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probe Product List and Ranking from 154 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. Sankotsusho Tokyo//Industrial Electrical Equipment
  3. テクノプローブ Chiba//Testing, Analysis and Measurement
  4. 4 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
  5. 5 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社 Tokyo//Testing, Analysis and Measurement
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probe Product ranking

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  4. 4 Capacitive Moisture Meter Probe M Series 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社
  5. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

probe Product List

241～270 item / All 721 items

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[Demo unit available] TFC Spring Separator

[Demo unit available] TFC Spring Separator

Automatically separates without damage! A spring separator that contributes to work efficiency.

The "TFC Spring Separator" is a device that automatically separates entangled springs without damaging them by rotating them. Thanks to our uniquely developed control technology, it can be designed to accommodate various supply conditions, significantly contributing to the efficiency of operations through appropriate processing. 【Features】 ■ The separator demonstrates high-precision separation capabilities regardless of the size, pitch, or shape of the springs. ■ Excellent processing capacity enables speedy spring supply. ■ The variable rotation speed helps to reduce noise. ■ By combining with a standard feeder, it achieves low costs and allows for the selection of controls suitable for the supply conditions. *For more details, please refer to the PDF document or feel free to contact us.

  • Separation device
  • probe

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コンタクトプローブ

コンタクトプローブ

高集積化に伴う狭ピッチ化やエリアアレイへの対応に優れたプローブピンをご紹介！

『コンタクトプローブ』は、狭ピッチ電極の電子部品検査に適した超極細径 のワイヤプローブです。 導体部には、パラジウム合金や、銅銀合金、タングステン、レニウムタング ステン、ベリリウム銅などを使用。 当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 境界面のシャープ化を実現しています。 【特長】 ■当社独自の製法により、極小部位への先端加工を実現 ■当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 　境界面のシャープ化を実現 ■特殊な表面処理により、絶縁コーティング表面の滑性を向上 ■パラジウム合金は、導体が酸化しにくい特長があり、接触抵抗の安定性が向上 ■酸化を嫌う半導体検査などに好適 ■30μmの極細径から対応可能 ※詳しくは外部リンクページをご覧いただくか、お気軽にお問い合わせ下さい。

  • probe
  • Other electronic parts
  • Terminal Blocks
  • probe

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Bear Board Tester Probe "C-0.38 Series"

Bear Board Tester Probe "C-0.38 Series"

Introducing contact probes compatible with a 0.7mm pitch, highly regarded worldwide!

At Nippon Denshin, we mainly manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" provide highly reliable products to the electronics industry, backed by many years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-0.38 series' is a probe for bare board testers compatible with a 0.7mm pitch. 【Features】 ■ Compatible with 0.7mm pitch ■ Five types of tip shapes ■ Lead wire processing for sockets is also possible ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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Probe for Bear Board Tester "C-0.72 Series"

Probe for Bear Board Tester "C-0.72 Series"

Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!

At Nippon Denshin, we primarily manufacture and sell contact probes for semiconductor and printed circuit board inspection. "DENSHIN'S contact probes" supply highly reliable products to the electronics industry, backed by years of experience, achievements, and a wealth of accumulated technology, with over 3,000 original types in stock. The 'C-0.72 series' is a probe for bare board testers compatible with a 1.27mm pitch. 【Features】 ■ Compatible with 1.27mm pitch ■ 9 types of tip shapes ■ Thorough quality control ■ Achieves stable high quality, low price, and short delivery times ■ Meets various needs *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • probe

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Selection Guide "Probe Selection Method"

Selection Guide "Probe Selection Method"

We are currently offering a guide that clearly explains the method for selecting probes with illustrations.

Japan Electric Needle offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types, and is distributing a "Probe Selection Method." 【Selection Procedure】 1. Check the pitch 2. Confirm the total length and distance to the target 3. Choose the tip shape 4. Determine the spring pressure We provide clear explanations with illustrations and tables. *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Inspection fixture
  • Processing Jig
  • probe

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High current probe "HC100 series" with a rated current of 12A.

High current probe "HC100 series" with a rated current of 12A.

Introducing a high current probe compatible with a 2.54mm pitch and rated for a current of 12A.

