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Contact Probe Product List and Ranking from 40 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

Contact Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 精研 本社 Tokyo//Electronic Components and Semiconductors
  3. テクノプローブ Chiba//Testing, Analysis and Measurement
  4. 4 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
  5. 5 インクス Tokyo//Machine elements and parts
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Contact Probe Product ranking

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  5. 5 Probe Mounting Adapter Socket (High Pressure Type) AS-S Series サンケイエンジニアリング 本社

Contact Probe Product List

136～150 item / All 191 items

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[Example] Probe design tailored to existing equipment (narrow space)

[Example] Probe design tailored to existing equipment (narrow space)

Designed probes to fit within limited space, contributing to cost reduction.

We would like to introduce the probe design (for narrow spaces) tailored to the existing equipment for our "stacked probes." In this case, we used a probe for LED inspection. Since we can design the probe to fit into the limited space of existing equipment, there is no need to purchase new equipment, contributing to cost reduction. 【Features of Stacked Probes】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Durability of layered probes

Durability of layered probes

Contributed to improved productivity and cost reduction with 1 million to 10 million contact achievements.

The "laminated probe" is made of a single-piece leaf spring structure, which eliminates issues such as component interference from multiple parts, resulting in exceptional durability. When the contact target is tin (Sn), applying a conductive coating to the tip of the probe suppresses tin transfer, enabling stable inspection. Additionally, due to its high sliding properties and very hard membrane, it excels in wear resistance and durability. As a result, the probe is expected to have a longer lifespan. 【Expected Effects】 ■ Prolonged lifespan of the probe ■ Improved test yield ■ Reduced re-inspection ■ Decreased cleaning and maintenance tasks ■ Increased operational rate of evaluation equipment *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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TITAN T26D Dual-Type Probe Head (~26GHz)

TITAN T26D Dual-Type Probe Head (~26GHz)

Affordable differential measurements from DC to 26GHz!

The probe chip, thanks to MPI's unique MEMS technology, has very high visibility, making probing easy for anyone. The high-precision and robust chips, which are on par with competitors, offer a long lifespan and affordable pricing, resulting in a high cost-performance ratio. Agent in Japan: Vector Semicon Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

  • probe

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[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.

This is a cantilever that can be used with commercially available scanning probe microscopes and atomic force microscopes. Products from "NanoWorld," the world's largest probe manufacturing group, are used for various applications such as routine measurements in manufacturing process management, solid surface observation, material analysis, research on polymer materials, and biomaterials. We supply high-quality cantilevers with sharp tips and low variability in characteristics, as well as cantilevers equipped with probes suitable for industrial applications with high durability. [Contents] - Probes for AC mode non-contact mode - Probes for contact mode force-distance measurements - Broad compatibility for various measurement modes such as electrical and magnetic measurements - Colloid probes suitable for soft measurement targets like polymers and biomaterials - Self-exciting, self-detecting type - AFM accessories such as metal disks for fixing mica and HOPG samples *For more details, please refer to the PDF document or feel free to contact us.

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  • Other measurement, recording and measuring instruments

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Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

High aspect ratio SPM/AFM probes that can fit into narrow groove structures!

This product is suitable for quantitative measurements in the depth direction, which are difficult to measure with laser microscopes, such as line & space and trenches. Are you struggling with low surface shape reproducibility with your current probe? Cases where the groove shape is not accurately measured due to the opening angle of the probe tip can be improved by using a probe with a high tip aspect ratio. 【Features】 ■ Well-suited for quantitative measurements in the height direction, which are difficult to measure with laser microscopes ■ Improves cases where the groove shape is not accurately measured due to the opening angle of the probe tip *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes

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Probe for Scanning Probe Microscopy (SPM)

Probe for Scanning Probe Microscopy (SPM)

A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

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  • Other microscopes

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High voltage (10kV) compatible coaxial probe holder

High voltage (10kV) compatible coaxial probe holder

High voltage measurement, 10kV compatible, coaxial probe holder.

The HVP-CX-10 comes with a 10kV UHV connector and coaxial cable, allowing for measurements of up to 10kV. The needle vice at the tip of the holder securely holds the needle with simple operation. The SP100 positioner with a T-type arm is ideal for the HVP series probe holders. Additionally, micro positioners with a T-type arm, such as "SP-150" and "S-926," can also be used.

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List of Contact Probes by Application

List of Contact Probes by Application

As a custom manufacturing company, we develop and produce various contact probes. We will provide optimal proposals based on our accumulated know-how.

Contact Probe Usage List - Z Pin-RF Test Custom Probe Pin - Kelvin Connection Test Probe Pin Pitch ≥ 0.35mm - High Current Test Probe Pin - 30A - H Pin - High Power RF Test Probe Pin - Pogo Tower Probe - Probe for Burn-In Testing - Module Test Power Probe Pin - Module Test Probe Pin and many others *For more details, please feel free to contact us or download the PDF materials.

