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probe Product List and Ranking from 154 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. ヴァイサラ Tokyo//Testing, Analysis and Measurement
  3. テクノプローブ Chiba//Testing, Analysis and Measurement
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 マーポス Tokyo//Testing, Analysis and Measurement
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probe Product ranking

Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.

  1. Connection terminal TA series サンケイエンジニアリング 本社
  2. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  3. Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 Flexible wire サンケイエンジニアリング 本社

probe Product List

271～300 item / All 757 items

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Special Probe "Zebra Type Probe"

Special Probe "Zebra Type Probe"

Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!

This is an original probe that utilizes innovative technology. With the increase in signal capacity of electronic devices, it has become difficult to measure using conventional methods. By challenging this limitation and conducting extensive research, we have succeeded in bringing this product to market. Previously, when inspection jigs deteriorated or broke, they had to be disassembled and repaired. However, the zebra-type probe allows for easy extraction and replacement of the probe without disassembling fixtures, and it is a groundbreaking simple probe that enables 20GHz measurements for high-capacity signal devices. *For more details, please download the PDF or contact us.*

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Layered probe "High current, multi-point layered probe (patented technology)"

Layered probe "High current, multi-point layered probe (patented technology)"

As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.

This is a probe developed with innovative technology, featuring excellent characteristics. We have developed a multi-point laminated probe specifically for power semiconductors, applying the characteristics of a laminated structure consisting of metal plates (probes) and insulators. 【Features】 - The probe tip is shaped like a wave, allowing contact with the semiconductor at multiple points. This disperses the amount of current and voltage applied, reducing the burden on the semiconductor. - It can move vertically by about 1 millimeter, minimizing contact marks. - Its compact design makes it easy to secure installation space. *For more details, please download the PDF or contact us.

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High-frequency (millimeter wave) probe "coaxial shield probe"

High-frequency (millimeter wave) probe "coaxial shield probe"

For partial electrode support such as probe cards!

We offer probes designed with consideration for the conditions of high-frequency measurements, enabling highly accurate measurements. With the increasing circuit density of semiconductor devices, there is particularly growing demand for high-frequency measurements in the MHz range. They are said to be suitable for partial electrode applications such as probe cards and are widely used, with orders now being placed in various fields, including medical applications. *For more details, please download the PDF or contact us.*

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High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

It is possible to reduce high-frequency loss and direct current resistance values!

We provide a probe designed with considerations for high-frequency measurement conditions, allowing for high-precision measurements. This probe is a developed product that facilitates inspection with unprecedented small pitch intervals for high-frequency measurements. It can reduce high-frequency loss and DC resistance values, and the impedance can also be set as needed. *For more details, please download the PDF or contact us.*

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Sensitive Probe (Series 16-300) *CAD data available

Sensitive Probe (Series 16-300) *CAD data available

A unique structure of a sensitive probe that supports high-precision measurement!

High-precision measurement compatible! A rich lineup of sensitive probes! This catalog features the unique structure of the "Sensitive Probe Series" designed for high-precision measurements. The coil spring is made of piano wire with gold plating, providing stable load and excellent durability, and is designed to apply moderate force to the tip of the plunger, ensuring the necessary contact force between the barrel inner wall and the plunger. Additionally, the resistance stabilizer (metal ball) is made of steel with gold plating, which, when pressure is applied to the plunger, adheres to the barrel inner wall, allowing current to flow through the barrel instead of the coil spring, resulting in stable contact resistance. [Contents] ■ Series 16 ■ Series 20 ■ Series 30 ■ Series 48 ■ Series 48A, etc. *For more details, please download the PDF or feel free to contact us.

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Unique structure of a sensitive probe compatible with high-precision measurement.

Unique structure of a sensitive probe compatible with high-precision measurement.

With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!

