Supports 30 MHz to 6 GHz. A new standard for high-frequency magnetic field measurement.
The measurement coil of the XFS-B 3-1 magnetic field scanner probe is arranged orthogonally to the probe shaft. By positioning the probe head vertically, the measurement coil makes direct contact with the surface of the printed circuit board. This allows it to be used in areas of the printed circuit board surface that are typically difficult to access, such as between large components of a switching controller. The XFS-B 3-1 is a passive near-field probe that detects magnetic field lines radiating at a 90° angle from the object being measured. Magnetic field lines entering from the lateral side of the probe are not detected. Unlike the XFS-R 3-1 magnetic field scanner probe, the coil is positioned at a 90° angle at the tip of the probe. This near-field probe is compact and portable, and it is electrically shielded due to its current-damping sheath. It can be connected to a spectrum analyzer or oscilloscope with a 50Ω input. The magnetic field probe has a built-in termination resistor.
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basic information
● Frequency range: 30 MHz to 6 GHz ● Connection: 50 Ω coaxial (SMA connector) ● Structure: Coil structure arranged at 90° (ideal for narrow space measurements) ● Dimensions: Approximately 100 mm (length) × 3 mm (diameter at the tip) ● Applications: EMC measurements, noise source identification, magnetic field measurements around switching power supplies ● Compatible devices: Spectrum analyzer, oscilloscope (50 Ω input)
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Applications/Examples of results
● Magnetic field measurement around switching power supplies → High-precision visualization of magnetic field distribution in hard-to-access areas such as gaps in large components. ● EMC evaluation of printed circuit boards → Used for identifying EMI noise sources and verifying the effectiveness of countermeasure components. ● Effect confirmation of shielding materials and filters → Comparison of magnetic field strength before and after countermeasures to evaluate the effectiveness of EMC measures. ● Collaborative measurement with spectrum analyzers → Directly connected to 50Ω input devices to check magnetic field strength in real-time. ● Research and development, educational purposes → Used for EMC education and field analysis during circuit design. Also implemented in universities and technical research institutes. ● Local measurements in anechoic chambers and shielded rooms → Utilized as a supplementary measurement tool to identify sources of high-frequency noise.
Detailed information
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Scanner Probe 30MHz to 6GHz (XFS-B 3-1)
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Scanner Probe 30MHz to 6GHz (XFS-B 3-1) Specifications
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Company information
As a company that provides unique and innovative solutions in EMC testing and general measurement, Wavecrest Corporation is active in this field. The increasingly sophisticated electronic and communication environment not only affects the performance of its products but also serves as a social infrastructure that impacts the overall safety of society, requiring high levels of safety and reliability. We aim to provide new products and solutions that the market needs, without being constrained by traditional testing methods and equipment.
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