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probe Product List and Ranking from 137 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Apr 08, 2026～May 05, 2026
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Apr 08, 2026～May 05, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. Sankotsusho Tokyo//Industrial Electrical Equipment
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
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probe Product ranking

Last Updated： Aggregation Period:Apr 08, 2026～May 05, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  3. Heat-resistant contact probe CPU series サンケイエンジニアリング 本社
  4. 4 Examples of probes for electromagnetic and eddy current thickness gauges.
  5. 5 Capacitive Moisture Meter Probe M Series 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社

probe Product List

121～150 item / All 680 items

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Probe (stainless steel, straight type, 140mm)

Probe (stainless steel, straight type, 140mm)

Introducing non-magnetic conductive 300 series stainless steel!

The "Probe (Stainless Steel, Straight Type, 140mm)" features an ergonomic hexagonal handle. It is made of stainless steel, so it does not corrode. There is no problem using it with magnetized parts, and when placed on an ESD protective work surface, it can ground all generated static electricity. 【Features】 ■ Ergonomic hexagonal handle ■ Corrosion-resistant stainless steel ■ Safe to use with magnetized parts ■ Can ground all generated static electricity when placed on an ESD protective work surface ■ Made in the USA, high quality *For more details, please refer to the related link page or feel free to contact us.

  • Other anti-static devices
  • probe
  • Anti-static products
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Probe (wood, "ORANGESTICK" quantity 100)

Probe (wood, "ORANGESTICK" quantity 100)

Ideal for use in ESD protection areas! Introducing probes that won't damage delicate surfaces.

The probe (wood, 'ORANGESTICK', pack of 100) is a suitable material for use in ESD protected areas. It is high-quality, made in the USA, and comes in a pack of 100. It is heat-resistant and will not melt. Additionally, the wooden finish ensures that it does not scratch delicate surfaces. [Features] - Pack of 100 - Wooden finish prevents scratching of delicate surfaces - Suitable material for use in ESD protected areas - Heat-resistant and will not melt - Made in the USA, high quality *For more details, please refer to the related link page or feel free to contact us.

  • probe
  • Anti-static products
  • Other anti-static devices
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Probe (nylon, flathead screwdriver (split tip) 172mm)

Probe (nylon, flathead screwdriver (split tip) 172mm)

Introducing an ideal American-made probe for opening plastic cases.

The "Probe (Nylon, Flathead Screwdriver (Split Tip) 172mm)" is suitable for use in areas with electrostatic discharge protection. It is heat-resistant and will not melt, making it ideal for opening plastic cases. The nylon finish ensures that delicate surfaces are not scratched. Made in the USA, it is also suitable as a tool for removing batteries. 【Features】 - The nylon finish prevents scratching of delicate surfaces - Suitable for use in areas with electrostatic discharge protection - Heat-resistant and will not melt - Also suitable as a tool for removing batteries - Made in the USA *For more details, please refer to the related link page or feel free to contact us.

  • probe
  • Anti-static products
  • Other anti-static devices
  • probe

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Ring-type probe '50005'

Ring-type probe '50005'

Use in connection with a resistance tester! It can also measure the resistance of ESD packaging such as static electricity shielding and other bags.

The "50005" is a device used in conjunction with a resistance measuring instrument. For example, it measures surface resistance according to the measurement methods described in the ANSI/ESD STM11.11 packaging standard, such as the DESCO 19787 digital surface resistance meter, and in accordance with the surface resistance of conductive materials as per ANSI/ESD S541. Additionally, this product can also be used to measure the resistance of ESD packaging, such as electrostatic shielding and other bags. 【Features】 ■ Can measure the resistance capacity of conductive materials using a flat conductive metal plate (sold separately) ■ Can also be used to measure the resistance of ESD packaging, such as electrostatic shielding and other bags ■ Used in conjunction with a resistance measuring instrument *For more details, please refer to the related link page or feel free to contact us.

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RF MEMS Probe "TP26-Angle Series"

RF MEMS Probe "TP26-Angle Series"

The connector is 3.5mm/F! The probe pitch can be selected from 50 to 1,000um!

We would like to introduce our RF_MEMS probe, the "TP26-Angle Series." The characteristic impedance is 50 ohms, and the frequency range is DC to 26.5 GHz, with an insertion loss (GSG-150um pitch typ.) of -0.4 dB. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

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RF MEMS Probe "TP110-Angle Series"

RF MEMS Probe "TP110-Angle Series"

The connector is 1.0mm/F, compatible pitch is 50 to 250um! Probe repair and tip replacement are possible.

We would like to introduce our RF_MEMS probe, the 'TP110-Angle Series'. The characteristic impedance is 50 ohms, and the frequency range is DC to 110 GHz, with an insertion loss (GSG-150um pitch typ.) of -1.1 dB. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

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RF MEMS Probe "TPWR8"

RF MEMS Probe "TPWR8"

Small probe scar! The reflection loss (GSG-150um pitch typ.) is -10.0dB.

