free to contact us.

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XF-R 3-1(H field magnetic field probe)

XF-R 3-1(H field magnetic field probe)

Ideal for measurements close to components with high magnetic field strength!

The "XF-R 3-1" magnetic field probe is a passive near-field probe. It directly detects RF magnetic fields on the assembly with high resolution, including IC pins, IC cases, conductive paths, decoupling capacitors, and surrounding areas of EMC components. It has the same basic structure as the "XF-R 100-1" and "XF-R 400-1" probes, but this product has a significantly higher resolution. 【Specifications】 ■ Type: Near-field probe ■ Size: Φ3mm probe head ■ Frequency range: 30MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: 1mm *For more details, please refer to the related links or feel free to contact us.

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XF-U 2.5-1 (H field magnetic field probe)

XF-U 2.5-1 (H field magnetic field probe)

Can be connected to a 50Ω input spectrum analyzer or oscilloscope!

The "XF-U 2.5-1" magnetic field probe is a passive near-field probe designed to selectively detect RF currents in conductive paths, SMD components, and IC pins. The probe head features a magnetically active gap of approximately 0.5mm, which is positioned over the measurement target during measurement. Langer's near-field probes are compact and very easy to use, and they are also electrically well-shielded due to the current attenuation sheath. 【Specifications】 ■ Type: Near-field probe ■ Size: Φ4mm probe head ■ Frequency range: 30MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: 0.5mm *For more details, please refer to the related links or feel free to contact us.

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RF-R 50-1 (H field magnetic field probe)

RF-R 50-1 (H field magnetic field probe)

The larger head allows for the detection of larger components as potential sources of interference!

The "RF-R 50-1" magnetic field probe is a passive near-field probe designed to measure assemblies, devices, or cables located up to 3 cm away. The probe head of this product has a diameter of 10 mm, which results in lower sensitivity compared to the 25 mm diameter "RF-R 400-1," but it offers high resolution. It can be connected to a spectrum analyzer or oscilloscope with a 50Ω input. The RF series magnetic field probes do not have a built-in 50Ω termination resistor. 【Specifications】 ■ Type: Near-field probe ■ Size: Φ10mm probe head ■ Frequency range: 30MHz to 3GHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

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RF-R 3-2 (H field magnetic field probe)

RF-R 3-2 (H field magnetic field probe)

Suitable for measurements close to components in high magnetic field strength!

The "RF-R 3-2" magnetic field probe is a passive near-field probe. It directly detects RF magnetic fields on the assembly with high resolution, including IC pins, IC cases, conductive paths, decoupling capacitors, and surrounding EMC components. It has the same basic structure as the "RF-R 50-1" and "RF-R 500-1" probes, but this product offers significantly higher resolution. 【Specifications】 ■ Type: Near-field probe ■ Size: Φ3mm probe head ■ Frequency range: 30MHz to 3GHz ■ Connector: SMB male, Jack ■ Resolution: 1mm *For more details, please refer to the related links or feel free to contact us.

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RF-R 0.3-3 (H field magnetic field probe)

RF-R 0.3-3 (H field magnetic field probe)

The "RF-R 50-1" and "RF-R 400-1" probes have the same basic structure, but with much higher resolution!

The "RF-R 0.3-3" magnetic field probe is a passive near-field probe. Equipped with a compact probe head, it can measure magnetic fields with very high resolution, detecting even small components as interference sources. It also allows access to narrow spaces. It directly detects RF magnetic fields on assemblies with high resolution around IC pins, IC cases, conductive paths, decoupling capacitors, and EMC components. 【Specifications】 ■ Type: Near-field probe ■ Size: Φ2.0mm probe head ■ Frequency range: 30MHz to 3GHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

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RF-U 2.5-2 (H field magnetic field probe)

RF-U 2.5-2 (H field magnetic field probe)

Can be connected to a 50Ω input spectrum analyzer or oscilloscope!

The "RF-U 2.5-2" magnetic field probe is a passive near-field probe designed to selectively detect RF currents in conductive paths, SMD components, and IC pins. The probe head features a magnetically active gap of approximately 0.5mm, allowing for direct placement on the measurement target for assessment. It has the same basic structure as the "RF-U 5-2," but is more suitable for detecting smaller areas. 【Specifications】 ■ Type: Near-field probe ■ Size: Φ4mm probe head ■ Frequency range: 30MHz to 3GHz ■ Connector: SMB male, Jack ■ Resolution: 0.5mm *For more details, please refer to the related links or feel free to contact us.

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RF-K 7-4 (H field magnetic field probe)

RF-K 7-4 (H field magnetic field probe)

Detecting the uneven magnetic field entering the probe head surface without detecting the magnetic field lines entering from the side!