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Contact probe [tip shape suitable for application] 0.40mm (recommended)

Contact probe [tip shape suitable for application] 0.40mm (recommended)

Advanced design achieves excellent contact stability and long lifespan, accommodating up to 300,000 cycles.

The UIGREEN contact probe features high precision contact and excellent durability. Thanks to its unique design, it achieves outstanding contact stability and long lifespan, capable of withstanding 300,000 cycles. The materials that can be handled include Pd Alloy (palladium alloy), Be-Cu (beryllium copper), Au Alloy (gold alloy), and SK (steel). It is designed to prevent pin jamming and sticking, providing a reliable connection. 【Features】 ■ Capable of handling everything from design to assembly in a consistent system ■ Achieves precision processing for extremely small areas through a unique manufacturing method ■ Realizes low internal resistance through proprietary in-house design technology *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Contact probe [tip shape suitable for application] 0.50mm (recommended)

Contact probe [tip shape suitable for application] 0.50mm (recommended)

High precision contact and excellent durability! The design prevents pin jamming and sticking.

We would like to introduce the contact probes we handle. Thanks to our unique design, we achieve excellent contact stability and long lifespan, accommodating up to 300,000 cycles. Our proprietary manufacturing process allows for precision tip processing for extremely small areas. We provide consistent manufacturing from design to assembly. Please feel free to contact us. 【Available Materials】 ■Pd Alloy (Palladium Alloy) ■Be-Cu (Beryllium Copper) ■Au Alloy (Gold Alloy) ■SK (Steel) *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Contact probe [tip shape suitable for application] 0.65mm (recommended)

Contact probe [tip shape suitable for application] 0.65mm (recommended)

Achieving low internal resistance through our unique in-house design technology! We handle everything from design to assembly with integrated manufacturing.

The UIGREEN contact probe features high precision contact and excellent durability. Thanks to its unique design, it achieves outstanding contact stability and long lifespan, capable of withstanding 300,000 cycles. Additionally, it is designed to prevent pin jamming and sticking, providing a reliable connection. Available materials include: Pd Alloy (palladium alloy), Be-Cu (beryllium copper), Au Alloy (gold alloy), SK (steel). 【Features】 ■ Consistent manufacturing from design to assembly ■ Unique manufacturing method enables precision processing for extremely small areas ■ Proprietary in-house design technology achieves low internal resistance *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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Contact probe [tip shape suitable for application] 1.27mm (recommended)

Contact probe [tip shape suitable for application] 1.27mm (recommended)

Contact probe: Achieves excellent contact stability and long lifespan! Supports up to 300,000 cycles.

UIGREEN's contact probes feature high precision contact and excellent durability. They are designed to prevent pin jamming and sticking, providing a reliable connection. Thanks to our unique manufacturing process, we achieve precision tip processing for extremely small areas and low internal resistance through our proprietary design technology. Additionally, we offer a consistent system from design to assembly. Please feel free to contact us when needed. 【Available Materials】 ■Pd Alloy (Palladium Alloy) ■Be-Cu (Beryllium Copper) ■Au Alloy (Gold Alloy) ■SK (Steel) *For more details, please download the PDF or feel free to contact us.

  • Other electronic parts

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We will match the inspection conditions! Contact probe (custom-made)

We will match the inspection conditions! Contact probe (custom-made)

In semiconductor testing, probe cards and IC sockets are often custom-made. We solve issues that cannot be addressed with standard probe products.

We offer a one-sided movable probe as a standard probe in our catalog. However, when trying to match it to equipment used for electrical testing, it may not meet the specifications. We can suggest existing probes tailored to the products or equipment conditions you wish to test, but if there is no suitable probe available, we can manufacture a custom one. In addition to partially manufacturing new parts based on existing probes, we can also create all parts from scratch. Therefore, if you need a replacement or compatible probe due to the discontinuation of a probe manufactured by another company, we may be able to assist you. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe
  • Other electronic parts
  • Inspection fixture

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Contact Probe Short Stroke CPS Series

Contact Probe Short Stroke CPS Series

Contact probe, short stroke type *Measurement jigs can also be manufactured!

【Overview】 This is a contact probe with an external spring design, manufactured as an integrated unit. It is suitable for precision measurements due to its ability to maintain low inherent resistance. ★ For more details about the series, please contact us or download the materials to view them. ★ * We also accept requests for the production of fixtures for electrical measurements. You can request our services even without design drawings or knowledge of electrical measurements! We can handle everything from design, concept, measurement methods, processing, assembly, to wiring. 【Examples of Measurement Fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive components, etc.

  • Terminal Blocks

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Contact Probe Long Stroke NCPLP & LB Series

Contact Probe Long Stroke NCPLP & LB Series

Contact Probe Long Stroke Type

【Overview】 This is a contact probe with an external spring, manufactured as an integrated unit. Compared to the general-purpose CP series, it has a longer overall length and stroke. It is effective when there is a distance between the mounting position and the measurement object. ★For more details about the series, please contact us or download the materials to view them★

  • Terminal Blocks

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