probeのメーカーや取扱い企業、製品情報、参考価格、ランキングをまとめています。
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probe - メーカー・企業155社の業務用製品ランキング | イプロスものづくり

更新日： 集計期間:Oct 14, 2026～Nov 10, 2026
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probeのメーカー・企業ランキング

更新日： 集計期間:Oct 14, 2026～Nov 10, 2026
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクネ計測 本社、本社テクニカルセンター、大阪営業所、福岡営業所 Kanagawa//Testing, Analysis and Measurement
  3. テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  4. 4 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
  5. 5 テクノプローブ Chiba//Testing, Analysis and Measurement
企業ランキングへ

probeの製品ランキング

更新日： 集計期間:Oct 14, 2026～Nov 10, 2026
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  4. 4 Capacitive Moisture Meter Probe M Series Crane Japan Co., Ltd Formerly Baker Hughes Japan Co., Ltd.
  5. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

probeの製品一覧

211～240 件を表示 ／ 全 759 件

表示件数
MFA-K 0.1-12 (Magnetic Field Microprobe)

MFA-K 0.1-12 (Magnetic Field Microprobe)

Equipped with a very small probe head that functions like a coupling clamp, it is suitable for measuring RF magnetic fields up to 6 GHz.

The "MFA-K 0.1-12 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. It is capable of measuring current on IC pins and fine conductive paths (150μm) on components. It has the same basic structure as the "MFA-K 0.1-30," but with different frequency characteristics. Thanks to its special probe head design, it does not detect magnetic field lines generated from adjacent conductors. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 100MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: 200μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment
  • probe

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MFA-R 0.2-75 (Magnetic Field Microprobe)

MFA-R 0.2-75 (Magnetic Field Microprobe)

Equipped with a very small and high-resolution probe head, it is suitable for measuring RF magnetic fields up to 1 GHz.

The "MFA-R 0.2-75 Magnetic Field Micro Probe" is an active near-field microprobe that requires a BT 706 bias tee to operate. The probe head has a built-in preamplifier (9V, 100mA), and power is supplied through the BT 706 with an impedance of 50Ω, allowing connection to a spectrum analyzer or oscilloscope via the BT 706. Langer's near-field microprobes are ultra-compact and very easy to use, and they are electrically well-shielded due to the current-damping sheath. 【Specifications】 ■ Type: Near-field microprobe ■ Size: Microchip-like ■ Frequency range: 1MHz to 1GHz ■ Connector: SMA female, Jack ■ Resolution: 300μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment
  • probe

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MFA-K 0.1-30 (Magnetic Field Microprobe)

MFA-K 0.1-30 (Magnetic Field Microprobe)

Equipped with a very small probe head that functions like a coupling clamp, it is suitable for measuring RF magnetic fields up to 1 GHz.

The "MFA-K 0.1-30 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. The direction of the coil in the probe head is marked with a black dot, so please check the orientation before measurement. Additionally, the delivery includes calibration data. Please use the calibration data to convert the probe's output voltage to either the magnetic field or the current flowing through the conductor. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 1MHz to 1GHz ■ Connector: SMA female, Jack ■ Resolution: 200μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment
  • probe

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CM-SHP Custom Probe

CM-SHP Custom Probe

Langer Corporation also manufactures special-shaped near-field probes according to customer requirements!

At Teess Japan Co., Ltd., we handle the "CM-SHP Custom Probe." Langer manufactures special-shaped near-field probes according to customer requirements. Please feel free to contact us when you need assistance. 【Specifications】 ■ Type: Near-field Probe *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment
  • probe

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OCT probe

OCT probe

A wide variety of probes are available, including handheld types and microscope types!

We offer "probes" that can be used as custom options for the SS-OCT system and OEM products. We have a variety of probes in our lineup, including the "handheld type," which is used by pressing it against the sample, and the "microscope type," which allows for measurements while confirming the measurement position. 【Features】 ■ Handheld Type - Measures by pressing against the sample held in hand - Distance to the measurement object can be changed with attachments, enabling 3D measurements ■ Microscope Type - High-precision sample positioning using an XYZ stage - Allows for measurements while confirming the measurement position *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • probe

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Nano probe for SEM-FIB, micro probe for optical microscope

Nano probe for SEM-FIB, micro probe for optical microscope

The self-driving nano-probe robot 'miBot', which is different from conventional manipulators!

