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probe Product List and Ranking from 152 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. テクネ計測 Kanagawa//Testing, Analysis and Measurement
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 インクス Tokyo//Machine elements and parts
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probe Product ranking

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Contact Probe Long Stroke NCP Series サンケイエンジニアリング 本社
  4. Flexible wire サンケイエンジニアリング 本社
  5. 4 Capacitive Moisture Meter Probe M Series 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社

probe Product List

91～120 item / All 730 items

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Custom order for contact probes

Custom order for contact probes

It will be designed according to the measured current value for high current applications.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • probe

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Custom order for contact probes compatible with high current.

Custom order for contact probes compatible with high current.

It will be designed according to the measured current value for high current support.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • probe

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Non-magnetic contact probe NMB series

Non-magnetic contact probe NMB series

Non-magnetic contact probe made of copper alloy

【Overview】 In the non-magnetic contact probe NMB series, the components from the probe tip to the connection part are made of non-magnetic copper alloy, and by using electroless plating, the magnetism of the probe body is minimized. Are you facing conditions or situations like these? - You cannot inspect products without a non-magnetic probe... - The probe has become magnetic, causing the measurement object to stick... Please feel free to contact us. We will suggest a probe that meets your measurement conditions. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Amplifier
  • Oscillator
  • Inductor Coil
  • probe

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Probe Mounting Adapter Socket AS Series

Probe Mounting Adapter Socket AS Series

Easily exchange probes using a socket. *Measurement jigs can also be manufactured!

【Features】 ○ Easy probe replacement. - By pressing an adapter socket into the mounting board, probes can be replaced by simply inserting and removing them from the socket. ○ Choice of connection methods. - Terminal connection socket for the probe - Solder connection socket for the socket - Terminal connection socket for the socket If you have any questions regarding specific probe model numbers and compatible socket model numbers, please contact us. For an overview of the series, please check the catalog. For details on compatible adapter sockets for each contact probe model number, please inquire on our website. http://www.sankei-engineering.com/ * We also accept requests for the production of fixtures for electrical measurements. No design drawings are necessary, and no knowledge of electrical measurements is required! You can request everything from design, concept, measurement methods, processing, assembly, to wiring as a complete service. 【Examples of measurement fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive component testing, etc.

  • Terminal Blocks
  • Other electronic parts
  • socket
  • probe

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【Four-terminal measurement compatible】 High current compatible coaxial contact probe

【Four-terminal measurement compatible】 High current compatible coaxial contact probe

It is a coaxial probe that can perform precise Kelvin measurements even during high current conduction.

【Overview】 ○ A single probe can connect terminals for both current and voltage. ○ Usable current: 50–300A (depending on size) ○ Heat resistance temperature: below 100℃ Product details can be confirmed from the catalog. The appropriate size varies depending on the current value. Please check the probe that matches your measurement conditions by contacting us through our website for more details. ● Sankei Engineering's website http://www.sankei-engineering.com/

  • Secondary Cells/Batteries
  • Lithium-ion battery
  • Engine parts
  • probe

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High-speed resin bush contact probe CPE series

High-speed resin bush contact probe CPE series

Smooth movement is maintained even with high-speed sliding.

【Overview】 - The sliding parts are made of resin. - Durability of the sliding parts: over 5 million cycles* - Heat resistance temperature: below 100°C - Safe current: 5 to 35A* - Mounting flange diameter: 2.2 to 9.0mm - The probe has a low resistance value, enabling precise measurements with an integrated structure. *Durability and safe current values vary depending on the size of the probe. We can suggest probes that meet your conditions. For more details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other electronic parts
  • Resistors
  • Capacitor
  • probe

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Screw-mounted contact probe CPM series

Screw-mounted contact probe CPM series

Secure the probe by screwing it onto the mounting board.

【Overview】 ○ Type that is screwed onto the mounting board ○ Durability of sliding parts: over 3 million times* ○ Heat resistance temperature: below 100°C ○ Safe current: 2–35A* ○ Mounting flange diameter: 1.6–10.0mm ○ Integrated structure with low resistance value of the probe, enabling precise measurements. ○ Prevents probe disconnection due to sliding of the probe or the rebound force of the spring. *Durability and safe current values vary depending on the size of the probe. We will suggest a probe that meets your conditions. For more details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other electronic parts
  • Resistors
  • Capacitor
  • probe

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Heat-resistant contact probe with anti-rotation mechanism, CPRU series

Heat-resistant contact probe with anti-rotation mechanism, CPRU series

A probe that can be used in high-temperature environments and does not rotate at the tip.

