We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Contact Probe.
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Contact Probe Product List and Ranking from 38 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.

Contact Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング Kanagawa//Manufacturing and processing contract 本社
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. 精研 Tokyo//Electronic Components and Semiconductors 本社
  4. 4 湘南エンジニアリング Kanagawa//Industrial Electrical Equipment
  5. 5 UIGREEN Kanagawa//Machine elements and parts
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Contact Probe Product ranking

Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  5. 5 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

Contact Probe Product List

151～165 item / All 188 items

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Inspection fixtures made by probe manufacturers

Inspection fixtures made by probe manufacturers

A wide variety of probes in stock! Leave the selection of probes to us!

Our company offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types. Since we design in-house, we can also manufacture components, allowing us to meet customer requests in a short delivery time. As a probe manufacturer, we have many inspection fixtures that we can create, so please feel free to consult with us. 【Features】 ■ Low price ■ Support for small quantities of probes ■ Short delivery time with in-house design ■ Components can also be manufactured in-house *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Inspection fixture
  • Processing Jig

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New Switch Pin "ND-SW Series"

New Switch Pin "ND-SW Series"

A switch pin with a single internal contact that significantly improves durability.

The "ND-SW Series" is one of our features, incorporating the know-how of integrated probes that have been used by many customers over the years, into a switch pin. We offer the "ND-SW-2.4 (φ3.0 POM)" and its corresponding socket, which allows the rear end to move when the tip strokes. Additionally, since there is only one internal contact, it excels in durability and cost performance. 【Features】 ■ Incorporates know-how of integrated probes ■ Only one internal contact ■ Excellent durability and cost performance *For more details, please refer to the PDF document or feel free to contact us.

  • switch

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High-frequency (millimeter wave) probe "Precision ultra-short probe"

High-frequency (millimeter wave) probe "Precision ultra-short probe"

Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!

We provide probes designed with consideration for the conditions of high-frequency measurement, allowing for highly accurate measurements. The measurable frequency range is 7GHz, suitable for 50Ω lines on high-frequency substrates. *For more details, please download the PDF or contact us.*

  • probe

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Features of layered probes

Features of layered probes

Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.

We would like to introduce the features of the Inks' layered probe. The semi-layered probe contacts with a single metal plate, allowing for measurements with structurally stable contact resistance. Additionally, it is resistant to degradation of spring properties due to heat, making it suitable for measuring power semiconductors that apply high current and high voltage. It can make contact with points arranged in narrow pitches, such as semiconductor lead parts and connector contacts, up to a maximum pitch of 0.05. Furthermore, by varying the shape of the probe body and the thickness of the auxiliary V-shaped leaf spring, it is possible to adjust the load from high to low continuously. 【Features】 ■ Stable contact resistance value (demonstrates power in precise measurements) ■ Supports high current and high voltage (contributes to application and measurement of power semiconductors) ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch) ■ Adjustable contact load (contact tailored to the characteristics of the measured object) *For more details, please refer to the external link page or feel free to contact us.

  • probe

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Explained in a video! The mechanism of layered probes [Free case study provided]

Explained in a video! The mechanism of layered probes [Free case study provided]

A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!

In today's world of miniaturization, are you facing difficulties with measurements using conventional probes? With Inks' "Stacked Probes," we can make contact with a single metal plate, allowing us to accommodate a minimum pitch of 0.05 mm. On this page, we present a video showcasing our "Stacked Probes" in action. Please take a look. 【Features】 ■ Stable contact resistance values ■ Supports high current and high voltage ■ Compatible with narrow pitches ■ Adjustable contact load, etc. *For more details, please download the PDF or contact us.

  • probe

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Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

【Layered Probe Brochure Giveaway】Compatible with high current and high temperature. Achieving stable contact resistance values!

The "Layered Probe Brochure" introduces the excellent features of layered probes in comparison to conventional spring probes. Are you facing issues such as "unstable contact resistance," "looking for probes that can handle narrow pitches," "wanting to measure under high current and high temperature," or "seeking probes with superior durability"? With Inks' "Layered Probes," these problems can be resolved! 【Contents】 ■ Structure of Layered Probes ■ Features of Layered Probes ■ Layered Probes Q&A, etc. *For more details, please download the PDF or contact us.

  • probe

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[Example] Stable contact of the stacked probe

[Example] Stable contact of the stacked probe

Introduction to stable contact with the package lead.