This innovative nano-probing system can control up to eight miBot nano-probers and can be offered with various configurations and options. Customization is possible to meet application-specific requirements and installation conditions for the equipment. The compact and lightweight platform for miBot can be adapted to various electron microscopes and can be mounted on sample stages such as SEM or introduced into the sample chamber via a load lock. It also supports high-resolution imaging using semi-in-lens objective lenses, enabling nano-probing tests under high-resolution imaging at low acceleration voltages below 0.5 kV using the new FE-SEM. Additionally, it is possible to tilt the entire nano-probing system using the tilt mechanism of the SEM sample stage. This allows for circuit modification with FIB and nano-probing to be performed in the same environment, resulting in faster and more accurate failure analysis results. *For more details, please refer to the PDF document or feel free to contact us.*

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  • probe
  • probe

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IN271F 製薬工業のプロセス用FT-NIR透過反射プローブ

IN271F 製薬工業のプロセス用FT-NIR透過反射プローブ

ブルカー社で開発した透過反射プローブによりスラリーやエマルジョンの測定が可能で、発酵/培養プロセスのモニタリングが可能です。

ブルカー社で開発した透過反射プローブによりスラリー、エマルジョン、乳製品、クリームの測定や、発酵槽中の反応モニタリングが可能です。お客様のご指定の各種フランジを溶接してご提供可能です。高温タイプもご提供可能です。

  • Other inspection equipment and devices
  • probe

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Verification of power integrity for DDR memory

Verification of power integrity for DDR memory

Perform low-noise measurements and provide an offset function that zooms in on the DC voltage.

Accurate ripple and noise measurements of power rails require a wideband oscilloscope and dedicated probes, providing an offset function to perform low-noise measurements and zoom in on DC voltage. The R&S RT-ZPR20 power rail probe, R&S RTE, and R&S RTO digital oscilloscopes are suitable tools for this measurement. [Challenges] ■ Direct impact on data transfer performance - Stability of the power distribution network reduces to just 60 mV (Vpp) for DDR4 memory - May decrease further in the future - Ripple and noise adversely affect clock and data jitter *For more details, please refer to the PDF document or feel free to contact us.*

  • Other measurement, recording and measuring instruments
  • oscilloscope
  • probe
  • probe

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Passive probe

Passive probe

A low-cost general-purpose probing solution compatible with various applications!

The "Passive Probe" is our standard oscilloscope accessory. Equipped with a BNC connector, it can be used with almost any oscilloscope. When a passive probe with lead-out pins is connected to our oscilloscope, the attenuation ratio is automatically detected. The built-in spring chip allows for reliable contact with the DUT. 【Features】 ■ Precision measurement with individual adjustments ■ Abundant accessories - Spare spring-loaded chips, rigid chips, ground contact springs, ground leads, color-coded rings *For more details, please download the PDF or feel free to contact us.

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  • probe
  • probe

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Active Wideband Probe

Active Wideband Probe

Ideal for spectrum analysis with a wide dynamic range and high linearity!

We offer a variety of "active wideband probes." These feature a high input impedance of 1 MΩ, a low input capacitance of less than 1 pF, and a wide dynamic range. They also include beneficial features such as offset correction, a high-precision built-in voltmeter, and convenient micro buttons for oscilloscope control. Please feel free to consult us when you need assistance. 【Features】 ■ Wideband design ■ Minimization of impact on measurement signals ■ Wide dynamic range and high linearity ■ Convenient measurement instrument control via built-in micro buttons ■ R&S ProbeMeter: built-in high-precision voltmeter ■ Built-in memory and future-proof probe interface *For more details, please download the PDF or feel free to contact us.

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  • probe
  • probe

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Modular wideband probe

Modular wideband probe

It features a wide probing bandwidth and dynamic range with low capacity load!

The "Modular Wideband Probe" is an easy-to-use solution that employs advanced technology to meet the requirements of current probing. It features a unique multi-mode capability, allowing users to switch between differential mode, common mode, and single-ended mode. The system includes probe chip modules to accommodate various measurements and conditions, and the built-in R&S ProbeMeter function enables high-precision DC voltage measurements to be performed simultaneously. 【Features】 ■ Amplifier modules with bandwidths ranging from 1.5GHz to 16GHz are available ■ Automatic detection and setup of the probe with our oscilloscopes ■ Equipped with a unique multi-mode function ■ Highly flexible, allowing setups for various measurements ■ Access to multiple probe points with a single probe chip *For more details, please download the PDF or feel free to contact us.