【Overview】 ○ Heat resistance temperature: Below 200-300℃ ○ Durability of sliding parts: Over 200,000 cycles* ○ Safe current: 7-15A* ○ Mounting flange diameter: 3.5-5.0mm ○ Integrated structure with low probe resistance, enabling precise measurements. ○ Probe with heat-resistant spring incorporated into the CPR series with anti-rotation mechanism. *Durability and safe current values vary depending on the size of the probe. We will suggest a probe that meets your conditions. For more details, please contact us through our website. We also offer contract measurement services for measurements under high and low temperatures (compatible with -180 to 300℃). For details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other electronic parts
  • Other Auto Parts
  • probe

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We propose a contact probe that can measure resistance with high precision!

We propose a contact probe that can measure resistance with high precision!

We provide products that match the material and shape of the workpiece, supporting the realization of your desired measurements!

For 40 years, we have been manufacturing contact probes used for various measurements. Based on the material, shape, and surface treatment of the workpiece, as well as measurement conditions (current value, energization cycle, ambient temperature, measurement speed), we will propose contact probes suitable for your usage conditions. If you have any questions or concerns regarding electrical measurements, please feel free to contact us through our website. ★http://www.sankei-engineering.com/★

  • Terminal Blocks
  • Inspection fixture
  • probe
  • probe

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[Free Selection Service] Solving "Unexplained Stops" in High Current Testing Lines

[Free Selection Service] Solving "Unexplained Stops" in High Current Testing Lines

No more worrying about "unexpected inspection line stoppages"! We identify the root cause and achieve a stable inspection line.

Do you have any experience with these troubles on the high current inspection line? - The line keeps stopping without being able to identify the cause. - Various types of probes have been tried, but there is no improvement. - There are suspicions of overheating or poor contact, but it cannot be isolated. The trouble may actually be caused by "abnormal overheating at the contact points due to high current conduction." Furthermore, this abnormal overheating could be caused by multiple factors intricately intertwined, such as increased resistance at the contacts, the occurrence of tiny sparks, or exceeding specifications due to harsh operating environments. Therefore, we will take your actual measurement work and the probes that are currently problematic, conduct actual measurements and experiments on contact resistance and other factors using our in-house equipment, clarify the mechanism of abnormal occurrences, and select and propose the optimal contact probe that leads to trouble resolution based on objective evidence from actual measurement data. ★ Please feel free to consult us first through the inquiry form on our website or by phone.

  • probe
  • probe

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High current and narrow pitch contact probe for power device power-on testing.

High current and narrow pitch contact probe for power device power-on testing.

For testing power modules and power control ICs! Solving challenges with a rich lineup and size customization.

In power device current testing, such as for power modules and power control ICs, do you have concerns like "I need to pass a large current despite the narrow electrode pitch"? At Sankei Engineering, we offer a wide range of contact probes designed to solve this challenge with "narrow pitch x large current compatibility." Our catalog includes products ranging from a minimum diameter of φ5.0mm (usable current up to 20A) to a maximum diameter of φ22.0mm (usable current up to 300A). Moreover, we can accommodate special electrode shapes and narrow pitch arrangements that are difficult to address with catalog items through custom orders. We can design and manufacture products optimized for your usage environment, including changes to the tip shape, adjustments to spring load, and size design tailored to your fixtures. We welcome inquiries at the stage of comparison and information gathering. Please feel free to consult us through the contact form on our website. *Please note that selecting large current probes requires caution. Here are the selection points and precautions [Power Device Selection Points URL].

  • probe
  • probe

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High current contact probe for battery charge and discharge testing.

High current contact probe for battery charge and discharge testing.

For testing EV batteries and cylindrical cells! Solving challenges with a rich lineup and custom sizes.

In the charging and discharging tests of EV batteries and cylindrical cells, do you have any concerns such as: "I am looking for a probe that can withstand long hours of continuous current" or "The contact area of the electrode is small, and standard products do not fit"? Sankei Engineering offers a wide range of high-current contact probes designed to solve these issues for battery charging and discharging tests. Our catalog includes a broad lineup, from a minimum diameter of φ5.0mm (usable current under 20A) to a maximum diameter of φ22.0mm (usable current under 300A). Furthermore, for special electrode shapes that are difficult to accommodate with catalog products or when the contact area is small, we can manufacture custom probes by changing the tip diameter and shape. We also provide design and manufacturing of products optimized for your usage environment, including adjustments to spring load and size design tailored to fixtures. Inquiries during the comparison and information-gathering stage are also welcome. Please feel free to consult us through the contact form on our website. *Care should be taken when selecting high-current probes. For selection points and precautions, please refer to [Battery Selection Points URL].

