Resolve measurement errors due to poor contact! By identifying the root cause and selecting the optimal probe, we will improve inspection yield.
Are you experiencing issues on your printed circuit board inspection line such as: "Measurement values are unstable due to poor contact," "Inspection fails on good boards, leading to increased rework," "Even after replacing the probes, poor contact occurs again shortly after"? The causes of poor contact in board inspection are varied and can include: - Adherence of solder flux - Mismatch between the probe tip and the board's shape and material - Wear of the probe tip and can be difficult to identify. Therefore, we will take your workpieces and the probes you are currently using, and conduct experiments on our own equipment to measure contact resistance and other factors. We will visualize the data to identify the root causes of poor contact. Based on this, we will propose the optimal probe shape and load conditions tailored to your usage conditions and workpiece characteristics, and we will support you free of charge all the way to the selection that leads to actual improvements. Please feel free to contact us through the inquiry form.
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Flow of Use 1. Inquiry: We will hear about your current issues and usage environment (current values, temperature, etc.). Web meetings or direct visits for discussions are also possible. 2. Work Submission: You will send us your workpieces or contact probes related to your current issues. 3. Experiment: We will conduct measurements and experiments, such as contact resistance, using our equipment. 4. Proposal: We will propose the optimal products along with the measured data (report). 5. Sample Provision: If desired, we will prepare sample products for you to try on-site. *If we cannot accommodate with existing catalog items, we also accept design and manufacturing of custom products.
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Contact probes are indispensable for the manufacturing of all precision instruments. Since entering this field 50 years ago, Sankei Engineering has actively worked on "technologies and products that cannot be imitated by other companies," accumulating unique know-how. Particularly in specialized areas that require high precision, such as measurements under high current, high voltage, and extreme temperatures, it is difficult to meet the demands without our outer spring type (integrated) contact probes, establishing a significant competitive advantage in this market.
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