Introducing the unique structure of a sensitive probe that supports high-precision measurements of inks. At Inks, we have developed a proprietary internal structure that employs a resistance stabilizer (metal pole) to achieve low and stable resistance values. Furthermore, by applying gold plating with excellent conductivity to the plunger, we can achieve an even lower and more stable resistance value, reaching an ideal state. 【Features】 ■ Coil Spring - Stable load and excellent durability - Designed to provide the necessary contact force between the barrel inner wall and the plunger - Excellent heat resistance, maintaining stable spring pressure even at high temperatures ■ Resistance Stabilizer - Achieves stable contact resistance - Minimizes the influence of inductance from the coil spring ■ Plunger - Designed to stabilize internal contact resistance - Various tip shapes are available ■ Barrel - Made from materials with excellent conductivity - Prevents material changes due to corrosion and other factors *For more details, please refer to the external link page or feel free to contact us.

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Comparison of contact resistance values of sensitive probes with other companies.

Comparison of contact resistance values of sensitive probes with other companies.

We are introducing a comparison of contact resistance values between our products and overseas products from other companies.

Introduction to the comparison test of contact resistance values between Inks' IP130B-2C probe and probes from other manufacturers. The test conditions used the JCM GP035-50R contact resistance measurement device for both the IP probe and the other (overseas) probes, with an applied current of 5A and an application time of 0.1 seconds. The insertion depth was 5.2mm for the IP probe and 4.3mm for the other (overseas) probes. As a result, the IP probe exhibited a more stable contact resistance value within a narrower range. The average value was also lower, indicating very good performance. [Test Results (Partial)] ■ Contact Resistance Values (mΩ) *Measured 3000 times 　・IP Probe (Sample 1) 　　　Max: 11.6 　　　Min: 8.6 　　　Ave: 9.4 　・Other Manufacturer's Probe (Sample 1) 　　　Max: 200.4 　　　Min: 15.7 　　　Ave: 92.7 *For more details, please refer to the external link page or feel free to contact us.

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Layered probe with stable contact resistance value.

Layered probe with stable contact resistance value.

A probe capable of achieving a stable contact resistance value according to the shape of the target object.

The "laminated probe" has been developed with innovative technology and possesses excellent features. Unlike conventional spring probes, which consist of multiple parts, it achieves a structurally stable contact resistance value through contact with a single metal plate. Even when the inspected object is not smooth, the spring properties of each probe allow it to conform to the shape of the object, enabling a stable contact resistance value. 【Features】 ■ Wiping action occurs due to the structure ■ Contact position is displaced ■ Contact can be made while removing oxide films and foreign substances from the object ■ Stable contact can be achieved *For more details, please refer to the PDF document or feel free to contact us.

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Support for narrow pitch in stacked probes

Support for narrow pitch in stacked probes

It is possible to accommodate Kelvin measurements in a narrow range by utilizing a narrow pitch!

We would like to introduce our company's "stacked probes" and their compatibility with narrow pitch applications. The "stacked probes" can handle stable resistance values, high voltage, and current. Furthermore, they can make contacts at a minimum pitch of 0.05mm with closely arranged contacts, semiconductor lead parts, and connector contacts, enabling narrow pitch compatibility that was not achievable with conventional spring probes. 【Features】 ■ Stable resistance values, high voltage, and current compatibility ■ Contact possible at a minimum pitch of 0.05mm ■ Compatible with Kelvin measurements ■ Two-terminal measurements for each measurement point *For more details, please refer to the PDF document or feel free to contact us.

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Stable contact with BGA.

Stable contact with BGA.

Introducing examples of layered probes. Coating applied to the probe tip achieves extended lifespan.

We would like to introduce stable contact for BGA "laminated probes" handled by our company. For spherical BGA (solder), contact using needle-type probes, including spring probes, has resulted in slippage, making stable contact difficult. By using laminated probes for Kelvin contact, we achieve stable contact. Additionally, since BGA primarily consists of tin, applying a coating to the probe tip that suppresses tin transfer can also extend its lifespan. 【Features of Laminated Probes】 ■ Stable contact resistance values ■ Effective for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

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Q&A on Layered Probes

Q&A on Layered Probes

We will answer five representative questions about layered probes.