This is a new product from Nippon Denshin Co., Ltd., which has contributed to the development of the electronics industry, including contact probes, through years of experience, achievements, and a wealth of accumulated technology. It has a rated current of 12A and a shape similar to the commonly used 100mil probes. 【Specifications】 <Material and Surface Treatment> ■ Plunger: BeCu with Ni undercoating and Au plating ■ Spring: SUS ■ Sleeve: Phosphor bronze with Ni undercoating and Au plating ■ Socket: BST or Pb with Ni undercoating / Au plating <Compatible Sockets> ■ C-07-S8-N ■ C-1.37Q-S-1A Au *For more details, please request documentation or view the PDF data available for download.

  • Processing Jig
  • probe
  • probe

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Wire Probe "NW Series"

Wire Probe "NW Series"

Supports a minimum pitch of 0.11mm. Specification changes to match the shape of the device are also acceptable.

The "NW Series" is a wire probe designed for ultra-narrow pitch contacts. We offer three types: Φ0.07mm, Φ0.09mm, and Φ0.11mm. It strokes through "flexibility" and does not have a complex mechanism, enabling contact in narrow pitches that are difficult to achieve with spring probes. We also accommodate specification changes to match the shape of the device. It can be provided as a single unit or as a complete set with fixtures. 【Features】 ■ Compatible with wiring extraction ■ Two types of tip shapes available ■ Wide range of needs addressed from design to manufacturing *For more details, please refer to the documentation. Feel free to contact us with any inquiries.

  • others
  • probe

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Needle Probe [For Printed Circuit Boards and Semiconductor Package Continuity Testing Tool!]

Needle Probe [For Printed Circuit Boards and Semiconductor Package Continuity Testing Tool!]

Needle probes suitable for continuity testing fixtures for substrates (printed circuit boards and semiconductor packages)! Precision machining with a focus on quality!

The "NP (Needle Probe)" is a probe used for continuity testing fixtures of substrates (printed circuit boards and semiconductor packages). We offer a wide variety of tip shapes backed by reliable processing technology. Additionally, we have applied a plating treatment that is resistant to peeling. 【Features】 ■ Meticulous fine processing ■ Sharp edges ■ Step coating that pursues uniqueness (optional) *For more details, please request our materials or view the PDF data available for download.

  • probe
  • probe

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NMR probe for narrow gaps 'EFM-150P/EFS-150F'

NMR probe for narrow gaps 'EFM-150P/EFS-150F'

A product that allows for the absolute measurement of magnetic field strength using proton solid samples!

The "EFM-150P/EFS-150F" is an ultra-thin NMR probe designed for narrow gaps, achieving a thickness of 1.5mm using a newly developed ultra-flat sensor coil. It enables NMR measurements in gaps that were previously difficult to insert into. By inserting it into a small gap, measurements can be taken in areas with good magnetic field uniformity, significantly improving measurement accuracy and stability. Additionally, it can be combined with general-purpose magnetic field measuring instruments (Tesla meters and Gauss meters) such as the EFM-2000AX and EFM-3000AX, as well as the EFS-800 NMR sensor. 【Features】 ■ Newly developed ultra-flat sensor coil ■ Can be inserted into narrow magnetic pole gaps ■ Can be inserted into areas with good magnetic field uniformity ■ Measures absolute magnetic field using proton samples ■ Compatible with various NMR magnetic field measuring instruments (Tesla meters and Gauss meters) *For more details, please download the PDF or feel free to contact us.

  • 超薄型狭隙間用NMRプローブ『EFM-150PEFS-150F』2.JPG
  • probe
  • probe

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Optional probe for magnetic field measuring device

Optional probe for magnetic field measuring device

With a thickness of 6mm at the tip, it is suitable for cases where the gap for inserting the probe is narrow!

This product is an optional probe for magnetic field measurement devices (teslameters and gaussmeters) consisting of a transmission amplifier, a sample coil, and a modulation coil. The modulation coil is arranged to generate a modulation magnetic field parallel to the measured magnetic field. The sample coil is fixed in a direction that generates a high-frequency magnetic field orthogonal to this. The modulation coil comes in standard and axial types depending on the orientation, while the sample coil is available in a single-coil type and a multi-coil type arranged in proximity with 2 to 4 coils. 【Lineup (excerpt)】 ■ Standard probe EFM-1P ■ Thin probe EFM-2P ■ Low magnetic field probe EFM-20P ■ High magnetic field probe EFM-30P ■ Axial measurement probe EFM-10P *For more details, please download the PDF or feel free to contact us.