  • probe
  • Secondary Cells/Batteries
  • probe

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[Free Support] Resolving Probe Contact Issues in Power Device Power-On Testing

[Free Support] Resolving Probe Contact Issues in Power Device Power-On Testing

Poor contact causes sparks. There is a risk of damaging expensive devices?! We will provide free support from identifying the cause of poor contact to selecting probes.

In power device conduction tests, do you have concerns such as, "The contact resistance varies, and the reliability of the data cannot be ensured" or "No improvement even after replacing the probes multiple times"? The causes of contact failure in conduction tests include a variety of factors, such as: - Mismatch between the probe tip shape and the work material - Wear of the probe tip - Adhesion of foreign substances - Deformation of the spring due to high temperatures leading to reduced load and identifying these issues is not easy. Especially in conduction tests that carry large currents, contact failures can lead to abnormal heating or sparking during conduction, potentially resulting in significant losses such as damage to expensive devices or equipment failures. Therefore, we collect your workpieces and the probes you are currently using and conduct experiments on contact resistance and other factors using our own equipment. We visualize the data to identify the root causes of contact failures. Based on this, we propose the optimal probe shape and load conditions tailored to your usage conditions and work characteristics, and we provide free support all the way to the selection that leads to actual improvements. Please feel free to consult us through the inquiry form.

  • probe
  • probe

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[Free Support] Resolving Probe Contact Issues in Circuit Board Inspection

[Free Support] Resolving Probe Contact Issues in Circuit Board Inspection

Resolve measurement errors due to poor contact! By identifying the root cause and selecting the optimal probe, we will improve inspection yield.

Are you experiencing issues on your printed circuit board inspection line such as: "Measurement values are unstable due to poor contact," "Inspection fails on good boards, leading to increased rework," "Even after replacing the probes, poor contact occurs again shortly after"? The causes of poor contact in board inspection are varied and can include: - Adherence of solder flux - Mismatch between the probe tip and the board's shape and material - Wear of the probe tip and can be difficult to identify. Therefore, we will take your workpieces and the probes you are currently using, and conduct experiments on our own equipment to measure contact resistance and other factors. We will visualize the data to identify the root causes of poor contact. Based on this, we will propose the optimal probe shape and load conditions tailored to your usage conditions and workpiece characteristics, and we will support you free of charge all the way to the selection that leads to actual improvements. Please feel free to contact us through the inquiry form.

  • probe
  • probe

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[Free Support] Solving contact failure in connector insulation resistance testing

[Free Support] Solving contact failure in connector insulation resistance testing

There is also a risk of defective products being released due to poor contact?! We will provide free support from identifying the cause of poor contact to selecting probes.

Are you troubled by issues such as: - "The resistance value is unstable, lacking reliability in the data" - "The probe cannot make proper contact, posing a risk of defective products being released" - "Repeated retries occur during the contact check stage"? The causes of poor contact with connectors include: - Insufficient probe load - Mismatch between connector shape and probe tip shape - Wear on the probe tip - Adhesion of foreign substances and various other factors, making it difficult to identify the specific cause. Especially in insulation resistance testing, if the probe does not make proper contact, there is a risk that genuine defective products may be misjudged as good products and released. Therefore, we will take your workpieces and the probes currently in use and conduct experiments on contact resistance and other factors using our own equipment. We will visualize the data to identify the root cause of "why contact failure occurs." Based on that, we will propose the optimal probe shape and load conditions tailored to your usage conditions and workpiece characteristics, and we will provide free support all the way to the selection that leads to actual improvements. Please feel free to contact us through the inquiry form.

  • probe
  • probe

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Chromosome labeling with FISH probes [Whole chromosome labeling]

Chromosome labeling with FISH probes [Whole chromosome labeling]

FISH probe that fluorescently labels the entire specified chromosome. Identification of chromosomal structural abnormalities and chromosomal number abnormalities.