In this document, we will introduce questions regarding the "stacked probe" of the probe business handled by Inks Corporation. Q: Is non-magnetic compatibility possible? A: Yes, it is possible. The probe is made of non-magnetic beryllium copper, and the holder that holds the probe can also be made of non-magnetic materials such as aluminum or resin. Additionally, we have experience with contacts to magnetic sensor packages. We have answered five questions, including the following: - Is non-magnetic compatibility possible? - Can it be used in the previous process (wafer inspection)? - I would like to install it on the machine I am currently using; is that possible? - How should maintenance be performed? - What would the estimated schedule be until delivery? *For more details, please refer to the PDF document or feel free to contact us.

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Layered Probe: Response to High Current and High Temperature

Layered Probe: Response to High Current and High Temperature

We have a track record of producing laminated probes compatible with 2000A! Introducing our solutions for handling high current and high temperatures.

The "laminated probe" does not use coil springs and instead utilizes the characteristics of leaf springs for contact, making it resistant to degradation of spring properties due to heat. The insulating film (polyimide) also has a heat resistance rating of 300°C for regular use and long-term heat resistance. It can accommodate measurement environments at high temperatures, allowing contact with power semiconductors including SiC. 【Features】 ■ Utilizes the characteristics of leaf springs ■ Resistant to degradation of spring properties due to heat ■ Can accommodate measurement environments at high temperatures ■ Allows contact with power semiconductors including SiC *For more details, please refer to the PDF document or feel free to contact us.

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Wavelength 1.1-17μm, fiber detachable ATR optical fiber probe

Wavelength 1.1-17μm, fiber detachable ATR optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The sterilizable ATR fiber probe is art's new product, FlexiSpec. This series is compatible with all types of ATR (Attenuated Total Reflection) elements and can be used with any FTIR spectrometer. The unique Shaft-in-Shaft design makes FlexiSpec the ideal tool for bioprocesses that require sterilization while taking advantage of the benefits of mid-infrared FTIR spectroscopy.

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Wavelength 0.19-2.2μm - Reflective optical fiber probe

Wavelength 0.19-2.2μm - Reflective optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) art photonics offers a variety of reflection and fluorescence probes. Based on a fiber branching structure, one leg transmits light from the light source to the sample for illumination, while the other leg transmits the reflected light to the spectrometer for reading. Unlike the previous "6+1" bundle configuration of reflection probes, art offers a "7+1" configuration, which dramatically improves the signal-to-noise ratio (SNR). For special applications, a "7+12" design is also available, consisting of 7 illumination fibers and 12 random reading fibers. Additionally, the illumination leg fibers are metal-coated, further enhancing the SNR compared to those with polymer coatings. Two models are available: "Round-to-Round (R/R)" design and "Round-to-Line (R/L)" design.

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World's longest 10m ATR fiber probe

World's longest 10m ATR fiber probe

We have manufactured an ATR fiber probe of unprecedented length in the mid-infrared range.

Manufacturer: art photonics (Germany) ATR spectroscopy in the mid-infrared spectral range (λ = 2~18 μm) is the most efficient method for remote inline monitoring of molecular composition in field labs. This is due to the deep relationship of many molecular vibrations with this spectral range. art photonics has developed the world's longest ATR fiber probe that corresponds to the wavelength range of 6~16 μm.

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Flat Chip Diamond ATR Fiber Probe

Flat Chip Diamond ATR Fiber Probe

The diamond ATR chip at the probe tip is flat, making contact measurement easy and cleaning simple.

Manufacturer: art photonics (Germany) The probe tip is a flat type diamond crystal. It can make firm contact with samples that have a flat surface. Cleaning is also easy. The mid-infrared fiber ATR probe can be used with all types of FTNIR, FTIR, and other infrared spectrometers, spectrophotometers, infrared LEDs, or sensors for quantum cascade lasers. ------------------------------------------------- Features ------------------------------------------------- The diamond ATR chip at the probe tip is flat High throughput across the near-infrared and mid-infrared range Compatible with all spectrometers and automatic process interfaces ------------------------------------------------- Probe Type ------------------------------------------------- Di-ATR (Diamond)

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Total cell density & biomass monitoring probe BioVIS

Total cell density & biomass monitoring probe BioVIS

Using the BioVIS probe, you can directly measure cell growth and total biomass from the bioreactor.