  • probe
  • probe

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Power rail probe

Power rail probe

Equipped with a high-precision DC voltmeter, allowing for immediate verification of the rail voltage!

The "Power Rail Probe" is a product that allows for instant measurement of DC voltage using a built-in high-precision DC voltmeter. With its wide bandwidth, high sensitivity, ultra-low noise, and very large offset correction, it is well-suited for evaluating power rail characteristics. It enables accurate ripple measurements with a bandwidth of up to 4.0 GHz, and its 1:1 attenuation ratio and low noise achieve excellent sensitivity. 【Features】 ■ Bandwidth of up to 4.0 GHz with extremely low added noise ■ Measurement of small voltages on large DC offsets ■ R&S ProbeMeter: Built-in high-precision DC voltmeter ■ Comprehensive accessory package *For more details, please download the PDF or feel free to contact us.

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  • probe
  • probe

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Optical Insulation Probe

Optical Insulation Probe

Achieving a high common mode rejection ratio over a wide frequency range!

We would like to introduce the "Optical Isolation Probe" that we handle. By adding the R&S RT-ZISO isolation probing system, we have expanded our portfolio for high-voltage and high-speed common mode signals. This enables us to support test applications for WBG and high-speed IGBT switch nodes. Various models allow measurements of up to 3000V in CAT III environments. 【Features】 ■ Eliminates the possibility of an electrical return path for common mode signals by using laser communication between the probe head and receiver. ■ Detailed signal measurements with 18-bit vertical resolution. ■ Detailed waveform analysis is also possible with features such as zone triggering and high-speed spectrum measurement. *For more details, please download the PDF or feel free to contact us.

  • probe
  • probe

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Spring Test Probe

Spring Test Probe

Standard products have a minimum pitch of 0.15 mm and a minimum product length of 1 mm. We also accommodate requests for sizes and shapes other than standard products!

We have prepared spring test probes, backed by the precision machining technology that we have cultivated since our founding and the analytical capabilities accumulated through research and development, as standard products for each pitch size to meet our customers' needs. *We also accept requests for products other than standard items. 【Features】 ■ Long lifespan: 1 million cycles durability → stable resistance value ■ High load: 35gf @ 0.5mm (0.4mm pitch) ■ Low resistance: from 50mΩ ■ Other varieties: minimum diameter of 0.08mm, shortest length of 1.0mm ■ Various surface treatments *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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RF probe and calibration board [Wide frequency range, pitch, excellent durability!]

RF probe and calibration board [Wide frequency range, pitch, excellent durability!]

An RF probe and calibration board with a wide frequency range, pitch, and excellent durability!

Our company offers RF probes and calibration substrates with a wide frequency range, pitch, excellent durability, all at a low price. Thanks to our unique tip shape, stable contact can be achieved with minimal skating during contact, reducing damage to devices and ensuring high reproducibility. The calibration assist software already has product data for the "Allstron TITAN Probe Series" registered, allowing you to use it immediately by simply selecting a probe. 【Product List】 ■Allstron RF Probe "TITAN" ■Allstron RF Probe "TITAN-RC" ■RF Calibration Substrates "AC" ■Calibration software "QAlibria" *For more details, please request materials or view the PDF data available for download.

  • probe
  • probe

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Modular exchange-type high-performance solid-state NMR MAS probe

Modular exchange-type high-performance solid-state NMR MAS probe

Multiple MAS probe heads can be exchanged for a single probe base.

The PHOENIX HXY Premium Probe is a high-performance MAS probe for solid-state NMR developed by PHOENIX NMR. It adopts a "probe head exchange system" that allows multiple MAS probe heads to be exchanged on a single probe base, enabling flexible system configuration according to rotor size and observed nuclei. Based on the T3 probe technology from the former Chemagnetics and Varian companies, it inherits high RF performance and excellent operability. It is capable of supporting a wide range of solid-state NMR applications, including multiple resonance experiments, low gamma nucleus measurements, and 2H Lock.

  • Analytical Equipment and Devices
  • probe

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SK Probe "Attacker AT-001" (Inspection Jig)

SK Probe "Attacker AT-001" (Inspection Jig)

Easy to use anywhere, lightweight, and doesn't cause fatigue - a handy type.

