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probe Product List and Ranking from 155 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Oct 01, 2025~Oct 28, 2025
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Oct 01, 2025~Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
  3. TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement

probe Product ranking

Last Updated: Aggregation Period:Oct 01, 2025~Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. AC Current Probe "CWT Mini50HF" 日本オートマティック・コントロール 電子システム部
  3. Connection terminal TA series サンケイエンジニアリング 本社
  4. 4 Flexible wire サンケイエンジニアリング 本社
  5. 5 Examples of probes for electromagnetic and eddy current thickness gauges.

probe Product List

136~150 item / All 665 items

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Hard metal tool

Optimal for "cutting and marking" under a microscope.

■ This is a carbide probe that is ideal for cutting and marking small objects. ■ Various sizes and shapes can be selected according to the material and condition of the sample. ■ It is suitable for removing foreign substances that may cause bending in tungsten probes. *For more details, please contact us via the link below.*

  • Other electronic parts

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Flex probe

Optimal for the removal and collection of foreign substances from small nozzle holes.

■This is an ultra-fine probe made of resin. ■It is capable of removing and collecting foreign objects from tiny holes and slits. *For more details, please contact us via the link below.

  • Other electronic parts

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Short probe

Consolidating decades of technology developed with contact probes for semiconductor testing!

Consolidating decades of technology developed with contact probes for semiconductor testing! Short Probes 【Features】 ○ Quickly responds to fine pitch and high-speed testing environments ○ High-performance short probes highly rated by users worldwide ○ Easy customization ○ Main types ・Short probes for 1.0mm pitch ・Short probes for 0.8mm pitch ・Short probes for 0.65mm pitch ・Short probes for 0.5mm pitch ・Short probes for 0.4mm pitch ・Ultra-short short probes *Other types are also available. Please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

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Kelvin Probe "RI-020ZC-01"

The horseshoe-shaped tip design ensures more reliable contact! Contact probe for Kelvin measurements.

The "RI-020ZC-01" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. It is suitable for measuring BGA packages with a 0.4mm pitch matrix and QFP packages with a 0.3mm pitch. Additionally, we also offer the 4-point type "RI-020ZC-02." 【Materials】 ■A Plunger: SK / Au-Plated ■Barrel: PB / Au Lined ■Spring: SWP / Au-Plated ■B Plunger: SK / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Dragon Probe 'RI-030II-28-WKG'

Introducing the Dragon Probe series, capable of withstanding high-temperature environments up to 200℃!

The "RI-030II-28-WKG" is a probe with excellent high-temperature characteristics. It is suitable for high-temperature environments up to 200°C. In addition, to meet the high heat resistance temperature requirements of probes in reliability testing, we currently offer the HOTPIN that supports up to 175°C. 【Material】 ■A Plunger: BeCu / K3-Gold ■Barrel: Ni / Inner Au ■Spring: SUS / Au-Plated ■B Plunger: BeCu / K3-Gold *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Probe "RI-030LI-33-A2"

Compatible with various types of sockets! A probe that allows you to choose the tip shape according to your application.

The "RI-030LI-33-A2" is a standard design probe suitable for 0.4mm and 0.5mm pitch. It is versatile and can be used with various types of sockets. Additionally, you can choose from three different tip shapes according to your application. 【Material】 ■A Plunger: BeCu / Au-Plated ■Barrel: PB / Au-Plated ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Kelvin Probe "RI-035ZI-01-WKG"

Introducing a probe for Kelvin measurement that can withstand high-temperature environments up to 170℃!

The "RI-035ZI-01-WKG" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. Additionally, this product is suitable for high-temperature environments up to 170°C and has a 2A CCC characteristic. We also offer a 4-point type, the "RI-035ZI-02-WKG." 【Materials】 ■A Plunger: SK / K3 Gold ■Barrel: NS / Au-Plated ■Spring: SUS / Au-Plated ■B Plunger: SK / K3 Gold *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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DDR3 1867 DIMM Analysis Probe

DDR3 1867 DIMM Analysis Probe

DDR3 Analysis Probe for Logic Analyzers ■ Capable of measuring up to the fastest DDR3 1867 DIMM modules!! ■ Compatible with all 240-pin DDR3 SDRAM DIMMs ■ No slot required for analysis due to the interposer ■ Capable of measuring all signals ■ Comes with dedicated software for logic analyzers - Timing measurement - Protocol measurement - Compliance measurement

  • Other measurement, recording and measuring instruments

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Comprehensive Catalog of Wire Harness and Connector Probes

We are currently offering a free comprehensive catalog of wire harnesses and connector probes!

Free distribution of the comprehensive catalog for wire harness and connector probes (English version) is available now!! ★If you are interested, please contact us★ 【Overview】 We are the exclusive distributor in Japan for FEINMETALL, the world's largest manufacturer of probes for wire harness testing (Germany). We provide a one-stop solution with a wide range of product lineup. Custom specifications are also accepted. Whether it's high current, high frequency, rotation, switches, non-magnetic, heat-resistant... feel free to consult us about any probes. 【Product Examples】 ◆ Switch probe with an outer diameter of 1.0mm ◆ High current probe supporting up to 600A ◆ High frequency probe supporting up to 20GHz ◆ Semiconductor probe with a diameter of 0.20mm, total length of 3.3mm, spring pressure of 60g, and a lifespan of over 1 million cycles ★If you would like the comprehensive catalog (English version), please contact us★

  • Terminal Blocks
  • Harness

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Contact probe

If it's about contact probes. A wide range of product lineup. Custom manufacturing is also available.

You can easily select a probe that suits your purpose from a rich variety of options (sizes, chip shapes). Our wide product lineup provides a one-stop solution. Custom specifications are also available. ~ Industry-leading performance and quality ~ 【Product Examples】 ◆ Switch probe with an outer diameter of 1.0mm ◆ High current probe supporting up to 600A ◆ High-frequency probe supporting up to 20GHz ◆ Semiconductor probe with a diameter of 0.20mm, total length of 3.3mm, spring pressure of 60g, and a lifespan of over 1 million cycles ~ Cost reduction and improved cost performance ~ ◆ We support our customers in reducing costs and improving cost performance by proposing compatible in-house products. Free shipping. ■ High current, high frequency, rotary, switch, non-magnetic, heat-resistant, etc... Various options are available according to your needs. Please feel free to consult us about probes. * A simple document (in English) can be downloaded from this screen.

  • Other machine elements
  • Terminal Blocks

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