The "RF-K 7-4" magnetic field probe is a passive near-field probe that detects semicircular magnetic field lines entering the probe head in the opposite direction. The semicircular magnetic field lines are generated along linear, rod-like structures, cable connectors, and the edges of planar structural components. The probe functions like a coupling clamp. It does not detect overlapping uniform magnetic fields. 【Specifications】 ■ Type: Near-field probe ■ Size: 6x10mm probe head ■ Frequency range: 30MHz to 1GHz ■ Connector: SMB male, Jack ■ Resolution: 5mm *For more details, please refer to the related links or feel free to contact us.

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RF-E 09 (E field electric field probe)

RF-E 09 (E field electric field probe)

The same basic structure as the "RF-E 03" and "RF-E 04" probes!

The RF-E 09 electric field probe is a passive near-field probe designed for use with scanners manufactured by Langer. The electrodes of the probe head detect separated electric fields on the surface of ICs. It functions well within a distance of 0.5 to 10 mm from the assembly. By placing and holding small square electrode surfaces on components or printed circuit boards, it can detect sources of electrical interference. 【Specifications】 ■ Type: Near-field probe ■ Size: 10x10 mm probe head ■ Frequency range: 30 MHz to 3 GHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

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LF-R 400 (H field magnetic probe)

LF-R 400 (H field magnetic probe)

The larger the tip diameter, the higher the sensitivity, allowing for the detection of a wider area of the magnetic field!

The "LF-R 400 Magnetic Field Probe" is a passive near-field probe with a head size of 25mm in diameter, featuring high sensitivity and suitable for measurements within a maximum range of 10cm around assemblies and devices. Langer's near-field probes are compact and very easy to use, and they are electrically well shielded due to the current-damping sheath. It can be connected to a spectrum analyzer or oscilloscope with a 50Ω input. The magnetic field probes in the "LF series" do not have a built-in 50Ω termination resistor. 【Specifications】 ■ Type: Near-field Probe ■ Size: Φ25mm Probe Head ■ Frequency Range: 100kHz to 50MHz ■ Connector: SMB male, Jack *For more details, please refer to the related links or feel free to contact us.

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LF-B 3 (H field magnetic field probe)

LF-B 3 (H field magnetic field probe)

You can approach difficult-to-access printed circuit boards, etc., that are sandwiched between components from above!

The "LF-B 3 Magnetic Field Probe" is a passive near-field probe, with the internal coil arranged perpendicular to the shaft. When the probe head is used vertically against the assembly or device being measured, accurate measurements can be obtained. This product detects magnetic field lines radiating at a 90° angle from the object being measured and does not detect magnetic field lines entering from the side. Langer's near-field probes are compact and very easy to use, and they are electrically well-shielded by a current-damping sheath. 【Specifications】 ■ Type: Near-field Probe ■ Size: Φ4mm Probe Head ■ Frequency Range: 100kHz to 50MHz ■ Connector: SMB male, Jack ■ Resolution: 2mm *For more details, please refer to the related links or feel free to contact us.

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LF-K 7 (H field magnetic field probe)

LF-K 7 (H field magnetic field probe)

Half-circular magnetic field lines are generated along the edges of linear, rod-shaped components, cable connectors, and flat structural parts.

The "LF-K 7 Magnetic Field Probe" is a passive near-field probe that detects semicircular magnetic field lines using two coils. The probe functions like a coupling clamp. Unlike the "LF-U 5" probe, it does not detect magnetic field lines entering from the side. The magnetic field enters through the first coil, curves in a circular shape within the probe head, and detects the uneven magnetic field exiting through the second coil. It does not detect overlapping uniform magnetic fields. 【Specifications】 ■ Type: Near-field probe ■ Size: 6×10mm probe head ■ Frequency range: 100kHz to 50MHz ■ Connector: SMB male, Jack ■ Resolution: 5mm *For more details, please refer to the related links or feel free to contact us.

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MFA 01 Set (Active Magnetic Field Probe)

MFA 01 Set (Active Magnetic Field Probe)

Each microprobe has a built-in preamplifier! The delivery includes correction data.

The "MFA 01 Set" includes three high-resolution magnetic field microprobes capable of measuring magnetic fields up to 6GHz in signal conductors (150μm), SMD components, or IC pins, along with a bias tee and a dedicated cable. Each microprobe has a built-in preamplifier. The preamplifier (9V, 100mA) is powered through a bias tee BT 706 with a 50-ohm impedance, and the magnetic field microprobes are connected to a spectrum analyzer or oscilloscope via the BT 706. 【Specifications】 ■ Type: PCB Emission Near-Field Microprobe ■ Supported Frequency Range: 1MHz to 6GHz *For more details, please refer to the related links or feel free to contact us.