This is a fluorescently labeled FISH probe that stains the entire chromosome of the specified chromosome number. It allows for high-sensitivity visualization of individual chromosomes in cells during metaphase, enabling the identification of both chromosome number and structural chromosomal abnormalities. There are kits available that allow you to choose from four fluorescent colors and stain up to three different chromosome numbers simultaneously. Chromosomes are available for three species: human, mouse, and rat. 【Features】 ■ Ready-to-use product ■ Choice of fluorescent dyes from four colors ■ Simultaneous staining of up to three types of chromosomes ■ For confirming the number of chromosomes and checking for translocations between chromosomes

  • Other Nucleic Acid/DNA Research
  • DNA labeling kit
  • Staining Reagents
  • probe

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Contact probe

Contact probe

Products with low resistance using alloy materials, high current compatible products, and high-frequency compatible probes!

Introducing the "Contact Probe" handled by MKT Taisei. These are high-precision products based on in-house watch parts processing technology, designed for semiconductor applications, low resistance products using alloy materials, high current compatible products, and high-frequency probes (up to 3GHz). Additionally, we can accommodate custom specifications (changes in tip shape, material, plating, spring load, dimensions, etc.) based on our in-house processing equipment and experience for products not listed in the catalog, tailored to meet customer requests. 【Features】 ■ High-precision products based on in-house watch parts processing technology ■ Low resistance products, high current compatible products, high-frequency probes (up to 3GHz) ■ Custom specifications tailored to customer requests *For more details, please refer to the PDF document or feel free to contact us.

  • 2020-08-03_10h36_14.png
  • 2020-08-03_10h36_20.png
  • probe
  • probe

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Digital Probe Digi Crown

Digital Probe Digi Crown

Outstanding measurement performance

The Digi Crown digital probe features a multi-channel network compatibility (1 to 12 channels) flexible measurement line (supporting 1 to 372 sensors) and can be connected to a PC using an RS232 serial interface or a dedicated RS485 interface card for PCI or ISA bus. Digi Crown sensors are robust and highly reliable. With proven Marpos technology and an IP65 waterproof structure, they are suitable for use in harsh field environments. The measurement network allows for remote high-speed data exchange up to 1 km using RS485 serial communication capabilities.

  • Other measurement, recording and measuring instruments
  • probe

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Probe T18/TS30/OTS30/WRTS

Probe T18/TS30/OTS30/WRTS

Flexible Optical Technology Non-Contact Shaft Measurement System

The T18 is a compact touch probe suitable for tool detection applications such as NC lathes and machining centers. The TS tool setter line is a compact tool setting application designed for use with machining centers.

  • probe
  • probe

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Tool setting probe for vertical machining center TS30

Tool setting probe for vertical machining center TS30

Cable connection transmission type with built-in interface.

The TS Tool Setter Line is a compact tool setting application designed for use with machining centers.

  • probe
  • probe

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Tool setting probe for vertical machining centers WRTS

Tool setting probe for vertical machining centers WRTS

Flexible Optical Technology Non-Contact Shaft Measurement System

The TS tool setter line is a compact tool setting application for use with machining centers.

  • probe
  • probe

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High-precision touch probe T25P

High-precision touch probe T25P

High-precision probe with a repeatability accuracy of 0.25 µm (2σ) using a piezoelectric element.

The T25P is based on piezoelectric technology, guaranteeing remarkable accuracy and a repeatability within 0.25 µm (2σ). The T25P is designed to control workpieces with complex surface shapes, such as cutting edges and gears. Furthermore, its design and astonishing precision make it a solution for probing workpieces on polishers and grinders.

  • T25P_022.jpg
  • lathe
  • Milling machine
  • Grinding Machine
  • probe

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Wireless Communication Scanning Probe 'WRSP60'

Wireless Communication Scanning Probe 'WRSP60'

The "touch" operation necessary for positioning parts is also possible! High-speed on-machine measurement by the processing machine.

The "WRSP60" is a wireless communication scanning probe designed for use with machining centers and milling machines. It allows for direct verification of the profile of machined workpieces on the machine, improving quality in the production process and optimizing cycle time. It enables measurements that cannot be achieved with standard touch probes, thereby reducing cycle time. 【Convenience】 ■ High-speed on-machine measurement by the machining machine ■ Improvement of production quality ■ Enhancement of machine productivity ■ Real-time monitoring of production quality ■ Long battery life ■ Easy installation and operation *For more details, please download the PDF or feel free to contact us.

  • WRSP60 2.PNG
  • WRSP60 3.PNG
  • probe
  • probe

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Magnetic Field Probe MMP500

Magnetic Field Probe MMP500

Capable of measuring conductive interference noise up to 9 kHz low frequency.

