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probe - メーカー・企業154社の製品一覧とランキング

更新日： 集計期間:Oct 01, 2025～Oct 28, 2025
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probeのメーカー・企業ランキング

更新日： 集計期間:Oct 01, 2025～Oct 28, 2025
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  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
  3. TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
企業ランキングへ

probeの製品ランキング

更新日： 集計期間:Oct 01, 2025～Oct 28, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. AC Current Probe "CWT Mini50HF" 日本オートマティック・コントロール 電子システム部
  3. Connection terminal TA series サンケイエンジニアリング 本社
  4. 4 Flexible wire サンケイエンジニアリング 本社
  5. 5 Examples of probes for electromagnetic and eddy current thickness gauges.

probeの製品一覧

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Metal and resin precision machining contract services

Metal and resin precision machining contract services

We provide advanced processing technology cultivated through the production of contact probes and various inspection jigs.

Our company is a manufacturer of contact probes used for inspecting various electronic components, as well as inspection fixtures that utilize these probes. The technology required in these fields is at an extremely high level, characterized by "ultra-high precision" and "ultra-fine" specifications. Our technology, which has been refined over many years to meet these demands, has solved various challenges not only in inspection-related areas but also across a wide range of applications. We also offer this technology as a processing contract service. *For more details, please download the PDF or contact us.*

  • plastic
  • Processing Contract

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Non-magnetic contact probe for tests that dislike magnetism.

Non-magnetic contact probe for tests that dislike magnetism.

Achieving a pitch of P=0.2mm! Active in environments that require strict non-magnetic properties. Uses materials suitable for lead-free electrodes.

To non-magnetize contact probes, it is essential to review the materials and surfaces, but in practice, that alone is not sufficient for the product to be viable. It is only natural that they should be non-magnetic when measuring non-magnetic devices, but they must also possess performance tailored to the characteristics of the electrodes being inspected. Our company offers a lineup of "non-magnetic probes" that are suitable for lead-free electrodes, provide load control for contact probes, and achieve a pitch of P=0.2mm. [Features] ■ Materials suitable for lead-free electrodes ■ Load control for contact probes ■ Achieves pitch compatibility of P=0.2mm *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other electronic parts
  • Inspection fixture

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Apex P = 80μ~ with two-point contact! Kelvin contact probe

Apex P = 80μ~ with two-point contact! Kelvin contact probe

By bringing the tip of the contact probe closer to the outside, the gap between the two points can be minimized without changing the thickness of the pin. Pin pitch between 0.4mm and...

The "Kelvin Probe" has its tip positioned right at the edge of the probe's outer shape. By moving the tip outward, it is possible to minimize the gap between two points without changing the thickness of the pin. This allows for stable contact at a fixed position and the maintenance of load. Special board processing is required for use. Our company offers the fabrication of fixtures that can be installed according to the measuring equipment used by our customers. 【Features】 ■ The tip is positioned right at the edge of the probe's outer shape. ■ It can minimize the gap between two points without changing the thickness of the pin. ■ Stable contact at a fixed position. ■ It can maintain load. *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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For tests requiring stable contact resistance values. Bias probe.

For tests requiring stable contact resistance values. Bias probe.

We respond to the need to minimize the variability in resistance values specific to contact probes as much as possible.

By using a bias structure and inserting a ball, we were able to increase the contact pressure on the inner wall of the pipe; however, this also resulted in significant damage to the inner wall, leading to issues such as probe sticking when used repeatedly. To address these disadvantages, Seiken combined parts using precision machining technology instead of balls, thereby reducing damage to the inner wall of the pipe while maintaining the characteristics obtained through bias. Furthermore, by miniaturizing the parts, we can also create a bias structure compatible with P=0.4mm. We respond to the need to minimize variations in resistance values specific to contact probes, such as in low-resistance measurements. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe
  • Other electronic parts
  • Inspection fixture

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Contact probe for improving contact with lead-free solder.

Contact probe for improving contact with lead-free solder.

Compared to conventional BeCu products, it is equivalent or even superior, so wear resistance is not a concern.

At Seiken, in addition to our approach to surface treatment, we have re-evaluated the materials themselves. Traditionally, we used BeCu (beryllium copper), which required surface treatment. However, we have processed an alloy that excels in solder contact properties, allowing it to be used as is without any surface treatment. Even when cleaning the pin tips, the plating thickness is at most 1-2 micrometers, but since the alloy is used in its solid form, there is no risk of plating peeling that would expose the base material and degrade performance. Additionally, the hardness is comparable to or greater than that of traditional BeCu, so wear resistance is not a concern. This material can also be processed for probes in the P=80 micrometer class. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe

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Contact probes for semiconductor testing, IC sockets, probe cards

Contact probes for semiconductor testing, IC sockets, probe cards

Flexible design and manufacturing according to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring, to inspection.

Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ☆Contact Probes☆ We can flexibly accommodate not only standard products but also special specifications tailored to testing conditions. ☆Probe Cards and IC Sockets☆ We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suitable for the inspection target at a low cost. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: high frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 <Contact Probes> - Reduces replacement hassle. "Rare metal probes" with excellent durability. - Revised internal structure. "New bias probes" for stable resistance value measurement. <IC Sockets> - Non-magnetic compatible sockets. - High heat resistant sockets. <Probe Cards> - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.*

  • Other semiconductors

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I would like to know again "How to use contact probes" *Free materials are currently being offered.

I would like to know again "How to use contact probes" *Free materials are currently being offered.

A specialized manufacturer of contact probes explains! How to use and replace standard probes and both-end probes.

We would like to introduce the usage of the "Contact Probe" that we handle. The "Standard Contact Probe (Single-End Probe)" is basically used in pairs with a socket due to the ease of replacement and wiring. The general method of using a contact probe involves drilling a hole in the resin, embedding a socket (receptacle) in it, and connecting the lead wires for wiring. Finally, the contact probe is inserted into the socket to complete the setup. Additionally, our website also provides information on "How to Use a Double-End Contact Probe" and "Replacing a Double-End Probe." [Content Included] ■ How to Use the Standard Probe ■ How to Use the Double-End Probe ■ Replacing the Double-End Probe *For more details, please refer to the PDF materials or visit our website.

  • probe

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Temperature and Humidity Relative Humidity Conversion Probe / Part Number M500T-737A31

Temperature and Humidity Relative Humidity Conversion Probe / Part Number M500T-737A31

Relative humidity, temperature, dew point temperature, absolute humidity

●Digital calibration, no calibration potentiometer required ●RS-232C output ●Please place orders in multiples of 5 if possible.

  • others
  • Other electronic measuring instruments

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Temperature and Humidity Sensor Probe / Model Number MD34SMF-2716T

Temperature and Humidity Sensor Probe / Model Number MD34SMF-2716T

Easy setup and measurement with smartphone/tablet.

● Easy setup and measurement with smartphone/tablet This device uses Bluetooth to wirelessly display measurement data on a smartphone/tablet. By using the app on your smartphone/tablet, the operation is intuitive and easy, unlike previous measuring devices. To use it, simply turn on Bluetooth on your smartphone/tablet, launch the app, and press the button on the probe. This allows for measurement, and you can also obtain necessary calculated values in application mode. The smartphone/tablet is compatible with both Android and iOS devices. ● Graphical display and data storage/transmission By using the app on your smartphone/tablet, you can display not only the current measurement values but also trend graphs and reports in a graphical format, as well as log displays. Even in current value display, it is possible to show values from multiple probes and calculated values simultaneously. Measurements can be taken as single or continuous measurements, and the measured data can be saved in PDF/Excel format (Android only) and sent via email. The app supports multiple languages, including Japanese, in 11 languages.

  • Thermo-hygrometer

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Ultra-thin sensor probe Φ1.1mm M3272RT-2892G

Ultra-thin sensor probe Φ1.1mm M3272RT-2892G

High-precision reference thermometer with ultra-fine sensor probe Φ1.1mm / Model number M3272RT-2892G

● High-precision calibration possible around 37°C (ideal for references in medical products such as in vitro fertilization) ● High resolution of 0.01°C and high accuracy ● Precision ultra-fine probe Ø1.1 mm ● Calibration/tracability certification available ● Robust and long-lasting ● Made in Germany

  • Thermometer

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Portable measuring device Pt100/Pt1000/MC8P472IS

Portable measuring device Pt100/Pt1000/MC8P472IS

Portable measuring device Pt100/Pt1000 sensor probe (with SICRAM module) / Model number MC8P472IS

Response time for a 63% change (τ0.63) The response time τs is the sensor's reaction time to a 63% temperature change. The response times are based on the following: immersion probe = 100°C in water, surface probe = 200°C on a metal surface, air probe = 100°C in air. *For RTD sensors, do not subject the sensor to strong physical or thermal shocks at temperatures above 400°C. This may cause irreparable damage.

  • Food Testing/Analysis/Measuring Equipment

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