  • 磁場測定器用オプションプローブ2.JPG
  • 磁場測定器用オプションプローブ3.JPG
  • 磁場測定器用オプションプローブ4.JPG
  • 磁場測定器用オプションプローブ5.JPG
  • 磁場測定器用オプションプローブ6.JPG
  • 磁場測定器用オプションプローブ7.JPG
  • probe
  • probe

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Contact Probe

Contact Probe

Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!

We offer a wide variety of "contact probes," including high-frequency compatible probes, heat-resistant probes, coaxial probes, and ultra-fine probes (φ0.2 and above). Additionally, we can manufacture custom-made probes that are optimal for the shape of your device, so please feel free to consult us if you have any requests. 【Product Lineup】 ■ KHP-001 to 30 Series ■ KHS Series ■ KH-007 Series ■ KH-700 Series ■ KH-2000 Series, etc. *For more details, please download the PDF or feel free to contact us.

  • probe
  • probe

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Electromagnetic Thickness Probe 'Fe-20' for Film Thickness Gauge SWT [Rental]

Electromagnetic Thickness Probe 'Fe-20' for Film Thickness Gauge SWT [Rental]

This is an electromagnetic probe for SWT-8000-2, 9000, and 8200-2.

Measurement range: 0 to 20mm

  • Coating thickness gauge
  • probe

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Contract assembly and processing of semiconductors: LED chip probe

Contract assembly and processing of semiconductors: LED chip probe

We measure electrical characteristics, brightness, wavelength, and ESD. Inspections are conducted in wafer and sheet states, accommodating various specifications such as top surfaces and upper and lower electrodes!

Measurement of electrical characteristics, brightness, wavelength, and ESD. Depending on the supply form, inspections can be conducted in wafer or sheet state, accommodating various specifications such as top surface and upper and lower electrodes. Additionally, if probe testing is required from mass production to small quantities of prototypes, please feel free to consult us. 【Overview】 ■ Top surface and upper/lower electrodes: 2 to 4 inches ■ Back surface: 2 to 4 inches ■ Integrating sphere: 2 to 4 inches *For more details, please refer to the PDF document or feel free to contact us.

  • Chip type LED
  • probe

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"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

From narrow pitch measurements of 0.05 mm to high current power semiconductors.

The stacked probe, being a single part, has no structural conductive loss, allowing for direct measurement of current values and achieving stable contact resistance values. Additionally, it can accommodate a minimum pitch of 0.05 mm, enabling Kelvin measurements using narrow pitches and ensuring stable measurements. The excellent characteristics of the stacked probe not only allow for the arrangement of probes in narrow pitches but also demonstrate performance as a probe for power semiconductors that apply large currents. 【Features】 ■ Stable contact resistance values provide powerful precision measurements. ■ Capable of handling large currents and high voltages, contributing to application and measurement for power semiconductors. ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch). ■ Adjustable contact load. 【Examples】 ◎ Contacting in narrow pitches and multiple points. ◎ Ensures reliable contact with BGA for stable Kelvin measurements. ◎ Provides stable contact with lead frames of solder plating. ◎ Suitable for narrow spaces (for LED inspection equipment). *You can view examples from the PDF. Please feel free to contact us for more details.

  • probe
  • probe

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Special Probe "Sure Turn Probe"

Special Probe "Sure Turn Probe"

Solve issues such as variations in resistance values!

This is an original probe that utilizes innovative technology. Conventional general straight probes have a simple internal structure, which often leads to significant variations in resistance values during circuit measurements on printed circuit boards, and sometimes even causes momentary disconnections. It is said to be one of the causes of frequent troubles during tens of thousands or hundreds of thousands of tests. The SureTurn probe is a product developed to address this issue. *For more details, please download the PDF or contact us.

  • probe
  • probe

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Special Probe "Zebra Type Probe"

Special Probe "Zebra Type Probe"

Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!

This is an original probe that utilizes innovative technology. With the increase in signal capacity of electronic devices, it has become difficult to measure using conventional methods. By challenging this limitation and conducting extensive research, we have succeeded in bringing this product to market. Previously, when inspection jigs deteriorated or broke, they had to be disassembled and repaired. However, the zebra-type probe allows for easy extraction and replacement of the probe without disassembling fixtures, and it is a groundbreaking simple probe that enables 20GHz measurements for high-capacity signal devices. *For more details, please download the PDF or contact us.*

  • probe
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Layered probe "High current, multi-point layered probe (patented technology)"

Layered probe "High current, multi-point layered probe (patented technology)"

As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.

