Analysis of "Secondary Ion Mass Spectrometry"
It is an analytical method made possible by excellent measurements!
"Secondary Ion Mass Spectrometry" is a method for compositional analysis of all elements containing hydrogen by mass analysis of secondary ions emitted when Cs or O2 ions in the range of several keV are irradiated onto a sample. It enables highly sensitive elemental analysis and excellent depth resolution measurements using low-energy ions. [Features] - Compositional analysis of all elements containing hydrogen - Elemental analysis is possible - Measurement of depth resolution using low-energy ions is possible *For more details, please refer to the catalog or feel free to contact us.
- Company：イオンテクノセンター
- Price：Other