To conduct a conducted disturbance noise test, we use a LISN (Line Impedance Stabilization Network). However, based on the demand for a more convenient way to perform this test or to identify the noise source, the magnetic field probe MMP500 was developed. With the MMP500 and the signal analyzer MSA538E/MSA558E, it is possible to easily measure this conducted disturbance noise. The MMP500 was developed in collaboration with the Tokyo Metropolitan Industrial Technology Research Institute, an independent administrative institution.

  • Time-frequency measurements
  • probe

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Temperature and Humidity Sensor Probe 'HYT939P P14 Assembly'

Temperature and Humidity Sensor Probe 'HYT939P P14 Assembly'

System integration made easy! We also accommodate requests for custom calibration and assembly options.

The "HYT939P P14 Assembly" is a compact, ready-to-use sensor that continuously and accurately measures relative humidity and temperature. With its digital interface and compact screw-in housing, system integration is easy. We also accommodate requests for custom calibration and assembly options. Please feel free to contact us when needed. 【Features】 ■ Pressure resistance: 16 bar ■ Factory calibrated sensor for continuous temperature and humidity measurement ■ Compact screw-in type achieving minimum insertion depth for airtight installation ■ Resistant to condensation and temperature changes ■ Long lifespan for industrial applications *For more details, please download the PDF (English version) or feel free to contact us.

  • probe
  • probe

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Contact Revival Agent Polycool King

Contact Revival Agent Polycool King

Remove dirt from the connector and charging terminal to restore the flow of electricity.

Contact revival agent formulated with special additives based on 100% synthetic α-olefin.

  • others
  • probe

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Atmospheric pressure Langmuir probe

Atmospheric pressure Langmuir probe

We have successfully developed the world's first Langmuir probe that can be used at atmospheric pressure.

- This is the world's first Langmuir probe capable of measuring parameters of atmospheric pressure, such as plasma torches and arc plasma, as well as thermal plasma. - It can be used at high temperatures due to the cooling water system. - Measurements can be taken with a step time resolution of 12.5 ns. (As of November 2012, the fastest in the world according to our research) - The sampling rate is 80 MSPS (V, I), making it the fastest in the world. (As of November 2012, the fastest in the world according to our research) - The automatic linear drive system allows the probe to be moved to the plasma with a step resolution of 0.025 mm, enabling spatial distribution analysis. - Equipped with an effective automatic probe tip cleaning mechanism for deposition gases. The replacement of the probe tip is also easy. - The size of the probe shaft can be customized.

  • Analytical Equipment and Devices
  • probe

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Wavecontrol Low Frequency Isotropic Electromagnetic Field Probe WP400

Wavecontrol Low Frequency Isotropic Electromagnetic Field Probe WP400

Wide frequency range 1Hz to 400KHz isotropic electric and magnetic field measurement probe. 2-in-1 probe WP400 capable of spectrum analysis.

This product has also been adopted at airports in Paris. 【Features】 - High-precision measurement of electric and magnetic fields - Wide frequency range and high dynamic range - Isotropic & true RMS measurement - Spectrum analysis - Selective and broadband measurements in all three axes through FFT processing - Compliant with international standards

  • EMC Testing
  • Strength Testing Equipment
  • Other electronic measuring instruments
  • probe

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Wavecontrol Inc. Isotropic Electric Field Probe WPF Series

Wavecontrol Inc. Isotropic Electric Field Probe WPF Series

High-performance isotropic electric field probe

**Features** - High sensitivity - Isotropic & RMS measurement - Excellent attenuation - Compliance with international standards **Frequency Range** - [WPF3] 100KHz - 3GHz - [WPF6] 100KHz - 6GHz - [WPF8] 100KHz - 8GHz - [WPF18] 300KHz - 18GHz - NEW!! [WPF40] 20MHz - 40GHz **Sensor Type** Isotropic, RMS **Frequency Response Type** Flat

  • EMC Testing
  • Strength Testing Equipment
  • Other electronic measuring instruments
  • probe

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Near Field Probe ~40GHz HR-E 40-1

Near Field Probe ~40GHz HR-E 40-1

Near-field probe capable of measuring up to 40GHz.

The HR-E 40-1 electric field probe was developed for the analysis and measurement of high-frequency structures (such as 5G modules and microwave components). The HR-E 40-1 is a passive near-field probe designed to measure electric fields up to 40GHz. The probe's resolution is 0.2mm. For reproducible measurements of circuits and signal lines, it is recommended to use a test setup with the LangerIC scanner.

  • Other electronic measuring instruments
  • EMC Testing
  • probe

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