This is a probe developed with innovative technology, featuring excellent characteristics. We have developed a multi-point laminated probe specifically for power semiconductors, applying the characteristics of a laminated structure consisting of metal plates (probes) and insulators. 【Features】 - The probe tip is shaped like a wave, allowing contact with the semiconductor at multiple points. This disperses the amount of current and voltage applied, reducing the burden on the semiconductor. - It can move vertically by about 1 millimeter, minimizing contact marks. - Its compact design makes it easy to secure installation space. *For more details, please download the PDF or contact us.

  • probe
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High-frequency (millimeter wave) probe "coaxial shield probe"

High-frequency (millimeter wave) probe "coaxial shield probe"

For partial electrode support such as probe cards!

We offer probes designed with consideration for the conditions of high-frequency measurements, enabling highly accurate measurements. With the increasing circuit density of semiconductor devices, there is particularly growing demand for high-frequency measurements in the MHz range. They are said to be suitable for partial electrode applications such as probe cards and are widely used, with orders now being placed in various fields, including medical applications. *For more details, please download the PDF or contact us.*

  • probe
  • probe

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High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

It is possible to reduce high-frequency loss and direct current resistance values!

We provide a probe designed with considerations for high-frequency measurement conditions, allowing for high-precision measurements. This probe is a developed product that facilitates inspection with unprecedented small pitch intervals for high-frequency measurements. It can reduce high-frequency loss and DC resistance values, and the impedance can also be set as needed. *For more details, please download the PDF or contact us.*

  • probe
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Sensitive Probe (Series 16-300) *CAD data available

Sensitive Probe (Series 16-300) *CAD data available

A unique structure of a sensitive probe that supports high-precision measurement!

High-precision measurement compatible! A rich lineup of sensitive probes! This catalog features the unique structure of the "Sensitive Probe Series" designed for high-precision measurements. The coil spring is made of piano wire with gold plating, providing stable load and excellent durability, and is designed to apply moderate force to the tip of the plunger, ensuring the necessary contact force between the barrel inner wall and the plunger. Additionally, the resistance stabilizer (metal ball) is made of steel with gold plating, which, when pressure is applied to the plunger, adheres to the barrel inner wall, allowing current to flow through the barrel instead of the coil spring, resulting in stable contact resistance. [Contents] ■ Series 16 ■ Series 20 ■ Series 30 ■ Series 48 ■ Series 48A, etc. *For more details, please download the PDF or feel free to contact us.

  • Contract manufacturing
  • probe
  • probe

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Unique structure of a sensitive probe compatible with high-precision measurement.

Unique structure of a sensitive probe compatible with high-precision measurement.

With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!

Introducing the unique structure of a sensitive probe that supports high-precision measurements of inks. At Inks, we have developed a proprietary internal structure that employs a resistance stabilizer (metal pole) to achieve low and stable resistance values. Furthermore, by applying gold plating with excellent conductivity to the plunger, we can achieve an even lower and more stable resistance value, reaching an ideal state. 【Features】 ■ Coil Spring - Stable load and excellent durability - Designed to provide the necessary contact force between the barrel inner wall and the plunger - Excellent heat resistance, maintaining stable spring pressure even at high temperatures ■ Resistance Stabilizer - Achieves stable contact resistance - Minimizes the influence of inductance from the coil spring ■ Plunger - Designed to stabilize internal contact resistance - Various tip shapes are available ■ Barrel - Made from materials with excellent conductivity - Prevents material changes due to corrosion and other factors *For more details, please refer to the external link page or feel free to contact us.

  • probe
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Wave Spring - Achieving compact size and space-saving!

Wave Spring - Achieving compact size and space-saving!

Achieving overwhelming process capability under load compared to other companies! A wave spring that can reliably supply products even in mass production!