We would like to introduce our RF_MEMS probe 'TPWR8' that we handle. The contact life (when using an auto prober) is 1 million cycles, with a needle position accuracy within 10um and a needle tip parallelism of less than 10um. Please feel free to contact us when needed. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe marks ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Note: Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

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RF MEMS Probe "WR6-Tall Series"

RF MEMS Probe "WR6-Tall Series"

Small probe scar! The reflection loss (GSG-150um pitch typ.) is -10.0dB.

We would like to introduce our RF_MEMS probe, the "WR6-Tall Series." The contact resistance (to the gold pad) is 0.05 ohms, the needle position accuracy is within 10 micrometers, and the needle tip parallelism is less than 10 micrometers. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 micrometers ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

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[Data] TCS3-150-2 Calibration Board Instruction Manual

[Data] TCS3-150-2 Calibration Board Instruction Manual

SOLT/TRL calibrator! Introducing the pattern list and substrate top view.

This document includes the component symbols for the calibration substrate "TCS3-150-2" with a pad pitch of 150μm. It introduces pattern names such as Open, Short, Load, and Line TH. It is a simple and easy-to-reference book. Please take a moment to read it. 【Contents (partial)】 ■ Pattern Names ■ Component Symbols ■ Applications ■ Component Positions *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • probe

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Hard metal tool

Hard metal tool

Optimal for "cutting and marking" under a microscope.

■ This is a carbide probe that is ideal for cutting and marking small objects. ■ Various sizes and shapes can be selected according to the material and condition of the sample. ■ It is suitable for removing foreign substances that may cause bending in tungsten probes. *For more details, please contact us via the link below.*

  • Other electronic parts
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Flex probe

Flex probe

Optimal for the removal and collection of foreign substances from small nozzle holes.

■This is an ultra-fine probe made of resin. ■It is capable of removing and collecting foreign objects from tiny holes and slits. *For more details, please contact us via the link below.

  • Other electronic parts
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Short probe

Short probe

Consolidating decades of technology developed with contact probes for semiconductor testing!

Consolidating decades of technology developed with contact probes for semiconductor testing! Short Probes 【Features】 ○ Quickly responds to fine pitch and high-speed testing environments ○ High-performance short probes highly rated by users worldwide ○ Easy customization ○ Main types ・Short probes for 1.0mm pitch ・Short probes for 0.8mm pitch ・Short probes for 0.65mm pitch ・Short probes for 0.5mm pitch ・Short probes for 0.4mm pitch ・Ultra-short short probes *Other types are also available. Please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board
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Kelvin Probe "RI-020ZC-01"

Kelvin Probe "RI-020ZC-01"

The horseshoe-shaped tip design ensures more reliable contact! Contact probe for Kelvin measurements.

The "RI-020ZC-01" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. It is suitable for measuring BGA packages with a 0.4mm pitch matrix and QFP packages with a 0.3mm pitch. Additionally, we also offer the 4-point type "RI-020ZC-02." 【Materials】 ■A Plunger: SK / Au-Plated ■Barrel: PB / Au Lined ■Spring: SWP / Au-Plated ■B Plunger: SK / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

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Dragon Probe 'RI-030II-28-WKG'

Dragon Probe 'RI-030II-28-WKG'

Introducing the Dragon Probe series, capable of withstanding high-temperature environments up to 200℃!

The "RI-030II-28-WKG" is a probe with excellent high-temperature characteristics. It is suitable for high-temperature environments up to 200°C. In addition, to meet the high heat resistance temperature requirements of probes in reliability testing, we currently offer the HOTPIN that supports up to 175°C. 【Material】 ■A Plunger: BeCu / K3-Gold ■Barrel: Ni / Inner Au ■Spring: SUS / Au-Plated ■B Plunger: BeCu / K3-Gold *For more details, please refer to the PDF document or feel free to contact us.

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Probe "RI-030LI-33-A2"

Probe "RI-030LI-33-A2"

Compatible with various types of sockets! A probe that allows you to choose the tip shape according to your application.

The "RI-030LI-33-A2" is a standard design probe suitable for 0.4mm and 0.5mm pitch. It is versatile and can be used with various types of sockets. Additionally, you can choose from three different tip shapes according to your application. 【Material】 ■A Plunger: BeCu / Au-Plated ■Barrel: PB / Au-Plated ■Spring: SWP / Au-Plated ■B Plunger: BeCu / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.

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Kelvin Probe "RI-035ZI-01-WKG"

Kelvin Probe "RI-035ZI-01-WKG"

Introducing a probe for Kelvin measurement that can withstand high-temperature environments up to 170℃!