The wiping effect of the "stacked probe" removes the oxide film while making contact, achieving stable contact. Additionally, a coating that suppresses tin transfer has been applied to the probe tip, resulting in increased longevity. For magnetic sensor packages, it is also possible to construct the probe unit using only non-magnetic materials. In this case, stable contact was achieved with 2 million cycles of no maintenance. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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[Example] Contact at narrow pitch and multiple points with a stacked probe.

[Example] Contact at narrow pitch and multiple points with a stacked probe.

Contributing to reduced inspection time and improved production through simultaneous multi-point contact.

We would like to introduce the narrow pitch and multi-point contact of the "stacked probe" that we handle. By stacking 50 probes with a thickness of 0.1mm in a fan shape at a 0.2mm pitch, we have achieved simultaneous contact at 50 points. This has led to a reduction in inspection time and contributed to increased productivity. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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[Example] Probe design tailored to existing equipment (narrow space)

[Example] Probe design tailored to existing equipment (narrow space)

Designed probes to fit within limited space, contributing to cost reduction.

We would like to introduce the probe design (for narrow spaces) tailored to the existing equipment for our "stacked probes." In this case, we used a probe for LED inspection. Since we can design the probe to fit into the limited space of existing equipment, there is no need to purchase new equipment, contributing to cost reduction. 【Features of Stacked Probes】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Durability of layered probes

Durability of layered probes

Contributed to improved productivity and cost reduction with 1 million to 10 million contact achievements.

The "laminated probe" is made of a single-piece leaf spring structure, which eliminates issues such as component interference from multiple parts, resulting in exceptional durability. When the contact target is tin (Sn), applying a conductive coating to the tip of the probe suppresses tin transfer, enabling stable inspection. Additionally, due to its high sliding properties and very hard membrane, it excels in wear resistance and durability. As a result, the probe is expected to have a longer lifespan. 【Expected Effects】 ■ Prolonged lifespan of the probe ■ Improved test yield ■ Reduced re-inspection ■ Decreased cleaning and maintenance tasks ■ Increased operational rate of evaluation equipment *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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TITAN T26D Dual-Type Probe Head (~26GHz)

TITAN T26D Dual-Type Probe Head (~26GHz)

Affordable differential measurements from DC to 26GHz!

The probe chip, thanks to MPI's unique MEMS technology, has very high visibility, making probing easy for anyone. The high-precision and robust chips, which are on par with competitors, offer a long lifespan and affordable pricing, resulting in a high cost-performance ratio. Agent in Japan: Vector Semicon Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

  • probe

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[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.

This is a cantilever that can be used with commercially available scanning probe microscopes and atomic force microscopes. Products from "NanoWorld," the world's largest probe manufacturing group, are used for various applications such as routine measurements in manufacturing process management, solid surface observation, material analysis, research on polymer materials, and biomaterials. We supply high-quality cantilevers with sharp tips and low variability in characteristics, as well as cantilevers equipped with probes suitable for industrial applications with high durability. [Contents] - Probes for AC mode non-contact mode - Probes for contact mode force-distance measurements - Broad compatibility for various measurement modes such as electrical and magnetic measurements - Colloid probes suitable for soft measurement targets like polymers and biomaterials - Self-exciting, self-detecting type - AFM accessories such as metal disks for fixing mica and HOPG samples *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other measurement, recording and measuring instruments

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Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

High aspect ratio SPM/AFM probes that can fit into narrow groove structures!

This product is suitable for quantitative measurements in the depth direction, which are difficult to measure with laser microscopes, such as line & space and trenches. Are you struggling with low surface shape reproducibility with your current probe? Cases where the groove shape is not accurately measured due to the opening angle of the probe tip can be improved by using a probe with a high tip aspect ratio. 【Features】 ■ Well-suited for quantitative measurements in the height direction, which are difficult to measure with laser microscopes ■ Improves cases where the groove shape is not accurately measured due to the opening angle of the probe tip *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes

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Probe for Scanning Probe Microscopy (SPM)

Probe for Scanning Probe Microscopy (SPM)

A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

  • probe
  • Other microscopes

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High voltage (10kV) compatible coaxial probe holder

High voltage (10kV) compatible coaxial probe holder

High voltage measurement, 10kV compatible, coaxial probe holder.

The HVP-CX-10 comes with a 10kV UHV connector and coaxial cable, allowing for measurements of up to 10kV. The needle vice at the tip of the holder securely holds the needle with simple operation. The SP100 positioner with a T-type arm is ideal for the HVP series probe holders. Additionally, micro positioners with a T-type arm, such as "SP-150" and "S-926," can also be used.

  • probe

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