The wave-shaped spring "Wave Spring" can increase the spring constant with a small wire diameter, making it a spring that allows for both weight reduction and space-saving compared to coils. Thanks to our unique coiling technology, we reduce side forces. Additionally, to meet more advanced requirements, we customize coiling machines for both hard and soft applications. Furthermore, we can select materials and design optimal springs tailored to your specifications and usage environment! 【Features】 ■ Quick design response (within one week) ■ Capable of manufacturing outer diameters from 5 to 400 mm ■ Lightweight and space-saving ■ Reduction of side forces ■ Stable spring characteristics *For more details, please refer to the brochure. Feel free to contact us with any inquiries.

  • Other machine elements
  • Inductor Coil
  • probe

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Wavelength 1.1-17μm, fiber detachable ATR optical fiber probe

Wavelength 1.1-17μm, fiber detachable ATR optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The sterilizable ATR fiber probe is art's new product, FlexiSpec. This series is compatible with all types of ATR (Attenuated Total Reflection) elements and can be used with any FTIR spectrometer. The unique Shaft-in-Shaft design makes FlexiSpec the ideal tool for bioprocesses that require sterilization while taking advantage of the benefits of mid-infrared FTIR spectroscopy.

  • probe
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Wavelength 0.19-2.2μm - Reflective optical fiber probe

Wavelength 0.19-2.2μm - Reflective optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) art photonics offers a variety of reflection and fluorescence probes. Based on a fiber branching structure, one leg transmits light from the light source to the sample for illumination, while the other leg transmits the reflected light to the spectrometer for reading. Unlike the previous "6+1" bundle configuration of reflection probes, art offers a "7+1" configuration, which dramatically improves the signal-to-noise ratio (SNR). For special applications, a "7+12" design is also available, consisting of 7 illumination fibers and 12 random reading fibers. Additionally, the illumination leg fibers are metal-coated, further enhancing the SNR compared to those with polymer coatings. Two models are available: "Round-to-Round (R/R)" design and "Round-to-Line (R/L)" design.

  • probe
  • Other inspection equipment and devices
  • probe

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World's longest 10m ATR fiber probe

World's longest 10m ATR fiber probe

We have manufactured an ATR fiber probe of unprecedented length in the mid-infrared range.

Manufacturer: art photonics (Germany) ATR spectroscopy in the mid-infrared spectral range (λ = 2~18 μm) is the most efficient method for remote inline monitoring of molecular composition in field labs. This is due to the deep relationship of many molecular vibrations with this spectral range. art photonics has developed the world's longest ATR fiber probe that corresponds to the wavelength range of 6~16 μm.

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  • 4.jpg
  • probe
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Flat Chip Diamond ATR Fiber Probe

Flat Chip Diamond ATR Fiber Probe

The diamond ATR chip at the probe tip is flat, making contact measurement easy and cleaning simple.

Manufacturer: art photonics (Germany) The probe tip is a flat type diamond crystal. It can make firm contact with samples that have a flat surface. Cleaning is also easy. The mid-infrared fiber ATR probe can be used with all types of FTNIR, FTIR, and other infrared spectrometers, spectrophotometers, infrared LEDs, or sensors for quantum cascade lasers. ------------------------------------------------- Features ------------------------------------------------- The diamond ATR chip at the probe tip is flat High throughput across the near-infrared and mid-infrared range Compatible with all spectrometers and automatic process interfaces ------------------------------------------------- Probe Type ------------------------------------------------- Di-ATR (Diamond)

  • flat2.jpg
  • probe
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Electroforming with Rhodium

Electroforming with Rhodium

Rhodium, which has an extremely high hardness and excellent wear resistance! Suitable for everything from medical components to jewelry.

At GDLAB/Research Institute of Electroforming and Surface Modification Technology, we manufacture semiconductor and electronic components, contacts and contactors, mechanical parts, filters, optical circuits, pipes, springs, and more using MEMS-related technologies. "Rhodium" has a white luster and is chemically extremely stable, so it does not oxidize or discolor at room temperature. Furthermore, it has an exceptionally high hardness and excellent wear resistance, making it suitable for a wide range of applications including medical components, reed switches, contactors, contact probes, and jewelry. 【Features of Rhodium】 - Has a white luster with a light reflectance of 80% - Chemically extremely stable and does not oxidize or discolor at room temperature - Extremely high hardness (H 800–900) and excellent wear resistance - Very low electrical resistance of 4.5 gΩ/cm - Good thermal conductivity *For more details, please refer to the PDF document or feel free to contact us.

  • Processing Contract
  • Other machine elements
  • Other electronic parts
  • probe

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