Since sampling is not required, contamination in cell culture can be avoided. At the same time, high-resolution information about the cell growth profile can be obtained, providing valuable insights that help optimize the cell culture process. The plug-and-play design of the probe is suitable for use in any bioreactor and can be used as a single portable unit. Therefore, it can be used in bioreactors ranging from small to large capacity, and with BioVIS multiplex, it can monitor total cell density in real-time across multiple bioreactors and all other parallel culture vessels. By using data log options, temperature and pH monitoring capabilities can be further integrated.

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コンタクトプローブ

コンタクトプローブ

高集積化に伴う狭ピッチ化やエリアアレイへの対応に優れたプローブピンをご紹介！

『コンタクトプローブ』は、狭ピッチ電極の電子部品検査に適した超極細径 のワイヤプローブです。 導体部には、パラジウム合金や、銅銀合金、タングステン、レニウムタング ステン、ベリリウム銅などを使用。 当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 境界面のシャープ化を実現しています。 【特長】 ■当社独自の製法により、極小部位への先端加工を実現 ■当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 　境界面のシャープ化を実現 ■特殊な表面処理により、絶縁コーティング表面の滑性を向上 ■パラジウム合金は、導体が酸化しにくい特長があり、接触抵抗の安定性が向上 ■酸化を嫌う半導体検査などに好適 ■30μmの極細径から対応可能 ※詳しくは外部リンクページをご覧いただくか、お気軽にお問い合わせ下さい。

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TITAN T26P RF High-Power Probe Head

TITAN T26P RF High-Power Probe Head

Affordable pricing for RF high power measurements from DC to 26GHz!

The probe chip, thanks to MPI's unique MEMS technology, has very high visibility, making probing easy for anyone. The high-precision and robust chips, which are on par with competitors, offer a long lifespan and affordable pricing, resulting in a high cost-performance ratio. Agent in Japan: Vector Semicon Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

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[Long lifespan, high durability type] Diamond probe for AFM/SPM

[Long lifespan, high durability type] Diamond probe for AFM/SPM

AFM/SPM probes boasting long lifespan and high durability with diamond coatings and single crystal diamonds.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a diamond coating on the tip, or the tip itself is made of single crystal diamond, providing high stability, wear resistance, and durability for a long-lasting probe. ● Diamond Coated Probes - DCP Series: Probes with conductivity due to nitrogen-doped diamond coating. - HA_DCP Series: Probes with cantilevers at both ends of the chip and two different diamond-coated tips. ● Single Crystal Diamond Probes - DEP Series: Probes with conductivity, treated with boron-doped diamond coating on single crystal diamond. - DRP Series, DPRS Series: Probes designed for applications involving high mechanical loads and scratch tests. - FD Series: Probes that are insensitive to static electricity on the sample surface, making them easy to approach and suitable for topography imaging.

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High-resolution type super sharp probe for AFM/SPM

High-resolution type super sharp probe for AFM/SPM

AFM/SPM probe for high-resolution measurements with a tip curvature radius of less than 3 nm.

This is a probe for atomic force microscopy and scanning probe microscopy. We offer two types of probes: one with an ultra-fine DLC tip extended at the tip's end, and another with a tip sharpened to about 2 nm. - Super Sharp DLC Probe: A probe equipped with a DLC tip at the tip's end that has a curvature radius of less than about 3 nm. Due to the DLC, it boasts high durability and long lifespan. - Super Sharp SS Probe: A probe with the tip's end sharpened to a curvature radius of about 2 nm.

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Colloidal probe for AFM/SPM with spherical tip type

Colloidal probe for AFM/SPM with spherical tip type

This is a probe equipped with colloidal spheres instead of a standard tip. Colloidal spheres can be selected from multiple sizes.