The "RI-035ZI-01-WKG" is a Kelvin probe for Kelvin measurements. The horseshoe-shaped tip design ensures more reliable contact. Additionally, this product is suitable for high-temperature environments up to 170°C and has a 2A CCC characteristic. We also offer a 4-point type, the "RI-035ZI-02-WKG." 【Materials】 ■A Plunger: SK / K3 Gold ■Barrel: NS / Au-Plated ■Spring: SUS / Au-Plated ■B Plunger: SK / K3 Gold *For more details, please refer to the PDF document or feel free to contact us.

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DDR3 1867 DIMM Analysis Probe

DDR3 1867 DIMM Analysis Probe

DDR3 1867 DIMM Analysis Probe

DDR3 Analysis Probe for Logic Analyzers ■ Capable of measuring up to the fastest DDR3 1867 DIMM modules!! ■ Compatible with all 240-pin DDR3 SDRAM DIMMs ■ No slot required for analysis due to the interposer ■ Capable of measuring all signals ■ Comes with dedicated software for logic analyzers - Timing measurement - Protocol measurement - Compliance measurement

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Comprehensive Catalog of Wire Harness and Connector Probes

Comprehensive Catalog of Wire Harness and Connector Probes

We are currently offering a free comprehensive catalog of wire harnesses and connector probes!

Free distribution of the comprehensive catalog for wire harness and connector probes (English version) is available now!! ★If you are interested, please contact us★ 【Overview】 We are the exclusive distributor in Japan for FEINMETALL, the world's largest manufacturer of probes for wire harness testing (Germany). We provide a one-stop solution with a wide range of product lineup. Custom specifications are also accepted. Whether it's high current, high frequency, rotation, switches, non-magnetic, heat-resistant... feel free to consult us about any probes. 【Product Examples】 ◆ Switch probe with an outer diameter of 1.0mm ◆ High current probe supporting up to 600A ◆ High frequency probe supporting up to 20GHz ◆ Semiconductor probe with a diameter of 0.20mm, total length of 3.3mm, spring pressure of 60g, and a lifespan of over 1 million cycles ★If you would like the comprehensive catalog (English version), please contact us★

  • Terminal Blocks
  • Harness
  • probe

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Contact probe

Contact probe

If it's about contact probes. A wide range of product lineup. Custom manufacturing is also available.

You can easily select a probe that suits your purpose from a rich variety of options (sizes, chip shapes). Our wide product lineup provides a one-stop solution. Custom specifications are also available. ~ Industry-leading performance and quality ~ 【Product Examples】 ◆ Switch probe with an outer diameter of 1.0mm ◆ High current probe supporting up to 600A ◆ High-frequency probe supporting up to 20GHz ◆ Semiconductor probe with a diameter of 0.20mm, total length of 3.3mm, spring pressure of 60g, and a lifespan of over 1 million cycles ~ Cost reduction and improved cost performance ~ ◆ We support our customers in reducing costs and improving cost performance by proposing compatible in-house products. Free shipping. ■ High current, high frequency, rotary, switch, non-magnetic, heat-resistant, etc... Various options are available according to your needs. Please feel free to consult us about probes. * A simple document (in English) can be downloaded from this screen.

  • Other machine elements
  • Terminal Blocks
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Turn Probes

Turn Probes

Turn Probes

This probe can reliably make contact with pads of lead-free solder that have a lot of flux and oxide film by rotating the probe tip between 40° and 70°.

  • Other Connectors
  • Sensors
  • Other electronic parts
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Wire probe

Wire probe

Wire probe

It is a probe that utilizes the flexibility of tungsten wire, characterized by high pin pressure, stable contact resistance, and long lifespan.

  • Printed Circuit Board
  • Sensors
  • Other electronic parts
  • probe

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Four-terminal probe (Kelvin Probes)

Four-terminal probe (Kelvin Probes)

Four-terminal probe (Kelvin Probes)

This is a contact probe that combines two terminals for measuring current and voltage into one in order to accurately measure small resistance values.

  • Other Connectors
  • Printed Circuit Board
  • Sensors
  • probe

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Push Back Probes

Push Back Probes

Push Back Probes

This is a probe that can determine good or bad quality by retracting the tip of the contact pin (plunger) based on the shape of the measurement target.

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  • Printed Circuit Board
  • Sensors
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Rotation prevention probe

Rotation prevention probe

Rotation prevention probe

This is a probe equipped with a rotation prevention mechanism, necessary for using chips with an asymmetric tip shape.

  • Other Connectors
  • switch
  • Sensors
  • probe

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Step Probes for Position Testing

Step Probes for Position Testing

Step Probes for Position Testing

This is a probe that comes in various tip shapes and sizes, and can also be used to determine the quality of pin insertion for wire harnesses and connectors.

  • Other Connectors
  • switch
  • Sensors
  • probe

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