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Contact Probe Product List and Ranking from 40 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

Contact Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 精研 本社 Tokyo//Electronic Components and Semiconductors
  3. テクノプローブ Chiba//Testing, Analysis and Measurement
  4. 4 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
  5. 5 インクス Tokyo//Machine elements and parts
Go to Company Ranking

Contact Probe Product ranking

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  5. 5 Probe Mounting Adapter Socket (High Pressure Type) AS-S Series サンケイエンジニアリング 本社

Contact Probe Product List

166～180 item / All 191 items

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RF MEMS Probe "TP40-Vertical Series"

RF MEMS Probe "TP40-Vertical Series"

Selectable probe pitch from 50 to 1,000 um! The insertion loss (typ. GSG-150 um pitch) is -0.6 dB.

We would like to introduce our RF_MEMS probe, the 'TP40-Vertical Series'. The connector is 2.92mm/F (K/F), and the probe configurations are GS, SG, and GSG, with a contact lifespan (when using an auto-prober) of 1 million cycles. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 um ■ Probe repair and tip chip replacement available (Note that repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TP50-Angle Series"

RF MEMS Probe "TP50-Angle Series"

The connector is 2.4mm/F! It features a low-loss, low-reflection air coplanar probe design.

We would like to introduce our RF_MEMS probe, the 'TP50-Angle Series.' The frequency range is DC to 50GHz, with an insertion loss (GSG-150um pitch typ.) of -0.6dB, and the characteristic impedance is 50 ohms. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TP50-Vertical Series"

RF MEMS Probe "TP50-Vertical Series"

The frequency range is DC to 50GHz! Probe pitch can be selected from 50 to 1,000μm.

We would like to introduce our RF_MEMS probe, the "TP50-Vertical Series." The characteristic impedance is 50 ohms, and the insertion loss (GSG-150um pitch typ.) is -0.6dB. Additionally, the connector is compatible with 2.4mm/F, and the applicable pitch ranges from 50 to 1000um. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Available probe pitch options from 50 to 1,000um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TP67-Angle Series"

RF MEMS Probe "TP67-Angle Series"

Insertion loss (GSG-150um pitch typ.) is -0.8dB! Probe pitch can be selected from 50 to 1,000um.

We would like to introduce our RF_MEMS probe, the 'TP67-Angle Series'. The connector is 1.85mm/F (V/F), with a compatible pitch range of 50 to 1000um, and the needle position accuracy is within 10um. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Available in probe pitches of 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TPD40-Angle Series"

RF MEMS Probe "TPD40-Angle Series"

Selectable probe pitch from 50 to 1,000 µm! Introducing products with a frequency range of DC to 40 GHz.

We would like to introduce our RF_MEMS probe, the 'TPD40-Angle Series.' The characteristic impedance is 50 ohms, and the contact resistance (to gold pads) is 0.05 ohms, featuring a low-loss, low-reflection air coplanar probe design. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low-loss, low-reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 μm ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TPD40-Vertical Series"

RF MEMS Probe "TPD40-Vertical Series"

Insertion loss (GSGSG-150um pitch typ.) is -0.8dB! Probe repair and tip chip replacement are possible.

We would like to introduce our RF_MEMS probe, the 'TPD40-Vertical Series'. The frequency range is DC to 40GHz, with a characteristic impedance of 50 ohms. The connector is 2.92mm/F (K/F), and the probe configuration is GSSG or GSGSG. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TPD50-Vertical Series"

RF MEMS Probe "TPD50-Vertical Series"

Crosstalk (typ. GSGSG-150um pitch) is -35.0dB! Introducing products with a frequency range of DC to 50GHz.

We would like to introduce our RF_MEMS probe, the 'TPD50-Vertical Series.' The connector is 2.4mm/F, and it supports pitches from 50 to 1000um, featuring a low-loss, low-reflection air coplanar probe design. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low-loss, low-reflection air coplanar probe design ■ Small probe footprint ■ Available in probe pitches of 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF MEMS Probe "TPD67-Angle Series"

RF MEMS Probe "TPD67-Angle Series"

The connector is 1.85mm/F (V/F)! It features a low-loss, low-reflection air coplanar probe design.

We would like to introduce our RF_MEMS probe, the 'TPD67-Angle Series.' The crosstalk (GSGSG-150um pitch typ.) is -35.0dB, the characteristic impedance is 50 ohms, and the frequency range is DC to 67GHz. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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Heat-resistant contact probe

Heat-resistant contact probe

Compatible with high temperatures up to 300°C. Minimum pitch of 0.35mm or more.

Compatible with high temperatures up to 300°C. Minimum pitch of 0.35mm or more.

  • probe

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Probe diameter φ0.1 - Pitch contact probe

Probe diameter φ0.1 - Pitch contact probe

The previous process requires a tighter pitch and stable electrical performance compared to the subsequent process. We also accept orders for the production of probe cards!

At Seiken, we offer a lineup of vertical probes compatible with P=150um. The tip is made of a well-regarded alloy known for its contact with solder and is also compatible with crown cuts, allowing for stable contact with bumps. By using a specially shaped spring to maintain a constant load, the contact with bumps is better than that of probes using standard springs with the same pitch. 【Features】 ■ Lineup of vertical probes compatible with P=150um ■ Alloy compatible with crown cuts ■ Stable contact with bumps ■ Maintains a constant load using a specially shaped spring ■ Good contact with bumps *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other electronic parts
  • Inspection fixture

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Contact probes for semiconductor testing, IC sockets, probe cards

Contact probes for semiconductor testing, IC sockets, probe cards

Flexible design and manufacturing tailored to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring to inspection.

Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ▼ Contact Probes We offer not only standard products but also flexible solutions tailored to testing conditions. ▼ Probe Cards and IC Sockets We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suited to the inspection targets at low costs. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: High frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 ▼ Contact Probes - Reduces the hassle of replacement. Durable "rare metal probes." - Revised internal structure. "New bias probes" for stable resistance value measurement. ▼ IC Sockets - Non-magnetic sockets, high heat resistance sockets. ▼ Probe Cards - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Other semiconductors

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Custom order for contact probes

Custom order for contact probes

We will design probes according to the measurement temperature as a response to high temperatures. It is also possible to accommodate as a unit.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measuring special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks

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Custom order for contact probes

Custom order for contact probes

We accept the design and manufacturing of custom probes.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks

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Custom order for contact probes compatible with high current.

Custom order for contact probes compatible with high current.

Probes for 300A, 220A, 200A, 150A, and 70A are available.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special residual materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks

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Custom order for contact probes

Custom order for contact probes

Probes made with special materials. Dimension changes for probes. Custom design and manufacturing to suit measurements are available.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks

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