This is a probe for atomic force microscopy and scanning probe microscopy. It is a contact mode probe with spherical particles fixed to a chipless cantilever, used for studying colloidal interactions between two surfaces and quantifying interaction characteristics. ● Applications - Direct measurement of surface forces - Colloidal interactions at the single particle - particle level - Direct measurement of cellular mechanics - Adhesion force measurement - Study of colloidal interactions between particles and surfaces

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SNOM probe

SNOM probe

A SNOM measurement probe with a tiny aperture formed at the probe tip. Five types of transmission wavelengths are available, ranging from 400 to 1600 nm.

This is a SNOM-specific probe made from high-quality single-mode optical fiber. The probe tip is coated with aluminum and has a small aperture, allowing it to be used in all current modes of SNOM measurement (transmission, reflection, collection). We offer five types with different operating wavelength ranges within the wavelength range of 400 to 1600 nm. They are provided in sets of 10.

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AFMSPM Cantilever "qp Series"

AFMSPM Cantilever "qp Series"

Significantly suppresses the variation of spring constant and resonance frequency! Can be used as an alternative to silicon nitride probes.

The "uniqprobe series" features probes that have smaller dimensional specifications and material-specific warping and bending compared to Si probes and SiN probes. The variation in the cantilever's resonance frequency and spring constant is significantly lower, making it very effective for repeated measurements that require high reproducibility. We offer "qp-CONT/qp-SCONT," which is suitable for contact mode measurements in atmospheric and liquid environments, and "qp-BioAC/qp-BioAC-CI," which is optimal for tapping mode (AC mode) measurements in liquid. 【Features】 ■Significantly suppresses variation in spring constant and resonance frequency ■Low drift, making it suitable for liquid measurements ■Cantilevers and deep probes are made from quartz-like materials ■Deep probes have a hyperbolic side profile ■Can be used as an alternative to silicon nitride probes *For more details, please refer to the PDF materials or feel free to contact us.

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AFM/SPM probes and cantilevers for roughness measurement of various industrial materials.

AFM/SPM probes and cantilevers for roughness measurement of various industrial materials.

Cost measures and wear prevention products! NanoWorld probes with a high track record for everyday measurements.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the roughness of various industrial materials. These products are suitable for customers using AFM/SPM for nano-level surface management of materials. Please use the NCH probes, which have a proven track record worldwide, the BudgetSensors probes, which are cost-effective, and the nanotools probes, which enhance tip wear resistance and allow for long-duration measurements. 【Features】 ■ For measuring the roughness of various industrial materials ■ Suitable for customers using AFM/SPM for nano-level surface management of materials ■ Enhanced tip wear resistance allows for long-duration measurements *For more details, please refer to the related link page or feel free to contact us.

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Colloidal Probe for Viscoelastic Measurement in the Polymer Industry

Colloidal Probe for Viscoelastic Measurement in the Polymer Industry

The colloidal probe with a rounded tip is used for measuring viscoelasticity and modulation.

We would like to introduce our viscoelasticity measurement SPMAFM probes and cantilevers for the polymer industry. Our lineup includes the calibrated "biosphere series," as well as the "NanoSensors SD-sphere series" and "sQube CP series." In recent years, there has been an increasing demand for local viscoelasticity measurements and friction force measurements. For these applications, please use our colloid probes with a rounded tip. 【Features】 〈biosphere series〉 ■ Controlled radius of curvature ■ Calibrated ■ HDC/DLC hardness ■ Gold-coated reflection *For more details, please refer to the PDF document or feel free to contact us.

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Data presentation! "Basics of AFM/SPM Probes"

Data presentation! "Basics of AFM/SPM Probes"

Introducing the probes used in scanning probe microscopy and atomic force microscopy! We will clearly explain the names of each part of the probe!

This document explains the probes used in scanning probe microscopy and atomic force microscopy. The probes used for measurements are consumables, and many types are available for different measurement needs. They are typically made of silicon or silicon nitride and are manufactured using semiconductor processes. Additionally, quartz material probes from the "qp series" are available from NanoSensors. 【Contents】 ■ Names of each part ■ Variations of tips (probes) ■ Variations of cantilevers (spring plates) ■ Variations of support tips ■ Variations of coatings *For more details, please refer to the PDF document or feel free to contact us.

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