■Features ● Handheld connector terminal insertion failure inspection tool ● Excellent portability with a user-friendly compact design ● Highly reliable design that quickly identifies good and defective products using LED and buzzer ● Simple operation by just pressing the plunger of the attacher against the connector terminal ● Easy replacement of probe pins to match the shape of the connector terminals ■Diagnostic Items ● Terminal disconnection ● Terminal misalignment ● Terminal absence ■Standard Products (Cartridge) Includes one each of S-302-20, S-303-20, and S-305-10. *For other shapes and spring pressures, please choose the 30 series with switch-equipped probes.

  • Circuit Board Inspection Equipment
  • Other inspection equipment and devices
  • probe

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Tohoku University Technology: Visualization Probe for Protein Denaturation: T21-051

Tohoku University Technology: Visualization Probe for Protein Denaturation: T21-051

A method for chemically labeling denatured regions of proteins.

To visualize protein denaturation, conventional methods have developed chemical probes that bind to denatured regions of proteins, resulting in increased fluorescence intensity. However, the binding between traditional fluorescent probes and denatured protein regions was reversible. Therefore, in protein mixtures, it was difficult to link which protein's denaturation was causing the increase in fluorescence intensity. The fluorescent probe invented by Professor Shinichi Sato and his team at the Interdisciplinary Science Frontier Research Institute distinguishes itself from conventional denatured protein probes by forming a direct covalent bond with the denatured and aggregated sites of proteins. Additionally, it is a non-fluorescent molecule before the reaction and only emits fluorescence when it forms a covalent bond with aggregated proteins. Approximately 30 types of probes with varying detection sensitivities for denaturation have been developed so far. Furthermore, there are methods to concentrate the denatured and aggregated proteins, as well as their peptide fragments, allowing for mass spectrometry analysis of only the proteins that reacted with the probe.

  • others
  • probe

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AC current probe "CWT"

AC current probe "CWT"

Easy to use with a thin and soft material! Current probe for power electronics development.

High-frequency 50MHz compatible! Rogowski coil type current probe The 【CWT Mini50HF】 is a Rogowski coil type current probe compatible with high frequency 50MHz (-3dB), manufactured by PEM (Power Electronic Measurements). The tip is detachable and made of a soft material that is thin and easily bendable, making it user-friendly and capable of accurately reproducing fast current waveforms, including sine waves, quasi-sine waves, and pulse waveforms. It is suitable for the development and analysis of power converters. 【Features】 ■ Detachable tip ■ Usable with digital voltmeters and power recorders *For more details, please refer to the catalog. Feel free to contact us with any inquiries.

  • Ammeter
  • Analytical Equipment and Devices
  • probe
  • probe

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AC Current Probe "CMC"

AC Current Probe "CMC"

Common mode noise measurable current probe

Variable speed drives used for controlling AC motors can generate significant high-frequency PWM (Pulse Width Modulation) voltage on the machine's shaft, which may lead to arc currents flowing through the shaft. This current can potentially result in early failure of the motor drive, leading to overheating and melting. The common mode current that occurs in such motors and shafts can be measured using a new current probe called 'CMC.' CMC can also be used for various other applications.

  • EMC/Static electricity measuring equipment
  • AC Motor
  • Metal bearings
  • probe

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AC Current Probe "CWT LF"

AC Current Probe "CWT LF"

Low-frequency specialized current probe

This is a current probe specialized for low frequencies, with less droop compared to other CWT series. The tip is detachable and made of a thin, flexible material that can be easily bent, making it user-friendly and capable of accurately reproducing fast current waveforms, sine waves, quasi-sine waves, and pulse waveforms. It is battery-operated for easy handling, but can also be powered by an AC adapter. Please feel free to contact us.

  • inverter
  • Other semiconductors
  • probe

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MEMS spring probe

MEMS spring probe

Achieving the production of the world's smallest class springs!

We have achieved the production of the world's smallest class springs through our unique patented technology. We have developed a vertical MEMS spring probe combined with ultra-small plungers. These can be incorporated into fixtures for PCB inspection and probe cards, and are suitable for electrical testing of semiconductors and printed circuit boards. In addition to the ability to select the tip shape of the DUT plunger, we can meet your desired load and stroke through custom design. Please feel free to contact us.

  • probe
  • Inspection fixture
  • Circuit Board Inspection Equipment
  • probe

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Ultra-fine spring (outer diameter less than Ф100μm)

Ultra-fine spring (outer diameter less than Ф100μm)

World-class technology and achievements for catheters and semiconductor testing equipment.