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MFA-K 0.1-12 (Magnetic Field Microprobe)

MFA-K 0.1-12 (Magnetic Field Microprobe)

Equipped with a very small probe head that functions like a coupling clamp, it is suitable for measuring RF magnetic fields up to 6 GHz.

The "MFA-K 0.1-12 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. It is capable of measuring current on IC pins and fine conductive paths (150μm) on components. It has the same basic structure as the "MFA-K 0.1-30," but with different frequency characteristics. Thanks to its special probe head design, it does not detect magnetic field lines generated from adjacent conductors. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 100MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: 200μm *For more details, please refer to the related links or feel free to contact us.

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MFA-R 0.2-75 (Magnetic Field Microprobe)

MFA-R 0.2-75 (Magnetic Field Microprobe)

Equipped with a very small and high-resolution probe head, it is suitable for measuring RF magnetic fields up to 1 GHz.

The "MFA-R 0.2-75 Magnetic Field Micro Probe" is an active near-field microprobe that requires a BT 706 bias tee to operate. The probe head has a built-in preamplifier (9V, 100mA), and power is supplied through the BT 706 with an impedance of 50Ω, allowing connection to a spectrum analyzer or oscilloscope via the BT 706. Langer's near-field microprobes are ultra-compact and very easy to use, and they are electrically well-shielded due to the current-damping sheath. 【Specifications】 ■ Type: Near-field microprobe ■ Size: Microchip-like ■ Frequency range: 1MHz to 1GHz ■ Connector: SMA female, Jack ■ Resolution: 300μm *For more details, please refer to the related links or feel free to contact us.

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MFA-K 0.1-30 (Magnetic Field Microprobe)

MFA-K 0.1-30 (Magnetic Field Microprobe)

Equipped with a very small probe head that functions like a coupling clamp, it is suitable for measuring RF magnetic fields up to 1 GHz.

The "MFA-K 0.1-30 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. The direction of the coil in the probe head is marked with a black dot, so please check the orientation before measurement. Additionally, the delivery includes calibration data. Please use the calibration data to convert the probe's output voltage to either the magnetic field or the current flowing through the conductor. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 1MHz to 1GHz ■ Connector: SMA female, Jack ■ Resolution: 200μm *For more details, please refer to the related links or feel free to contact us.

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CM-SHP Custom Probe

CM-SHP Custom Probe

Langer Corporation also manufactures special-shaped near-field probes according to customer requirements!

At Teess Japan Co., Ltd., we handle the "CM-SHP Custom Probe." Langer manufactures special-shaped near-field probes according to customer requirements. Please feel free to contact us when you need assistance. 【Specifications】 ■ Type: Near-field Probe *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment
  • probe

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OCT probe

OCT probe

A wide variety of probes are available, including handheld types and microscope types!

We offer "probes" that can be used as custom options for the SS-OCT system and OEM products. We have a variety of probes in our lineup, including the "handheld type," which is used by pressing it against the sample, and the "microscope type," which allows for measurements while confirming the measurement position. 【Features】 ■ Handheld Type - Measures by pressing against the sample held in hand - Distance to the measurement object can be changed with attachments, enabling 3D measurements ■ Microscope Type - High-precision sample positioning using an XYZ stage - Allows for measurements while confirming the measurement position *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • probe

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Rental of diver-held cathodic protection probes

Rental of diver-held cathodic protection probes

Start measuring immediately with one button!

Active in the investigation of underwater structures such as bridge pillars! Useful for regular inspections of sacrificial anodes that protect the base material. *For more details, please refer to the catalog available for download below under "PDF Download." You can also request a quote through "Contact Us." Feel free to reach out.

  • probe
  • Rental/lease
  • probe

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Nano probe for SEM-FIB, micro probe for optical microscope

Nano probe for SEM-FIB, micro probe for optical microscope

The self-driving nano-probe robot 'miBot', which is different from conventional manipulators!

This innovative nano-probing system can control up to eight miBot nano-probers and can be offered with various configurations and options. Customization is possible to meet application-specific requirements and installation conditions for the equipment. The compact and lightweight platform for miBot can be adapted to various electron microscopes and can be mounted on sample stages such as SEM or introduced into the sample chamber via a load lock. It also supports high-resolution imaging using semi-in-lens objective lenses, enabling nano-probing tests under high-resolution imaging at low acceleration voltages below 0.5 kV using the new FE-SEM. Additionally, it is possible to tilt the entire nano-probing system using the tilt mechanism of the SEM sample stage. This allows for circuit modification with FIB and nano-probing to be performed in the same environment, resulting in faster and more accurate failure analysis results. *For more details, please refer to the PDF document or feel free to contact us.*

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  • probe
  • probe

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