Currently, the demand for small springs is rapidly increasing. There are various applications, including contact springs, connector springs, and coil springs used in medical catheters, among others. Among these, the springs used in semiconductor testing equipment are particularly in demand in the microscopic world. They serve the purpose of checking whether current is flowing through the electronic circuits of semiconductors. These are ultra-fine springs with an outer diameter of less than Ф100μm, and there are only a limited number of companies in Japan that can produce them.

  • Spring
  • probe

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Spring, manufacturing and processing of springs

Spring, manufacturing and processing of springs

Leave the processing and manufacturing of springs to us!

Matsumoto Spring Co., Ltd. manufactures coil and torsion springs, as well as wire processing. We are equipped with facilities such as coiling machines and forming machines. For more details, please download our catalog.

  • Spring
  • probe

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High-speed response ultra-thin thermocouple probe for gas temperature measurement

High-speed response ultra-thin thermocouple probe for gas temperature measurement

Measures gas temperature with a high-speed response of up to 4 ms. Robust and long-lasting.

This product is a high-speed response thermocouple with a minimum wire diameter of approximately 12.7 microns. It can be securely installed on test specimens and is suitable for applications that require high strength, such as engines, various internal combustion engines, and air compressors.

  • Thermometer
  • probe

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Insulated probes, FET probes, wideband low-capacitance probes, and others.

Insulated probes, FET probes, wideband low-capacitance probes, and others.

We offer a wide range of probes and probe-related products.

At Stack Electronics Co., Ltd., we supply voltage probes for oscilloscopes, which are essential for high-frequency measurements, under OEM contracts as the only Made in Japan brand to all domestic oscilloscope manufacturers and renowned overseas manufacturers. We also handle a variety of original brand probes from Stack Electronics. 【Product Types】 ○ Insulated Probes ○ FET Probes ○ Wideband Low-Capacity Probes ○ Probe Accessories For more details, please contact us or download the catalog.

  • probe
  • probe

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*Improvement Case: Measurement and Three-Way Probe - Materials Available!

*Improvement Case: Measurement and Three-Way Probe - Materials Available!

Since there was a three-way probe, it was utilized! Calibration is no longer necessary at all.

Here is an introduction to a case study regarding the three-way probe. When measuring the positional accuracy at three equally divided points, it was necessary to bend the probe to match each angle and perform calibration four times. However, with the use of the three-way probe, calibration became completely unnecessary. ★Case Study ■Subject: Three-way Probe ■Standard Practice: Utilization of Auxiliary Tools ■Effect: Improved workability and reduced work time Our company is engaged in research and development, as well as small-lot manufacturing, across a wide range of fields including medical devices, aerospace, optics, electronics, and office automation. We produce high-precision, high-quality items daily, such as oxygen-free copper "accelerator tubes" on the micron order and "thruster injectors" used in satellites. #AcceleratorTube #ThrusterInjector *For more details, please refer to the PDF document or feel free to contact us. When inquiring, please reach out through the related link (inquiry form) below.

  • Other services
  • probe

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Low Voltage Current Detection Fuse Probe

Low Voltage Current Detection Fuse Probe

Directly detect the low voltage current value of the vehicle from the fuse box. You can measure the circuit current without modifying the vehicle's wiring.

By simply plugging it directly into the vehicle's fuse box, you can detect circuit current using a shunt resistor without modifying the vehicle's wiring. The shunt resistor is built into an aluminum housing, and circuit protection can be achieved by inserting the original fuse into the aluminum housing, ensuring that the fuse rating is not mistaken. This allows for safe and easy detection of the vehicle's current value.

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  • Other measurement, recording and measuring instruments
  • probe

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Imasonic ultrasonic probe

Imasonic ultrasonic probe

High quality and long lifespan. A leading manufacturer of ultrasonic probes with outstanding performance and reliability, holding a global market share, specializing in custom array probes.

Imasonic, located in Besançon, eastern France, has been a leading manufacturer of ultrasonic probes for the medical and industrial sectors since its founding in 1989, boasting world-class technology in design and manufacturing. Over the past 30 years, it has evolved multiple generations of ultrasonic transducers incorporating piezo composite materials. This technology is recognized in the market for its outstanding performance and reliability. Based on a wealth of achievements and experience that meet the advanced NDT technology demands worldwide, we propose, design, and manufacture probes tailored to our customers' applications. The phased array probe, synonymous with Imasonic, has been offered since our founding in 1989, providing a wide range of array probes in the field of non-destructive testing. The high volume of repeat orders is a testament to its exceptional performance and reliability that meet advanced requirements.

  • probe
  • probe

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